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US5039628A Expired / Lapsed US ⏱️ 0.0 years remaining

Flip substrate for chip mount

Assignee: Rateze Remote Mgmt LLC
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Filing: 1990-02-12
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Granted: 1991-08-13
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Expires: 2010-02-12
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Abstract

Abstract A substrate for attaching electrical devices having an interconnect wiring structure and a support for the interconnect, the support having a number of vias, or throughholes, extending therethrough and electrically connected to the interconnect. The substrate allows for attachment of the electrical devices on the side of the support opposite the interconnect at the vias, rather than on the interconnect itself. By so doing, the chips can be packed more density since the area between the chips normally reserved for engineering change pads, test pads and the like is not required, these functions being performed on the interconnect on the opposite side of the substrate.

Inventors

  • 👤 David H. Carey

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 20:32
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/60; H10W70/611; H10W70/62; H10W70/63; H10W70/635; H10W70/67; H10W70/68; H10W70/685; H05; H05K; H05K1/00; H05K1/02; H05K1/11; H05K1/111; H05K1/112; H10W72/00; H10W72/851; H10W72/874; H10W72/877; H10W90/00; H10W90/701; H10W90/721; H10W90/724; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 309 words
A method for manufacturing an integrated circuit packaging structure comprising the steps of: providing an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, said integrated circuit element having an upper surface and a lower surface, with an array of conductive nodes protruding from said lower surface to provide electrical coupling to said internal circuits; providing a support substrate having an upper surface and a lower surface with a plurality of through vias extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to said array of conductive nodes on said lower surface of said integrated circuit element; providing said substrate with conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer with a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; further providing said interconnect layer with a plurality of conductive coupling elements extending from, said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to said array of conductive nodes on said integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting said lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive nodes with said through vias and to electrically couple said conductive nodes with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 2
Independent Claim 309 words
A method for manufacturing an integrated circuit packaging structure comprising the steps of: providing an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, said integrated circuit element having an upper surface and a lower surface, with an array of conductive nodes protruding from said lower surface to provide electrical coupling to said internal circuits; providing a support substrate having an upper surface and a lower surface with a plurality of through vias extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to said array of conductive nodes on said lower surface of said integrated circuit element; providing said substrate with conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer with a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; further providing said interconnect layer with a plurality of conductive coupling elements extending from, said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to said array of conductive nodes on said integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting said lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive nodes with said through vias and to electrically couple said conductive nodes with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 3
Dependent Claim 24 words
The method of claim 1 wherein said integrated circuit element and said support substrate are formed of material having equal coefficients of thermal expansion.
Claim 4
Dependent Claim 28 words
The method of claim 1, wherein said conductor means within said through vias in said substrate are formed by substantially filling said through vias with a conductive material.
Claim 5
Dependent Claim 53 words
The method of claim 1, wherein said through vias are formed by boring through said substrate from said upper surface to said lower surface, said formed vias being defined by a vias wall, and wherein said conductor means within said through vias are formed by lining said vias wall with a conductive material.
Claim 6
Dependent Claim 28 words
The method of claim 1, wherein said electrical interconnect layer is formed to include a plurality of electrical conductor elements distributed within a layer of polyimide insulating material.
Claim 7
Dependent Claim 14 words
The method of claim 5 wherein said electrical conductor elements are formed of copper.
Claim 8
Dependent Claim 26 words
The method of claim 1 further comprising the step of soldering said conductive nodes of said integrated circuit element to said conductor means of said substrate.
Claim 9
Dependent Claim 27 words
The method of claim 1 further comprising the step of thermo bonding said conductive nodes of said integrated circuit element to said conductor means of said substrate.
Claim 10
Dependent Claim 28 words
The method of claim 1 further comprising the step of coupling said conductive nodes of said integrated circuit to said conductor means of said substrate by pressure contact.
Claim 11
Dependent Claim 34 words
the method of claim 1, wherein said conductive coupling elements of said interconnect layer are formed by providing a conductive lead extending from said upper surface to said lower surface of said interconnect layer.
Claim 12
Dependent Claim 60 words
The method of claim 10, wherein said conductive coupling elements are formed having an upper end and a lower end, said upper and lower ends being adjacent said upper and lower surfaces of said interconnect layer, and further comprising the step of providing said conductive elements with a conductive pad electrically coupled to said lower end of said conductive elements.
Claim 13
Dependent Claim 17 words
The method of claim 1, wherein said support substrate is formed to include a conductive voltage plane.
Claim 14
Independent Claim 317 words
A method of manufacturing an integrated circuit packaging structure comprising the steps of: providing an integrated circuit element with a plurality of internal circuits integrated into a single semi-conductor element, said integrated circuit element having an upper surface, a lower surface and a peripheral edge; further providing said integrated circuit element with a plurality of conductive leads extending from said peripheral edge to provide electrical coupling to said internal circuits; providing a support substrate having an upper surface and a lower surface with a plurality of through vias extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to the arrangement of said conductive leads of said integrated circuit element; providing said substrate with conductor means within said through vias and extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer comprising a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; further providing said interconnect layer with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to the arrangement of said conductive leads of said integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting said lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive leads with said through vias and to electrically couple said conductive leads with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 15
Independent Claim 317 words
