CMOS level detctor circuit

Claim 2

A voltage level detector circuit for providing a plurality of output functions responsive to a voltage input signal applied to an input thereof, comprising: input means coupled to the input for transferring the voltage input signal to a first output of the voltage level detector circuit when the input signal is within a predetermined voltage range; detection means including a field oxide device transistor coupled to the input for providing a detection signal at an output thereof responsive when said voltage input signal exceeds a predetermined level in a predetermined sense; and a buffer stage coupled between said output of said detection means and a second output of the voltage level detector circuit for providing a first binary logic state at said second output responsive to said detection signal.

Claim 3

The voltage level detector circuit according to claim 1 wherein said input means includes: a P-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said P-channel enhancement mode transistor, and a drain coupled to the input; a first resistor coupled between said drain of said P-channel enhancement mode transistor and a second supply voltage terminal; a second resistor coupled between the input and said first output; and a third resistor coupled between the input and said detection means.

Claim 4

The voltage level detector circuit according to claim 2 wherein said detection means includes: a P-channel field oxide device transistor having a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said output of said detection means.

Claim 5

The voltage level detector circuit according to claim 3 wherein said buffer stage includes; a first P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said output of said detection means, and a drain; a first N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, and a gate and drain coupled to said gate and drain of said first P-channel enhancement mode transistor of said buffer stage, respectively; a second P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said drain of said first P-channel enhancement mode transistor of said buffer stage, and a drain; and a second N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, a gate coupled to said gate of said second P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said second P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 6

The voltage level detector circuit according to claim 4 further includes: a resistor coupled between said gate of said first P-channel enhancement mode transistor of said buffer stage and said second supply voltage terminal.

Claim 7

The voltage level detector circuit according to claim 1 wherein said input means includes: An N-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said N-channel enhancement mode transistor, and a drain coupled to the input; a first resistor coupled between said drain of said N-channel enhancement mode transistor and said first supply voltage terminal; a second resistor coupled between the input and said first output; and a third resistor coupled between the input and said detection means.

Claim 8

The voltage level detector circuit according to claim 6 wherein said detection means includes: An N-channel field oxide device transistor having a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said output of said detection means.

Claim 9

The voltage level detector circuit according to claim 7 wherein said buffer stage includes: a P-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, a gate coupled to said output of said detection means, and a drain; and an N-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said gate of said P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 10

The voltage level detector circuit according to claim 8 further includes: a P-channel enhancement mode transistor having a source coupled to a second supply voltage terminal, a gate coupled to said gate of said N-channel field oxide device transistor of said detection means, and a drain coupled to said output of said detection means.

Claim 11

Integrated voltage level circuit for providing a plurality of output functions at respective outputs responsive to an input signal applied at an input thereof, comprising: input means coupled to the input for transferring the input signal to a first output when the input signal is within a predetermined voltage range; detection means including a P-channel field oxide device transistor coupled to the input for providing a detection signal at an output thereof responsive to the input signal becoming more negative than a predetermined level; and a buffer stage coupled between said output of said detection circuit and a second output for providing a first binary logic state at said second output responsive to said detection signal being at the input.

Claim 12

Integrated voltage level circuit for providing a plurality of output functions at respective outputs responsive to an input signal applied at an input thereof, comprising: input means coupled to the input for transferring the input signal to a first output when the input signal is within a predetermined voltage range; detection means including a P-channel field oxide device transistor coupled to the input for providing a detection signal at an output thereof responsive to the input signal becoming more negative than a predetermined level; and a buffer stage coupled between said output of said detection circuit and a second output for providing a first binary logic state at said second output responsive to said detection signal being at the input.

Claim 13

The integrated voltage level according circuit to claim 10 wherein said input means includes: a P-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said P-channel enhancement mode transistor, and a drain coupled to the input; a first resistor coupled between said drain of said P-channel enhancement mode transistor and a second supply voltage terminal; a second resistor coupled between the input and said first output; and a third resistor coupled between the input and said detection means.

Claim 14

The integrated voltage level circuit according to claim 11 wherein said P-channel field oxide device transistor of said detection means has a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said output of said detection means.

Claim 15

The integrated voltage level circuit according to claim 12 wherein said buffer stage includes: a first P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said output of said detection means, and a drain; a first N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, and a gate and drain coupled to said gate and drain of said first P-channel enhancement mode transistor of said buffer stage, respectively; a second P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said drain of said first P-channel enhancement mode transistor of said buffer stage, and a drain; and a second N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, a gate coupled to said gate of said second P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said second P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 16

The integrated voltage level circuit according to claim 13 further includes: a resistor coupled between said gate of said first P-channel enhancement mode transistor of said buffer stage and said second supply voltage terminal.

Claim 17

Integrated voltage level circuit for providing a plurality of output functions at respective outputs responsive to an input signal applied to an input thereof, comprising: input means coupled to the input for transferring the input signal to a first output when the input signal is within a predetermined voltage range; detection means including an N-channel field oxide device transistor coupled to the input for providing a detection signal at an output thereof responsive to the input signal becoming more positive than a predetermined level; and a buffer stage coupled between said output of said detection circuit and a second output for providing a first binary logic state at said second output responsive to said detection signal being applied at the input.

Claim 18

Integrated voltage level circuit for providing a plurality of output functions at respective outputs responsive to an input signal applied to an input thereof, comprising: input means coupled to the input for transferring the input signal to a first output when the input signal is within a predetermined voltage range; detection means including an N-channel field oxide device transistor coupled to the input for providing a detection signal at an output thereof responsive to the input signal becoming more positive than a predetermined level; and a buffer stage coupled between said output of said detection circuit and a second output for providing a first binary logic state at said second output responsive to said detection signal being applied at the input.

