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US5037506A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of stripping layers of organic materials

Assignee: Best Label Co Inc
•
Filing: 1990-09-06
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Granted: 1991-08-06
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Expires: 2010-09-06
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Abstract

Abstract Gaseous sulfur trioxide is used to remove various organic coatings, polymerized photoresist, and especially implant and deep-UV hardened photoresist layers, during the manufacture of semiconductor or ceramic devices.

Inventors

  • 👤 Subhash Gupta
  • 👤 Bhanwar Singh
  • 👤 Ahmad Waleh

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 21:51
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/10; H10P70/12; G; G03; G03F; G03F7/00; G03F7/26; G03F7/42; H10P50/00; H10P50/20; H10P50/28; H10P50/286; H10P50/287; H05; H05K; H05K3/00; H05K3/22; H05K3/26; Y; Y10; Y10S; Y10S134/00; Y10S134/902; Y10S438/00; Y10S438/906

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 47 words
A process for substantially completely removing organic coatings on the surface of a semiconductor wafer, said process comprising exposing said organic coating to a vapor consisting essentially of water-free gaseous sulfur trioxide, said wafer being maintained at a temperature ranging from about room temperature to 150° C.
Claim 2
Dependent Claim 47 words
A process for substantially completely removing organic coatings on the surface of a semiconductor wafer, said process comprising exposing said organic coating to a vapor consisting essentially of water-free gaseous sulfur trioxide, said wafer being maintained at a temperature ranging from about room temperature to 150° C.
Claim 3
Dependent Claim 24 words
The process of claim 1 further comprising rinsing said surface in a solvent subsequent to exposing said organic coating to said gaseous sulfur trioxide.
Claim 4
Dependent Claim 26 words
The process of claim 2 wherein said solvent consists essentially of a member selected from the group consisting of water, lower alkanols, acetone, and mixtures thereof.
Claim 5
Dependent Claim 14 words
The process of claim 3 wherein said solvent consists essentially of water or iso-propanol.
Claim 6
Dependent Claim 23 words
The process of claim 1 wherein said organic coating is exposed to said gaseous sulfur trioxide at a temperature of about room temperature.
Claim 7
Dependent Claim 22 words
The process of claim 4 wherein said exposure is performed for a period of time ranging from about 5 to 150 sec.
Claim 8
Dependent Claim 12 words
The process of claim 1 wherein said organic coating comprises a photoresist.
Claim 9
Dependent Claim 62 words
A process for substantially completely removing organic coatings on surfaces, said process comprising (a) exposing said organic coating to a vapor consisting essentially of water-free gaseous sulfur trioxide, said organic coating being maintained at a temperature ranging from about room temperature to 150° C., and (b) rinsing said surface in water subsequent to exposing said organic coating to said gaseous sulfur trioxide.
Claim 10
Dependent Claim 62 words
A process for substantially completely removing organic coatings on surfaces, said process comprising (a) exposing said organic coating to a vapor consisting essentially of water-free gaseous sulfur trioxide, said organic coating being maintained at a temperature ranging from about room temperature to 150° C., and (b) rinsing said surface in water subsequent to exposing said organic coating to said gaseous sulfur trioxide.
Claim 11
Dependent Claim 15 words
The process of claim 8 further comprising repeating steps (a) and (b) at least once.
Claim 12
Dependent Claim 19 words
The process of claim 8 wherein said organic coating is exposed to said gaseous sulfur trioxide at room temperature.
Claim 13
Dependent Claim 22 words
The process of claim 10 wherein said exposure is performed for a period of time ranging from about 5 to 150 sec.
Claim 14
Dependent Claim 12 words
The process of claim 8 wherein said organic coating comprises a photoresist.
Claim 15
Dependent Claim 75 words
A process for substantially completely removing photoresist coatings on semiconductor wafers, comprising: (a) placing said wafer in a chamber; (b) purging said chamber with a dry gas selected from the group consisting of an inert gas and nitrogen; and (c) introducing a vapor consisting essentially of water-free gaseous sulfur trioxide into said chamber to react with said photoresist coating, said photoresist coating being maintained at a temperature ranging from about room temperature to 150° C.
Claim 16
Dependent Claim 75 words
A process for substantially completely removing photoresist coatings on semiconductor wafers, comprising: (a) placing said wafer in a chamber; (b) purging said chamber with a dry gas selected from the group consisting of an inert gas and nitrogen; and (c) introducing a vapor consisting essentially of water-free gaseous sulfur trioxide into said chamber to react with said photoresist coating, said photoresist coating being maintained at a temperature ranging from about room temperature to 150° C.
Claim 17
Dependent Claim 25 words
The process of claim 13 wherein said water is subsequently rinsed in a solvent consisting essentially of water or iso-propanol to remove any reaction products.
Claim 18
Dependent Claim 33 words
The process of claim 14 wherein a process cycle comprises exposing said wafer to said gaseous sulfur trioxide and rinsing said wafer in said solvent, said process cycle being performed at least twice.
Claim 19
Dependent Claim 23 words
The process of claim 13 wherein said organic coating is exposed to said gaseous sulfur trioxide at a temperature of about room temperature.
Claim 20
Dependent Claim 27 words
The process of claim 13 wherein said wafer is exposed to said gaseous sulfur trioxide for a period of time ranging from about 5 to 150 sec.

References Cited (Backward Citations)

US4520046A Cited
US4778536A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-08-05 1995-02-04 1995-08-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-08-05 1999-02-04 1999-08-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-08-05 2003-02-04 2003-08-06 $7700.00 Window Closed / Lapsed

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