US5018145A
Expired / Lapsed
US
⏱️ 0.0 years remaining
IC tester
Assignee: Hitachi Ltd
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Filing: 1989-08-31
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Granted: 1991-05-21
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Expires: 2009-08-31
Abstract
Abstract To speed up the pattern generator which is a bottleneck for speedup of an LSI tester, a continuous address control information for generating addresses for continuous pattern memory read is generated at a speed 1/N (N is an optional number larger than 1) times the operation speed of the continuous address generator, and the address controller is divided into a 1st and a 2nd address controller. The two controllers are connected via a buffer memory to ensure the normal operation when the correspondence between address control instructions and patterns to be continuously read is not 1:N. Continuous address information generated by the 1st address controller is stored in the buffer memory. The second address controller, which actually generates continuous addresses, receives the continuous address information from the buffer memory, outputs the addresses to the pattern memory at a speed N times of the operation speed of the 1st address controller, and receives the next continuous address information from the buffer memory once again when the continuous address generation is finished to repeat the operation mentioned above.
Inventors
- 👤 Shuji Kikuchi
- 👤 Yoshio Ouchida
- 👤 Ryohei Kamiya
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 03:12
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31917; G01R31/31919; G01R31/31921
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
119 words
An IC tester comprising: a first memory storing test pattern control instructions; a first address generator specifying addresses to said first memory; a second memory storing the test patterns; a second address generator specifying addresses to said second memory, said second address generator generating the addresses to said second memory at a speed higher than the speed said first address generator generates addresses; a first controller controlling said first address generator by interpreting a test pattern control instruction read from said first memory, and outputting control information for said second address generator; a third memory temporarily storing said control information; and a second controller controlling said second address generator by interpreting a control information read from said third memory.
Claim 2
Dependent Claim
119 words
An IC tester comprising: a first memory storing test pattern control instructions; a first address generator specifying addresses to said first memory; a second memory storing the test patterns; a second address generator specifying addresses to said second memory, said second address generator generating the addresses to said second memory at a speed higher than the speed said first address generator generates addresses; a first controller controlling said first address generator by interpreting a test pattern control instruction read from said first memory, and outputting control information for said second address generator; a third memory temporarily storing said control information; and a second controller controlling said second address generator by interpreting a control information read from said third memory.
Claim 3
Dependent Claim
46 words
The IC tester of claim 1 wherein, said IC tester is equipped with a divider which operates said first address generator with an operation clock divided to 1/N of that of said second address generator, where N is an integer greater than or equal to 2.
Claim 4
Dependent Claim
47 words
The IC tester of claim 1 wherein, said IC tester is equipped with a multiplying unit to operate said second address generator with an operation clock increased to N times that of said first address generator where N is an integer greater than or equal to 2.
Claim 5
Dependent Claim
45 words
The IC tester of claim 1, further comprising: a third controller inputting succeeding control information before the control information stored temporarily in said third memory is exhausted and stopping the input of the control information to said third memory when said third memory is filled.
Claim 6
Dependent Claim
155 words
An IC tester comprising: a first memory storing test pattern control instructions; a first address generator specifying addresses top said first memory; a second memory storing test patterns; a second address generator specifying addresses to said second memory; a first controller providing a first control signal to said first address generator by interpreting a test pattern control instruction read from said first memory, said first control signal being in accordance with the interpretation of said test pattern control instruction, and further providing a control information for said second address generator; a third memory temporarily storing said control information for said second address generator; a second controller providing a second control signal generated in accordance with an interpretation of the temporarily stored control information being read from said third memory; and a clock generator providing clock signals to said first and second address generators, and providing an address renewal speed to each of said address generators.
Claim 7
Dependent Claim
155 words
An IC tester comprising: a first memory storing test pattern control instructions; a first address generator specifying addresses top said first memory; a second memory storing test patterns; a second address generator specifying addresses to said second memory; a first controller providing a first control signal to said first address generator by interpreting a test pattern control instruction read from said first memory, said first control signal being in accordance with the interpretation of said test pattern control instruction, and further providing a control information for said second address generator; a third memory temporarily storing said control information for said second address generator; a second controller providing a second control signal generated in accordance with an interpretation of the temporarily stored control information being read from said third memory; and a clock generator providing clock signals to said first and second address generators, and providing an address renewal speed to each of said address generators.
Claim 8
Dependent Claim
46 words
The IC tester of claim 5 wherein, said IC tester is equipped with a divider which operates said first address generator with an operation clock divided to 1/N of that of said second address generator where N is an integer greater than or equal to 2.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-05-20 | 1994-11-19 | 1995-05-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-05-20 | 1998-11-19 | 1999-05-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-05-20 | 2002-11-19 | 2003-05-21 | $7700.00 | Window Closed / Lapsed |