US4993136A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of converting a vacuum test fixture on a board testing apparatus to a mechanical test fixture
Assignee: Agilent Technologies Inc
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Filing: 1989-06-19
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Granted: 1991-02-19
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Expires: 2009-06-19
Abstract
Abstract A convertible, integrated handling and testing system is described for interfacing a printed circuit board or card having electronic devices at predetermined locations thereon to a probe plate having electrical contacts at predetermined locations. A method is also described for converting a conventional vacuum test fixture to a mechanical test fixture on tester apparatus, and for converting it back to a vacuum fixture again when desired. The board handling system includes a unique conveyor system which is capable of staging one board while testing another. The conveyor system can be disengaged from one board (for testing) while another board is advanced toward the test fixture.
Inventors
- 👤 Ronald K. Kerschner
- 👤 Bullock Michael L.
- 👤 James M. Hayes
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 16:09
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07328; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49716
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
273 words
A method for converting a vacuum test fixture on a tester apparatus to a mechanical test fixture for the testing of a board or card having electronic devices thereon at fixed predetermined locations, wherein said vacuum test fixture is of the type including a lower probe plate, handles on first and second opposite sides thereof, one or more upstanding alignment pins supported by said lower probe plate, a horizontal support plate disposed above said lower probe plate, and a gasket member disposed between said lower probe plate and said support plate; said method including the steps of: (a) removing said handles from said lower probe plate; (b) securing an elongated latch member to each of said first and second opposite sides of said lower probe plate; wherein each said latch member comprises spaced-apart cantilever strips; wherein said strips are separated by a first distance; wherein at a predetermined location in each said latch member said strips are spaced from each other a second distance which is greater than said first distance to form a keyhole opening; (c) detachably securing said lower probe plate to said tester apparatus; (d) providing board handling apparatus and detachably securing said apparatus to the top of said tester apparatus; (e) providing an upper probe plate; (f) providing alignment means for aligning a printed circuit board to be tested between said upper and lower probe plates; and (g) supporting said upper probe plate in said board handling apparatus in a manner such that it is aligned vertically over said lower probe plate and is adapted to be moved toward said lower probe plate for testing said printed circuit board.
Claim 2
Independent Claim
273 words
A method for converting a vacuum test fixture on a tester apparatus to a mechanical test fixture for the testing of a board or card having electronic devices thereon at fixed predetermined locations, wherein said vacuum test fixture is of the type including a lower probe plate, handles on first and second opposite sides thereof, one or more upstanding alignment pins supported by said lower probe plate, a horizontal support plate disposed above said lower probe plate, and a gasket member disposed between said lower probe plate and said support plate; said method including the steps of: (a) removing said handles from said lower probe plate; (b) securing an elongated latch member to each of said first and second opposite sides of said lower probe plate; wherein each said latch member comprises spaced-apart cantilever strips; wherein said strips are separated by a first distance; wherein at a predetermined location in each said latch member said strips are spaced from each other a second distance which is greater than said first distance to form a keyhole opening; (c) detachably securing said lower probe plate to said tester apparatus; (d) providing board handling apparatus and detachably securing said apparatus to the top of said tester apparatus; (e) providing an upper probe plate; (f) providing alignment means for aligning a printed circuit board to be tested between said upper and lower probe plates; and (g) supporting said upper probe plate in said board handling apparatus in a manner such that it is aligned vertically over said lower probe plate and is adapted to be moved toward said lower probe plate for testing said printed circuit board.
Claim 3
Dependent Claim
101 words
A method in accordance with claim 1, wherein said upper probe plate includes downwardly extending post members having first and second ends; wherein said first ends are secured to said upper probe plate and said second ends are tapered and include a groove; wherein said second ends of said post members are adapted to be detachably engaged in said grooves by said strips of said latch members; wherein said post members on said upper probe plate are released from said latch members on said lower probe plate when said second end of each said post member is in said keyhole opening.