Claim 19

The integrated voltage level circuit according to claim 15 wherein said input means includes: an N-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said N-channel enhancement mode transistor, and a drain coupled to the input; a first resistor coupled between said N-channel enhancement mode transistor and said first supply voltage terminal; a second resistor coupled between the input and said first output; and a third resistor coupled between the input and said detection means.

Claim 20

The integrated voltage level circuit according to claim 16 wherein said N-channel field oxide device transistor of said detection means has a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said ouput of said detection means.

Claim 21

The integrated voltage level circuit according to claim 17 wherein said buffer stage includes: a P-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, a gate coupled to said output of said detection means, and drain; and an N-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said gate of said P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 22

The integrated voltage level circuit according to claim 18 further includes: a P-channel enhancement mode transistor having a source coupled to a second supply voltage terminal, a gate coupled to said gate of said N-channel field oxide device transistor of said detection means, and a drain coupled to said output of said detection means.

Claim 23

In an integrated circuit, a detector circuit for increasing the functionality of the integrated circuit without requiring an increase in the number of terminals of the integrated circuit, comprising: input means coupled to a terminal of the integrated circuit for transferring a signal applied thereto to a first output of the detector circuit when said signal is representative of predetermined logic levels; detection means including a P-channel field oxide device coupled to said terminal of the integrated circuit for providing a detection signal at an output thereof whenever said signal becomes more negative than a predetermined negative threshold voltage; and a buffer stage responsive to said detection signal for providing a binary logic signal at a second output of the detector circuit.

Claim 24

In an integrated circuit, a detector circuit for increasing the functionality of the integrated circuit without requiring an increase in the number of terminals of the integrated circuit, comprising: input means coupled to a terminal of the integrated circuit for transferring a signal applied thereto to a first output of the detector circuit when said signal is representative of predetermined logic levels; detection means including a P-channel field oxide device coupled to said terminal of the integrated circuit for providing a detection signal at an output thereof whenever said signal becomes more negative than a predetermined negative threshold voltage; and a buffer stage responsive to said detection signal for providing a binary logic signal at a second output of the detector circuit.

Claim 25

The detector circuit according to claim 20 wherein said input means includes: a P-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said P-channel enhancement mode transistor, and a drain coupled to said terminal of said integrated circuit; a first resistor coupled between said drain of said P-channel enhancement mode transistor and a second supply voltage terminal; a second resistor coupled between said terminal of said integrated circuit and said first output; and a third resistor coupled between said terminal of said integrated circuit and said detection means.

Claim 26

The detector circuit according to claim 21 wherein said P-channel field oxide device of said detection means is a P-channel field oxide device transistor having a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said output of said detection means.

Claim 27

The detector circuit according to claim 22 wherein said buffer stage includes: a first P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said output of said detection means, and a drain; a first N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, and a gate and drain coupled to said gate and drain of said first P-channel enhancement mode transistor of said buffer stage, respectively; a second P-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said drain of said first P-channel enhancement mode transistor of said buffer stage, and a drain; and a second N-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, a gate coupled to said gate of said second P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said second P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 28

The detector circuit according to claim 23 further includes: a resistor coupled between said gate of said first P-channel enhancement mode transistor of said buffer stage and said second supply voltage terminal.

Claim 29

In an integrated circuit, a detector circuit for increasing the functionality of the integrated circuit without requiring an increase in the number of terminals of the integrated circuit, comprising: input means coupled to a terminal of the integrated circuit for transferring a signal applied thereto to a first output of the detector circuit when said signal is representative of predetermined logic levels; detection means including an N-channel field oxide device coupled to said terminal of the integrated circuit for providing a detection signal at an output thereof whenever said signal exceeds a predetermined positive threshold voltage; and a buffer stage responsive to said detection signal for providing a binary logic signal at a second output of the detector circuit.

Claim 30

In an integrated circuit, a detector circuit for increasing the functionality of the integrated circuit without requiring an increase in the number of terminals of the integrated circuit, comprising: input means coupled to a terminal of the integrated circuit for transferring a signal applied thereto to a first output of the detector circuit when said signal is representative of predetermined logic levels; detection means including an N-channel field oxide device coupled to said terminal of the integrated circuit for providing a detection signal at an output thereof whenever said signal exceeds a predetermined positive threshold voltage; and a buffer stage responsive to said detection signal for providing a binary logic signal at a second output of the detector circuit.

Claim 31

The detector circuit according to claim 25 wherein said input means includes: an N-channel enhancement mode transistor having a source coupled to a first supply voltage terminal, a gate coupled to said source of said N-channel enhancement mode transistor, and a drain coupled to said terminal of said integrated circuit; a first resistor coupled between said drain of said N-channel enhancement mode transistor and said first supply voltage terminal; a second resistor coupled between said terminal of said integrated circuit and said first output; and a third resistor coupled between said terminal of said integrated circuit and said detection means.

Claim 32

The detector circuit according to claim 26 wherein said N-channel field oxide device of said detection means is a N-channel field oxide device transistor having a source coupled to said first supply voltage terminal, a gate coupled to said third resistor, and a drain coupled to said output of said detection means.

Claim 33

The detector circuit according to claim 27 wherein said buffer stage includes: a P-channel enhancement mode transistor having a source coupled to a second supply voltage terminal, a gate coupled to said output of said detection means, and a drain; and an N-channel enhancement mode transistor having a source coupled to said first supply voltage terminal, a gate coupled to said gate of said second P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said drain of said second P-channel enhancement mode transistor of said buffer stage and to said second output.

Claim 34

The detector circuit according to claim 28 further includes: a P-channel enhancement mode transistor having a source coupled to said second supply voltage terminal, and a gate coupled to said gate of said drain of said P-channel enhancement mode transistor of said buffer stage, and a drain coupled to said output of said detection means.