US4988403A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of forming patterned silicone rubber layer
Assignee: Rohm Co Ltd
•
Filing: 1989-12-19
•
Granted: 1991-01-29
•
Expires: 2009-12-19
Abstract
Abstract The present invention provides a method of forming a patterned silicone rubber layer on a surface of a workpiece such as a silicone wafer. According to the method, a polyimide film is first formed on the workpiece surface, and subsequently etched by lithography in a predetermined pattern. Then, a silicone rubber layer is formed on the workpiece surface over the patterned polyimide film by spin coating, and thereafter etched by plasma etching until the patterned polyimide film is exposed. Finally, the remaining polyimide film alone is completely etched away, so that the pattern previously given to the polyimide film is copied to the silicone rubber layer in a negative fashion.
Inventors
- 👤 Kozo Matuo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 11:48
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/73; H10W; H10W72/00; H10W72/90; H10W74/00; H10W74/40; H10W74/47; H10P14/00; H10P14/60; H10P14/63; H10P14/6326; H10P14/6342; H10P14/68; H10P14/683; H10W72/01; H10W72/019; H10W72/01904; H10W72/071; H10W72/075; H10W72/50; H10W72/531; H10W72/536; H10W72/59; H10W72/931; H10W72/932; H10W72/951; H10W72/952; H10W72/981; H10W72/983
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
112 words
A method of forming a patterned silicone rubber layer comprising the sequential steps of: forming a polyimide layer on a surface of a workpiece, etching said polyimide layer in a predetermined pattern; forming a silicone rubber layer on said workpiece surface over said patterned polyimide layer and said workpiece by spin coating, etching said silicone rubber layer by plasma etching until said patterned polyimide layer is exposed, and etching said patterned polyimide layer by contacting said polyimide with a hydrazine containing etching liquid until said polyimide layer is completely removed, said hydrazine concentration being effective for etching polyimide to thereby provide a pattern formed of said silicone rubber layer on said workpiece.
Claim 2
Independent Claim
112 words
A method of forming a patterned silicone rubber layer comprising the sequential steps of: forming a polyimide layer on a surface of a workpiece, etching said polyimide layer in a predetermined pattern; forming a silicone rubber layer on said workpiece surface over said patterned polyimide layer and said workpiece by spin coating, etching said silicone rubber layer by plasma etching until said patterned polyimide layer is exposed, and etching said patterned polyimide layer by contacting said polyimide with a hydrazine containing etching liquid until said polyimide layer is completely removed, said hydrazine concentration being effective for etching polyimide to thereby provide a pattern formed of said silicone rubber layer on said workpiece.
Claim 3
Dependent Claim
37 words
The method as defined in claim 1, wherein the formation of said silicone rubber layer is performed until the surface of said silicone rubber layer lies 2-3 micrometers above the top surface of said patterned polyimide layer.
Claim 4
Dependent Claim
22 words
The method as defined in claim 1, wherein said plasma etching is performed by utilizing a fluoride gas as the etchant gas.
Claim 5
Dependent Claim
20 words
The method as defined in claim 1, wherein said polyimide layer is formed on said workpiece surface by spin coating.
Claim 6
Dependent Claim
19 words
The method as defined in claim 1, wherein said predetermined pattern is given to said polyimide layer by lithography.
Claim 7
Independent Claim
134 words
A method of forming a patterned silicone rubber layer on a surface of a silicon wafer, said surface of silicon wafer being formed with a conductor pattern having bonding pads, said method comprising the sequential steps of: providing said silicon wafer having said conductor pattern and said bonding pads, forming polyimide islands on said bonding pads, forming a silicon rubber layer on said wafer surface over said wafer, said conductor pattern, said pads, and said polyimide islands by spin coating, etching said silicone rubber layer by plasma etching until said polyimide islands are exposed, and etching said polyimide islands by contacting said polyimide with a hydrazine containing etching liquid until said polyimide islands are completely removed, said hydrazine concentration being effective for etching polyimide so that windows are formed in said silicone rubber layer.
Claim 8
Independent Claim
134 words
A method of forming a patterned silicone rubber layer on a surface of a silicon wafer, said surface of silicon wafer being formed with a conductor pattern having bonding pads, said method comprising the sequential steps of: providing said silicon wafer having said conductor pattern and said bonding pads, forming polyimide islands on said bonding pads, forming a silicon rubber layer on said wafer surface over said wafer, said conductor pattern, said pads, and said polyimide islands by spin coating, etching said silicone rubber layer by plasma etching until said polyimide islands are exposed, and etching said polyimide islands by contacting said polyimide with a hydrazine containing etching liquid until said polyimide islands are completely removed, said hydrazine concentration being effective for etching polyimide so that windows are formed in said silicone rubber layer.
Claim 9
Dependent Claim
36 words
The method as defined in claim 6, wherein the formation of said silicone rubber layer is performed until the surface of said silicone rubber layer lies 2-3 micrometers above the top surfaces of said polyimide islands.
Claim 10
Dependent Claim
22 words
The method as defined in claim 6, wherein said plasma etching is performed by utilizing a fluoride gas as the etchant gas.
Claim 11
Dependent Claim
41 words
The method as defined in claim 6, wherein said polyimide islands are formed by first coating a polyimide layer on said wafer surface, said conductor pattern, and said bonding pads by spin coating, and subsequently patterning said polyimide layer by lithography.
References Cited (Backward Citations)
US3833436A
Cited
US4119483A
Cited
US4218283A
Cited
US4399016A
Cited
US4586976A
Cited
US4677036A
Cited
JPS61222179A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-01-28 | 1994-07-30 | 1995-01-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-01-28 | 1998-07-30 | 1999-01-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-01-28 | 2002-07-30 | 2003-01-29 | $7700.00 | Window Closed / Lapsed |