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US5015548A Expired / Lapsed US ⏱️ 0.0 years remaining

Erasable phase change optical recording elements and methods

Assignee: Eastman Kodak Co
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Filing: 1990-06-21
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Granted: 1991-05-14
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Expires: 2010-06-21
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Abstract

Abstract An optical recording element comprising a thin film optical recording layer of an alloy is disclosed. The alloy is represented by the formula Sb x Te 1-x , wherein x is between about 0.58 and 0.75. The alloys have short erasure times (amorphous to crystalline transition) and excellent environmental stability.

Inventors

  • 👤 Kee-Chuan Pan
  • 👤 Yuan-Sheng Tyan
  • 👤 Fridrich Vazan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 00:33
CPC Classifications
G; G11; G11B; G11B7/00; G11B7/24; G11B7/241; G11B7/242; G11B7/243; G11B2007/24302; G11B2007/24314; G11B2007/24316; G11B7/004; G11B7/0045; G11B7/00454; Y; Y10; Y10S; Y10S430/00; Y10S430/146

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 136 words
A method of recording and erasing information on an optical recording element, said element comprising a thin film optical recording layer of an alloy in a crystalline form, said alloy represented by the formula Sb x Te 1-x , wherein x is between about 0.58 and 0.75, said method comprising the steps of: (a) recording said information by focusing an information modulated laser beam on said cystalline alloy recording layer at a power and for a time sufficient to form a pattern of amorphous areas in said layer of alloy, said pattern corresponding to said information, and (b) focusing a laser beam on said recorded layer for a time and at a power sufficient to crystallize at least a portion of the amorphous areas formed in step a), thereby erasing the information in said amorphous areas.
Claim 2
Independent Claim 136 words
A method of recording and erasing information on an optical recording element, said element comprising a thin film optical recording layer of an alloy in a crystalline form, said alloy represented by the formula Sb x Te 1-x , wherein x is between about 0.58 and 0.75, said method comprising the steps of: (a) recording said information by focusing an information modulated laser beam on said cystalline alloy recording layer at a power and for a time sufficient to form a pattern of amorphous areas in said layer of alloy, said pattern corresponding to said information, and (b) focusing a laser beam on said recorded layer for a time and at a power sufficient to crystallize at least a portion of the amorphous areas formed in step a), thereby erasing the information in said amorphous areas.

References Cited (Backward Citations)

US4357616A Cited
JPS6034897A Cited
JPS6189889A Cited
US4670345A Cited
US4816385A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-05-13 1994-11-12 1995-05-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-05-13 1998-11-12 1999-05-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-05-13 2002-11-12 2003-05-14 $7700.00 Window Closed / Lapsed

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