A method of manufacturing an integrated circuit packaging structure comprising the steps of: providing an integrated circuit element with a plurality of internal circuits integrated into a single semi-conductor element, said integrated circuit element having an upper surface, a lower surface and a peripheral edge; further providing said integrated circuit element with a plurality of conductive leads extending from said peripheral edge to provide electrical coupling to said internal circuits; providing a support substrate having an upper surface and a lower surface with a plurality of through vias extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to the arrangement of said conductive leads of said integrated circuit element; providing said substrate with conductor means within said through vias and extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer comprising a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; further providing said interconnect layer with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to the arrangement of said conductive leads of said integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting said lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive leads with said through vias and to electrically couple said conductive leads with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 16
Dependent Claim 24 words
The method of claim 13 wherein said integrated circuit element and said support substrate are formed of material having equal coefficients of thermal expansion.
Claim 17
Dependent Claim 25 words
The method of claim 13 wherein said conductor means within said through vias are formed by substantially filling said through vias with a conductive material.
Claim 18
Dependent Claim 53 words
The method of claim 13 wherein said through vias are formed by boring through said substrate from said upper surface to said lower surface, said formed vias being defined by a vias wall, and wherein said conductor means within said through vias are formed by lining said vias wall with a conductive material.
Claim 19
Independent Claim 314 words
A method of manufacturing an integrated circuit packaging structure of the type adapted to receive an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, the single semi-conductor element being of the type having an upper surface and a lower surface and being formed having an array of conductive nodes protruding from the lower surface to provide electrical coupling to the internal circuits, said packaging structure method comprising the steps of: providing a support substrate having an upper surface and a lower surface; forming a plurality of through vias in said substrate extending from said upper surface to said lower surface in a pattern corresponding to the array of conductive nodes of the lower surface of the integrated circuit element; providing conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer having a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, and having an upper surface and a lower surface with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer; and wherein said coupling elements are arranged in a pattern corresponding to the array of conductive nodes on the integrated circuit element and adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting the lower surface of the integrated circuit element adjacent the upper surface of the substrate so as to align the conductive nodes with said through vias and to electrically couple the conductive nodes with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 20
Independent Claim 314 words
A method of manufacturing an integrated circuit packaging structure of the type adapted to receive an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, the single semi-conductor element being of the type having an upper surface and a lower surface and being formed having an array of conductive nodes protruding from the lower surface to provide electrical coupling to the internal circuits, said packaging structure method comprising the steps of: providing a support substrate having an upper surface and a lower surface; forming a plurality of through vias in said substrate extending from said upper surface to said lower surface in a pattern corresponding to the array of conductive nodes of the lower surface of the integrated circuit element; providing conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer having a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, and having an upper surface and a lower surface with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer; and wherein said coupling elements are arranged in a pattern corresponding to the array of conductive nodes on the integrated circuit element and adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting the lower surface of the integrated circuit element adjacent the upper surface of the substrate so as to align the conductive nodes with said through vias and to electrically couple the conductive nodes with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 21
Independent Claim 321 words
A method of manufacturing an integrated circuit packaging structure of the type adapted to receive an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, the semi-conductor element being formed having an upper surface a lower surface, and a peripheral edge and having a plurality of conductive leads extending from the peripheral edge to provide electrical coupling to the internal circuits, said method comprising the steps of: providing a support substrate having an upper surface and a lower surface with a plurality of through vias formed therein extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to the arrangement of the conductive leads of the integrated circuit element; further providing said substrate with conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer comprising a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; providing said interconnect layer with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to the arrangement of the conductive leads of the integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting the lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive leads with said through vias and to electrically couple said conductive leads with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.
Claim 22
Independent Claim 321 words
A method of manufacturing an integrated circuit packaging structure of the type adapted to receive an integrated circuit element including a plurality of internal circuits integrated into a single semi-conductor element, the semi-conductor element being formed having an upper surface a lower surface, and a peripheral edge and having a plurality of conductive leads extending from the peripheral edge to provide electrical coupling to the internal circuits, said method comprising the steps of: providing a support substrate having an upper surface and a lower surface with a plurality of through vias formed therein extending from said upper surface to said lower surface, said through vias being formed in a pattern corresponding to the arrangement of the conductive leads of the integrated circuit element; further providing said substrate with conductor means within said through vias extending from said substrate upper surface to said substrate lower surface; providing an electrical interconnect layer comprising a plurality of electrically conductive interconnect elements distributed within an electrically insulating material, said interconnect layer having an upper surface and a lower surface; providing said interconnect layer with a plurality of conductive coupling elements extending from said upper surface to said lower surface of said interconnect layer, said coupling elements being arranged in a pattern corresponding to the arrangement of the conductive leads of the integrated circuit element and being adapted for conductive coupling to said interconnect elements within said interconnect layer and for conductive contact from said lower surface by external sources; and mounting the lower surface of said integrated circuit element adjacent said upper surface of said substrate so as to align said conductive leads with said through vias and to electrically couple said conductive leads with said conductor means; mounting said upper surface of said interconnect layer adjacent said lower surface of said substrate so as to align said coupling elements with said through vias and to electrically couple said coupling elements with said conductor means.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-08-12 1995-02-11 1995-08-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-08-12 1999-02-11 1999-08-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-08-12 2003-02-11 2003-08-13 $7700.00 Window Closed / Lapsed

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