Scanning electron microscope

Claim 2

A scanning electron microscope comprising: (a) an emitter tip maintained at voltage V0 for accelerating an electron beam emitted from the emitter tip; (b) an anode maintained at ground potential; (c) extraction electrode maintained at voltage V1 being arranged between the emitter tip and the anode; (d) fluctuation detecting means for detecting the current intensity of the electron beam passing through the anode by using a detecting element arranged between the emitter tip and a specimen to be irradiated by the electron beam and generating the signal E(r); (e) a signal processing means for processing the signal E(r) so that the processed signal level is maintained at a constant level when the ratio of V0/V1 is varied; (f) an electron optical system for focusing the electron beam passing through the anode and scanning the electron beam over the specimen surface; (g) a detector for detecting the signal from the specimen yielded by the electron beam scanning; (h) display means in synchronization with the electron beam scanning for displaying a scanning image; and (i) means for supplying the signal corresponding to the ratio of the output signal of the detector and the output of the signal processing means to the display means as a scanning image signal.

Claim 3

A scanning electron microscope of claim 1, wherein the fluctuation detecting means (d) comprises an aperture plate arranged in the electron optical system and an amplifier for amplifying the current of the electron beam absorbed by the aperture plate.

Claim 4

A scanning electron microscope comprising: (a) an emitter tip maintained at voltage V0 for accelerating an electron beam passing through the anode; (b) an anode maintained at ground potential; (c) an extraction electrode maintained at voltage V1, being arranged between the emitter tip and the anode; (d) voltage ratio signal generator for generating the ratio signal r of acceleration voltage V0 and extraction voltage V1; (e) a signal converter for converting the ratio signal r to G(r)=∝·I(r), where ∝ is constant, by using the previously stored signal level I(r) of the detected electron beam passing through the anode as a function of ratio signal r; (f) fluctuation detecting means for detecting the current intensity of the electron beam passing through the anode by using a detecting element arranged between the anode and a specimen to be irradiated by the electron beam and generating the signal E(r); (g) monitor signal generator for generating the signal of voltage ratio of the signal E(r) supplied from the fluctuation detecting means and the signal G(r) supplied from the signal converter; (h) an electron optical system for focusing the electron beam passing through the anode and scanning the electron beam over the specimen surface; (i) a detector for detecting the signal from the specimen yielded by the electron beam scanning; (j) a display means in synchronization with the electron beam scanning for displaying a scanning electron image; and (k) means for supplying the signal corresponding to the ratio of the output signal of the detector and the output of the monitor signal generator to the display means as a scanning image signal.

Claim 5

A scanning electron microscope comprising: (a) an emitter tip maintained at voltage V0 for accelerating an electron beam passing through the anode; (b) an anode maintained at ground potential; (c) an extraction electrode maintained at voltage V1, being arranged between the emitter tip and the anode; (d) voltage ratio signal generator for generating the ratio signal r of acceleration voltage V0 and extraction voltage V1; (e) a signal converter for converting the ratio signal r to G(r)=∝·I(r), where ∝ is constant, by using the previously stored signal level I(r) of the detected electron beam passing through the anode as a function of ratio signal r; (f) fluctuation detecting means for detecting the current intensity of the electron beam passing through the anode by using a detecting element arranged between the anode and a specimen to be irradiated by the electron beam and generating the signal E(r); (g) monitor signal generator for generating the signal of voltage ratio of the signal E(r) supplied from the fluctuation detecting means and the signal G(r) supplied from the signal converter; (h) an electron optical system for focusing the electron beam passing through the anode and scanning the electron beam over the specimen surface; (i) a detector for detecting the signal from the specimen yielded by the electron beam scanning; (j) a display means in synchronization with the electron beam scanning for displaying a scanning electron image; and (k) means for supplying the signal corresponding to the ratio of the output signal of the detector and the output of the monitor signal generator to the display means as a scanning image signal.

Claim 6

A scanning electron microscope comprising: (a) an emitter tip maintained at voltage V0 for accelerating an electron beam passing through the anode; (b) an anode maintained at ground potential; (c) an extraction electrode maintained at voltage V1, being arranged between the emitter tip and the anode; (d) voltage ratio signal generator for generating the ratio signal r of acceleration voltage V0 and extraction voltage V1; (e) comparator for comparing the signal of ratio signal r with the reference signal value; (f) signal converter for converting the ratio signal r to G1(r)=∝1·I(r) or G2(r)=∝2·I(r), where ∝1 and ∝2 are constant according to the output of the comparator by using the previously stored signal level I(r) of the detected electron beam passing through the anode as a function of ratio signal r; (g) fluctuation detecting means for detecting the current intensity of the electron beam passing through the anode by using a detecting element arranged between the anode and a specimen to be irradiated by the electron beam and generating the signal E1(r) or E2(r) (=k E1(r), L where k=∝2/∝1), according to the output of the comparator; (h) monitor signal generating means for generating the signal of voltage ratio of E1(r) and G1(r) or the voltage ratio of E2(r) and G2(r); (i) an electron optical system for focusing the electron beam passing through the anode and scanning the electron beam over the specimen surface; (j) a detector for detecting the signal from the specimen caused by the electron beam scanning; (k) display means in synchronization with the electron beam scanning for displaying a scanning image; and (1) means for supplying the signal corresponding to the ratio of the output signal of the detector and the output of the monitor signal generator to the display means as a scanning image signal.

Claim 7

A scanning electron microscope comprising: (a) an emitter tip maintained at voltage V0 for accelerating an electron beam passing through the anode; (b) an anode maintained at ground potential; (c) an extraction electrode maintained at voltage V1, being arranged between the emitter tip and the anode; (d) voltage ratio signal generator for generating the ratio signal r of acceleration voltage V0 and extraction voltage V1; (e) comparator for comparing the signal of ratio signal r with the reference signal value; (f) signal converter for converting the ratio signal r to G1(r)=∝1·I(r) or G2(r)=∝2·I(r), where ∝1 and ∝2 are constant according to the output of the comparator by using the previously stored signal level I(r) of the detected electron beam passing through the anode as a function of ratio signal r; (g) fluctuation detecting means for detecting the current intensity of the electron beam passing through the anode by using a detecting element arranged between the anode and a specimen to be irradiated by the electron beam and generating the signal E1(r) or E2(r) (=k E1(r), L where k=∝2/∝1), according to the output of the comparator; (h) monitor signal generating means for generating the signal of voltage ratio of E1(r) and G1(r) or the voltage ratio of E2(r) and G2(r); (i) an electron optical system for focusing the electron beam passing through the anode and scanning the electron beam over the specimen surface; (j) a detector for detecting the signal from the specimen caused by the electron beam scanning; (k) display means in synchronization with the electron beam scanning for displaying a scanning image; and (1) means for supplying the signal corresponding to the ratio of the output signal of the detector and the output of the monitor signal generator to the display means as a scanning image signal.