US5035780A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a platinum tip
Assignee: National Institute of Advanced Industrial Science and Technology
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Filing: 1989-03-23
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Granted: 1991-07-30
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Expires: 2009-03-23
Abstract
Abstract In the production of a tunneling probe tip having a sharp point by utilizing electropolishing, the present invention has enabled the production of a platinum tunneling probe tip always produceable in an identical conical form having high point sharpness without scattering in the shape caused by the anisotropy of crystal face with respect to the rate of polishing during polishing of a platinum material through adoption of a two-stage polishing process, which comprises subjecting a platinum tunneling probe tip material to a primary polishing for primary shaping of the tunneling probe tip material into a tunneling probe tip form, and then subjecting the shaped material to a secondary polishing for sharpening of the point with a mixed acid comprising sulfuric acid, nitric acid, and phosphoric acid.
Inventors
- 👤 Teruo Suzuki
- 👤 Kenichi Ogawa
- 👤 Hiroshi Murakami
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 16:56
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/10; G01Q60/16; B; B82; B82Y; B82Y15/00; B82Y35/00; C; C25; C25F; C25F3/00; C25F3/16; Y; Y10; Y10T; Y10T428/00; Y10T428/12; Y10T428/12389; Y10T428/12403
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
57 words
A method of manufacturing a platinum tip having a sharp point, which comprises the steps of: subjecting a platinum material to primary polishing to form a sharp point portion, and subjecting the treated platinum material to secondary electropolishing with a mixed aid comprising sulfuric acid, nitric acid, and phosphoric acid to further sharpen the sharp point portion.
Claim 2
Independent Claim
57 words
A method of manufacturing a platinum tip having a sharp point, which comprises the steps of: subjecting a platinum material to primary polishing to form a sharp point portion, and subjecting the treated platinum material to secondary electropolishing with a mixed aid comprising sulfuric acid, nitric acid, and phosphoric acid to further sharpen the sharp point portion.
Claim 3
Dependent Claim
15 words
A method as claimed in claim 1; wherein the primary polishing comprises a mechanical polishing.
Claim 4
Dependent Claim
22 words
A method as claimed in claim 1; wherein the primary polishing comprises an electropolishing with a sodium cyanide or potassium cyanide solution.
Claim 5
Dependent Claim
42 words
A method as claimed in claim 1; wherein the platinum material is composed of at least 99.9% of Pt and 0.005% or less of Cu with the balance being unavoidable ingredients such as Mg, Mn, Fe, Zn, Pd, Au, Ag, and Rh.
Claim 6
Dependent Claim
19 words
A method as claimed in claim 4; wherein the platinum material has a crystal grain diameter of 10-200 μm.
Claim 7
Dependent Claim
50 words
A platinum tip having a sharp point formed by electropolishing a platinum compound material, wherein the platinum compound material is composed of at least 99.9% of Pt and 0.005% or less of Cu with the balance being unavoidable ingredients such as Mg, Mn, Fe, Zn, Pd, Au, Ag, and Rh.
Claim 8
Dependent Claim
50 words
A platinum tip having a sharp point formed by electropolishing a platinum compound material, wherein the platinum compound material is composed of at least 99.9% of Pt and 0.005% or less of Cu with the balance being unavoidable ingredients such as Mg, Mn, Fe, Zn, Pd, Au, Ag, and Rh.
Claim 9
Dependent Claim
21 words
A platinum tip as claimed in claim 6; wherein the platinum compound material has a crystal grain diameter of 10-200 μm.
Claim 10
Independent Claim
76 words
A method of producing a platinum probe tip, comprising the steps: providing a piece of platinum base material; subjecting the piece of platinum base material to a first-stage polishing to shape the piece into the form of a probe tip having a point; and subjecting the shaped piece of platinum base material to a second-stage polishing with an acid mixture containing sulfuric acid, nitric acid and phosphoric acid to sharpen the point of the probe tip.
Claim 11
Independent Claim
76 words
A method of producing a platinum probe tip, comprising the steps: providing a piece of platinum base material; subjecting the piece of platinum base material to a first-stage polishing to shape the piece into the form of a probe tip having a point; and subjecting the shaped piece of platinum base material to a second-stage polishing with an acid mixture containing sulfuric acid, nitric acid and phosphoric acid to sharpen the point of the probe tip.
Claim 12
Dependent Claim
13 words
A method according to claim 8; wherein the first-stage polishing comprises mechanical polishing.
Claim 13
Dependent Claim
12 words
A method according to claim 8; wherein the first-stage polishing comprises electropolishing.
Claim 14
Dependent Claim
21 words
A method according to claim 10; wherein the electropolishing is carried out with a solution of sodium cyanide or potassium cyanide.
Claim 15
Dependent Claim
27 words
A method according to claim 8; wherein the acid mixture comprises at least 10% sulfuric acid, at least 5% nitric acid and at least 10% phosphoric acid.
Claim 16
Dependent Claim
26 words
A method according to claim 8; wherein the piece of platinum base material is composed of at least 99.9% platinum and not more than 0.005% copper.
Claim 17
Dependent Claim
21 words
A method according to claim 13; wherein the platinum base material has a crystal grain diameter in the range 10-200 μm.
Claim 18
Dependent Claim
33 words
A platinum probe tip, comprising: a piece of platinum base material having an electropolished sharp point, the platinum base material being comprosed of at least 99.9% platinum and not more than 0.005% copper.
Claim 19
Dependent Claim
33 words
A platinum probe tip, comprising: a piece of platinum base material having an electropolished sharp point, the platinum base material being comprosed of at least 99.9% platinum and not more than 0.005% copper.
Claim 20
Dependent Claim
23 words
A platinum probe tip according to claim 15; wherein the platinum base material has a crystal grain diameter in the range 10-200 μm.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-07-29 | 1995-01-28 | 1995-07-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-07-29 | 1999-01-28 | 1999-07-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-07-29 | 2003-01-28 | 2003-07-30 | $7700.00 | Window Closed / Lapsed |