Method and apparatus for fine movement of specimen stage of electron microscope

Claim 1

An apparatus for fine movement of a specimen stage of an electron microscope, comprising: an electron beam optical system for irradiating a specimen mounted on said specimen stage with an electron beam and forming on a viewing screen a magnified image of said specimen; a drive unit for moving said specimen stage in X and perpendicular Y directions on a plane substantially perpendicular to the optical axis of said electron beam optical system; means for setting a value of enlargement magnification, M, of said electron beam microscope; a first pulse generator circuit for generating a pulse signal PX1 which accords, in number of pulses, with the distance said specimen stage moves in said X direction, and a pulse signal PY1 which accords, in number of pulses, with the distance said specimen stage moves in said Y direction; input means for instructing movement of said specimen stage and therefore the magnified image of said specimen as viewed on said viewing screen by a desired distance in at least one of said X and Y directions; a second pulse generator circuit for generating a pulse signal PX2 which accords, in number of pulses, with said instructed movement in the X direction by said input means, and a pulse signal PY2 which accords, in number of pulses, with said instructed movement in the Y direction by said input means; and drive control means for sending control signals to said drive unit after said input means instructs movement of said specimen stage by said drive unit until the following equations are satisfied: PX2·K/M=PX1 PY2·K/M=PY1 where K is a constant.

Claim 2

An apparatus for fine movement of a specimen stage of an electron microscope, comprising: an electron beam optical system for irradiating a specimen mounted on said specimen stage with an electron beam and forming on a viewing screen a magnified image of said specimen; a drive unit for moving said specimen stage in X and perpendicular Y directions on a plane substantially perpendicular to the optical axis of said electron beam optical system; means for setting a value of enlargement magnification, M, of said electron beam microscope; a first pulse generator circuit for generating a pulse signal PX1 which accords, in number of pulses, with the distance said specimen stage moves in said X direction, and a pulse signal PY1 which accords, in number of pulses, with the distance said specimen stage moves in said Y direction; input means for instructing movement of said specimen stage and therefore the magnified image of said specimen as viewed on said viewing screen by a desired distance in at least one of said X and Y directions; a second pulse generator circuit for generating a pulse signal PX2 which accords, in number of pulses, with said instructed movement in the X direction by said input means, and a pulse signal PY2 which accords, in number of pulses, with said instructed movement in the Y direction by said input means; and drive control means for sending control signals to said drive unit after said input means instructs movement of said specimen stage by said drive unit until the following equations are satisfied: PX2·K/M=PX1 PY2·K/M=PY1 where K is a constant.

Claim 11

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage and therefore said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of the optical axis of said electron microscope; delivering at least a pulse signal PX2 or a pulse signal PY2 which accords with the amount of movement instructed to be caused by said manipulation unit means, respectively, in said X direction and said Y direction; moving said specimen stage in at least said X or Y directions in accordance with said pulse signal PX2 and said pulse signal PY2; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage moves in said X or Y directions, respectively; and stopping movement of said specimen stage when the relation represented by PX2·K/M=PX1 and the relation represented by PY2·K/M=PY1 are satisfied, where K is a constant.

Claim 12

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage and therefore said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of the optical axis of said electron microscope; delivering at least a pulse signal PX2 or a pulse signal PY2 which accords with the amount of movement instructed to be caused by said manipulation unit means, respectively, in said X direction and said Y direction; moving said specimen stage in at least said X or Y directions in accordance with said pulse signal PX2 and said pulse signal PY2; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage moves in said X or Y directions, respectively; and stopping movement of said specimen stage when the relation represented by PX2·K/M=PX1 and the relation represented by PY2·K/M=PY1 are satisfied, where K is a constant.

Claim 13

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage so said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of said electron microscope; delivering, within a predetermined interval of time, at least a pulse signal PX2 or a pulse signal PY2 which accords with the amount of movement instructed to be caused by said manipulation unit means, respectively, in said X direction and said Y direction; moving said specimen stage in at lease said X or Y direction in accordance with said pulse signal PX2 and said pulse signal PY2; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage moves in said X or Y directions, respectively; continuing movement of said specimen stage until the relation represented by PX2·K/M=PX1 and the relation represented by PY2·K/M=PY1 are satisfied, where K is a constant; and operating said manipulation unit means repetitively.

Claim 14

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage so said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of said electron microscope; delivering, within a predetermined interval of time, at least a pulse signal PX2 or a pulse signal PY2 which accords with the amount of movement instructed to be caused by said manipulation unit means, respectively, in said X direction and said Y direction; moving said specimen stage in at lease said X or Y direction in accordance with said pulse signal PX2 and said pulse signal PY2; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage moves in said X or Y directions, respectively; continuing movement of said specimen stage until the relation represented by PX2·K/M=PX1 and the relation represented by PY2·K/M=PY1 are satisfied, where K is a constant; and operating said manipulation unit means repetitively.

Claim 15

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: moving said specimen stage to a reference position; setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage so said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of said electron microscope; detecting outputs from said manipulation unit means; moving said specimen stage in at least the X or Y directions in accordance with said detected outputs of said manipulation unit means; detecting and displaying distance moved from said reference position of said specimen stage; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage has moved in said X or Y directions, respectively; and operating said specimen stage moving step until the relations represented by PX2·K/M=PX1 and the relation represented by PX2·K/M=PY1 are satisfied, where K is a constant.

Claim 16

A method for fine movement of a specimen stage of an electron microscope, comprising the steps of: moving said specimen stage to a reference position; setting a value of enlargement magnification, M, of said electron microscope; forming on a viewing screen an enlarged image, magnified M times, of a specimen mounted on said specimen stage; operating a manipulation unit means that instructs movement of said specimen stage so said enlarged image as viewed on said viewing screen, instructed movement of said specimen stage is in at least the X direction or the perpendicular Y direction on a plane substantially perpendicular to the optical axis of said electron microscope; detecting outputs from said manipulation unit means; moving said specimen stage in at least the X or Y directions in accordance with said detected outputs of said manipulation unit means; detecting and displaying distance moved from said reference position of said specimen stage; delivering at least a pulse signal PX1 or a pulse signal PY1 which accords with the distance said specimen stage has moved in said X or Y directions, respectively; and operating said specimen stage moving step until the relations represented by PX2·K/M=PX1 and the relation represented by PX2·K/M=PY1 are satisfied, where K is a constant.