US5021733A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Burn-in apparatus
Assignee: Mitsubishi Electric Corp
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Filing: 1990-01-11
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Granted: 1991-06-04
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Expires: 2010-01-11
Abstract
Abstract A burn-in apparatus includes burn-in boards for holding semiconductor devices through air suction and for electrically connecting them to external equipment. Since the semiconductor devices are held on the burn-in boards for electrical connection through air suction, sockets are not necessary to hold them on the boards which reduces costs. Further, the leads of semiconductor devices, which have conventionally been susceptible to bending when inserted into or extracted from the sockets, can be protected.
Inventors
- 👤 Sachiko Ebihara
- 👤 Yasuhiko Fukushima
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 10:33
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/286; G01R31/2863; G01R31/2862
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
92 words
A burn-in test method comprising: placing a plurality of semiconductor devices having bodies and extending leads over respective openings in a hollow burn-in board so that the bodies are peripherally supported by the board; holding the semiconductor devices in place over the respective openings by evacuating the hollow burn-in board, thereby electrically connecting the semiconductor devices to electrical conductors disposed on the burn-in board; and simultaneously subjecting the semiconductor devices to predetermined environmental conditions and performing electrical tests on the semiconductor devices through the conductors to examine characteristics of the semiconductor devices.
Claim 2
Dependent Claim
92 words
A burn-in test method comprising: placing a plurality of semiconductor devices having bodies and extending leads over respective openings in a hollow burn-in board so that the bodies are peripherally supported by the board; holding the semiconductor devices in place over the respective openings by evacuating the hollow burn-in board, thereby electrically connecting the semiconductor devices to electrical conductors disposed on the burn-in board; and simultaneously subjecting the semiconductor devices to predetermined environmental conditions and performing electrical tests on the semiconductor devices through the conductors to examine characteristics of the semiconductor devices.
Claim 3
Dependent Claim
146 words
A burn-in apparatus comprising: a hollow burn-in board including a hollow interior, holding means for holding a plurality of individual semiconductor devices having respective bodies from which leads extend, a plurality of conductors disposed on said board for making electrical connections to the leads of semiconductor devices held by said holding means, and a suction port communicating with the hollow interior wherein said holding means comprises a plurality of openings in the burn-in board defined by respective peripheries communicating with the hollow interior, the burn-in board supporting the body of a respective semiconductor device at the periphery adjacent each opening, and said conductors are disposed adjacent the openings; electrical connection means for electrically connecting the conductors to external equipment; a chamber for receiving said burn-in board; and evacuation means for evacuating the interior of the hollow burn-in board received in said chamber through said suction port.
Claim 4
Dependent Claim
146 words
A burn-in apparatus comprising: a hollow burn-in board including a hollow interior, holding means for holding a plurality of individual semiconductor devices having respective bodies from which leads extend, a plurality of conductors disposed on said board for making electrical connections to the leads of semiconductor devices held by said holding means, and a suction port communicating with the hollow interior wherein said holding means comprises a plurality of openings in the burn-in board defined by respective peripheries communicating with the hollow interior, the burn-in board supporting the body of a respective semiconductor device at the periphery adjacent each opening, and said conductors are disposed adjacent the openings; electrical connection means for electrically connecting the conductors to external equipment; a chamber for receiving said burn-in board; and evacuation means for evacuating the interior of the hollow burn-in board received in said chamber through said suction port.
Claim 5
Dependent Claim
24 words
An apparatus as claimed in claim 2 wherein said holding means comprises a protrusion disposed on said burn-in board adjacent each of said openings.
Claim 6
Dependent Claim
16 words
An apparatus as claimed in claim 3 wherein each of said protrusions is an elastic material.
Claim 7
Dependent Claim
44 words
An apparatus as claimed in claim 2 including partitions extending outwardly from said burn-in board proximate the openings, forming recesses between said protrusions and said partitions for receiving leads of semiconductor devices held by said holding means, said conductors being disposed in said recesses.
Claim 8
Dependent Claim
17 words
An apparatus as claimed in claim 5 wherein said partitions form a lattice on said burn-in board.
Claim 9
Dependent Claim
16 words
An apparatus as claimed in claim 2 wherein said semiconductor devices are of the surface-mounting type.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-06-03 | 1994-12-03 | 1995-06-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-03 | 1998-12-03 | 1999-06-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-06-03 | 2002-12-03 | 2003-06-04 | $7700.00 | Window Closed / Lapsed |