Claim 4
Dependent Claim
43 words
A method in accordance with claim 2, wherein said cantilever strips are movable horizontally between locking and release positions; wherein when said strips are in said release positions, said second end of each said post member is aligned with a said keyhole opening.
Claim 5
Dependent Claim
68 words
A method in accordance with claim 1, wherein said board handling apparatus further includes a frame member and conveyor means for engaging and transporting said printed circuit board from a position outside said frame to a position between said upper and lower probe plates; said conveyor means being further adapted to transport said board from said position between said probe plates to another position outside said frame member.
Claim 6
Dependent Claim
33 words
A method in accordance with claim 4, wherein said board handling apparatus further includes disengagement means adapted to disengage said board from said conveyor means when said board is between said probe plates.
Claim 7
Dependent Claim
49 words
A method in accordance with claim 4, wherein said conveyor means comprises first and second parallel rail members, wherein said first rail member includes a driven endless belt having a plurality of tab members thereon, wherein at least one of said tab members is adapted to engage said board.
Claim 8
Dependent Claim
43 words
A method in accordance with claim 1, wherein said probe plates each include transfer pins which are adapted to transfer electrical signals from one said probe plate to the other said probe plate when said upper probe plate is biased against said board.
Claim 9
Dependent Claim
32 words
A method in accordance with claim 4, wherein said upper and lower probe plates are adapted to be latched together to form a cassette which is slidingly removable from said frame member.
Claim 10
Independent Claim
159 words
A method for converting a vacuum test fixture on a tester apparatus to a mechanical test fixture for the testing of a board or card having electronic devices thereon at fixed predetermined locations, wherein said vacuum test fixture is of the type including a lower probe plate and one or more upstanding alignment pins supported by said lower probe plate; said method including the steps of: (a) detachably securing said lower probe plate to said tester apparatus; (b) providing board handling apparatus and detachably securing said apparatus to the top of said tester apparatus; (c) providing upper bias means; (d) providing alignment means for aligning a printed circuit board to be tested with said lower probe plate; and (e) supporting said upper bias means in said board handling apparatus in a manner such that it is aligned vertically over said lower probe plate and is adapted to move said printed circuit board toward said lower probe plate for testing.
Claim 11
Independent Claim
159 words
A method for converting a vacuum test fixture on a tester apparatus to a mechanical test fixture for the testing of a board or card having electronic devices thereon at fixed predetermined locations, wherein said vacuum test fixture is of the type including a lower probe plate and one or more upstanding alignment pins supported by said lower probe plate; said method including the steps of: (a) detachably securing said lower probe plate to said tester apparatus; (b) providing board handling apparatus and detachably securing said apparatus to the top of said tester apparatus; (c) providing upper bias means; (d) providing alignment means for aligning a printed circuit board to be tested with said lower probe plate; and (e) supporting said upper bias means in said board handling apparatus in a manner such that it is aligned vertically over said lower probe plate and is adapted to move said printed circuit board toward said lower probe plate for testing.
Claim 12
Dependent Claim
16 words
A method in accordance with claim 9, wherein said bias means comprises an upper probe plate.
Claim 13
Dependent Claim
19 words
A method in accordance with claim 10, further comprising registration means for registering said upper and lower probe plates.
Claim 14
Dependent Claim
56 words
A method in accordance with claim 11, wherein said registration means comprises (a) a plurality of post members carried by one of said probe plates, and (b) a corresponding plurality of receiving openings in the other said probe plate for receiving said post members when said upper probe plate is moved toward said lower probe plate.
Claim 15
Dependent Claim
26 words
A method in accordance with claim 12, wherein said post members are carried by said upper probe plate and project downward toward said lower probe plate.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-02-18 | 1994-08-20 | 1995-02-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-02-18 | 1998-08-20 | 1999-02-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-02-18 | 2002-08-20 | 2003-02-19 | $7700.00 | Window Closed / Lapsed |