US5023917A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for pattern inspection
Assignee: Nokia Bell Labs
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Filing: 1988-08-15
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Granted: 1991-06-11
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Expires: 2008-08-15
Abstract
Abstract Accurate inspection of a pattern (14) of metallized areas (12) printed on a substrate (10) is accomplished by compensating the pattern for any deformation prior to comparing the image thereof to that of a perfect (master) pattern (14'). The amount of compensation is determined by first capturing the image of selected elements in the pattern with the aid of a television camera (32). A machine vision processor (36) processes the output of the camera (32) to determine the offset of each of the selected elements in the pattern from the corresponding elements within a master pattern (14') which represents a perfectly formed version of the actual pattern (14). From the amount of offset between the selected elements in the pattern (14) and the corresponding elements in the master pattern (14'), the amount of pattern deformation at the preselected elements, as well as at all intermediate sites, is determined and the pattern is compensated accordingly.
Inventors
- 👤 Chinmoy B. Bose
- 👤 Rajarshi Ray
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 06:35
CPC Classifications
G; G06; G06T; G06T7/00; G06T7/0002; G06T7/0004; G06T5/00; G06T5/80; G06T2207/00; G06T2207/30; G06T2207/30108; G06T2207/30148
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
207 words
A method of inspecting a pattern comprising the steps of: (a) capturing the image of each of a plurality of reference points within a pattern with an image-acquisition device; (b) establishing the amount of deformation of the pattern from the spacing between the reference points: (c) stepping the image-acquisition device between each of a plurality of discrete areas of interest in the pattern by a distance varying in accordance with the pattern deformation to place the image-acquisition device in registration with a successive one of such discrete areas of interest within the pattern; (d) capturing the image of a particular discrete area of interest; (e) comparing the captured image of the discrete area of interest to the image of the same discrete area within a defect-free master pattern corresponding to the pattern undergoing inspection and reporting if the area of interest in the pattern does not match that in the defect free pattern; and (f) repeating steps (c), (d) and (e) until the image acquisition device has been stepped so as to be in registration with each of a predetermined number of the discrete areas of interest in the pattern and the image thereof has been captured and compared to the corresponding area within the master pattern.
Claim 2
Independent Claim
207 words
A method of inspecting a pattern comprising the steps of: (a) capturing the image of each of a plurality of reference points within a pattern with an image-acquisition device; (b) establishing the amount of deformation of the pattern from the spacing between the reference points: (c) stepping the image-acquisition device between each of a plurality of discrete areas of interest in the pattern by a distance varying in accordance with the pattern deformation to place the image-acquisition device in registration with a successive one of such discrete areas of interest within the pattern; (d) capturing the image of a particular discrete area of interest; (e) comparing the captured image of the discrete area of interest to the image of the same discrete area within a defect-free master pattern corresponding to the pattern undergoing inspection and reporting if the area of interest in the pattern does not match that in the defect free pattern; and (f) repeating steps (c), (d) and (e) until the image acquisition device has been stepped so as to be in registration with each of a predetermined number of the discrete areas of interest in the pattern and the image thereof has been captured and compared to the corresponding area within the master pattern.
Claim 3
Dependent Claim
92 words
The method according to claim 1 wherein the amount by which the pattern is deformed is established by the steps of: (a) measuring the distance separating each of a pair of the reference points in the pattern; (b) establishing the distance separating each of a corresponding pair of reference points in the master pattern; and (c) computing the degree of pattern deformation in accordance with the difference between the measured separation between the reference points in the pattern undergoing inspection, and the separation between the corresponding reference points in the master pattern.
Claim 4
Dependent Claim
31 words
The method according to claim 1 wherein the steps of (c), (d), (e) and (f) are only carried out if the amount of pattern deformation does not exceed a predetermined value.
Claim 5
Independent Claim
251 words
A method of fabricating a Hybrid Integrated Circuit comprising the steps of: printing a pattern of metallized areas on a substrate; inspecting the pattern of metallized areas for defects; and completing the fabrication of the circuit, if, after inspection of the pattern, no substantial defects are found, wherein the inspection step comprises the steps of (a) capturing the image of each of a plurality of reference points within the pattern of metallized areas with an image-acquisition device; (b) establishing the amount of deformation of the pattern in accordance with the spacing between pairs of reference points; (c) stepping the image-acquisition device between each of a plurality of discrete areas of interest in the pattern by a distance varying in accordance with the pattern deformation to place the image-acquisition device in registration with a successive one of the metallized areas in the pattern; (d) capturing the image of the metallized area; (e) comparing the captured image of the metallized area to the image of the same metallized area within a defect-free, master pattern corresponding to the pattern of metallized areas undergoing inspection and reporting if the area of interest does not match the corresponding area in the defect free pattern; and (f) repeating steps (c), (d) and (e) until the image acquisition device has been stepped so as to be in registration with each of a predetermined number of metallized areas in the pattern and the image thereof has been captured and compared to the corresponding metallized area within the master pattern.
Claim 6
Independent Claim
251 words
A method of fabricating a Hybrid Integrated Circuit comprising the steps of: printing a pattern of metallized areas on a substrate; inspecting the pattern of metallized areas for defects; and completing the fabrication of the circuit, if, after inspection of the pattern, no substantial defects are found, wherein the inspection step comprises the steps of (a) capturing the image of each of a plurality of reference points within the pattern of metallized areas with an image-acquisition device; (b) establishing the amount of deformation of the pattern in accordance with the spacing between pairs of reference points; (c) stepping the image-acquisition device between each of a plurality of discrete areas of interest in the pattern by a distance varying in accordance with the pattern deformation to place the image-acquisition device in registration with a successive one of the metallized areas in the pattern; (d) capturing the image of the metallized area; (e) comparing the captured image of the metallized area to the image of the same metallized area within a defect-free, master pattern corresponding to the pattern of metallized areas undergoing inspection and reporting if the area of interest does not match the corresponding area in the defect free pattern; and (f) repeating steps (c), (d) and (e) until the image acquisition device has been stepped so as to be in registration with each of a predetermined number of metallized areas in the pattern and the image thereof has been captured and compared to the corresponding metallized area within the master pattern.
Claim 7
Dependent Claim
90 words
The method according to claim 1 wherein the amount by which the pattern is deformed is established by the steps of: (a) measuring the distance separating each of a pair of the reference points in the pattern; (b) establishing the distance separating each of a corresponding pair of reference points in the master pattern; and (c) computing the degree of pattern deformation in accordance with the difference between the measured separation between the reference points in the pattern, and the separation between the corresponding reference points in the master pattern.
References Cited (Backward Citations)
US4668982A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-06-10 | 1994-12-10 | 1995-06-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-10 | 1998-12-10 | 1999-06-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-06-10 | 2002-12-10 | 2003-06-11 | $7700.00 | Window Closed / Lapsed |