Laser gauge interferometer and locating method using the same

Claim 2

A laser gauge interferometer utilizing interference of laser beams, said laser gauge interferometer apparatus comprising: means for splitting a laser beam into two laser beams, namely a correcting beam and a measuring beam; first interferometer means for generating a measurement output representing the quantity of displacement of an object of measurement by use of said measuring beam passing through air independently of said correcting beam; second interferometer means for generating, independently of said measuring beam, a measurement output affected by the change of refractive index of air, different from the output of said first interferometer means and by use of said correcting beam passing through air in proximity to said measuring beam; and operational means responsive to said measurement outputs, a reference fixed signal representing a reference refractive index of air and a reference signal representative of a starting location for said object, for outputting the result of measurement representing the corrected quantity of displacement of the object of measurement free from the influence of change of the refractive index of air.

Claim 3

A laser gauge interferometer according to claim 1, further including means fixing the optical path lengths of both of said beams in air so that they vary according to movement of the object of measurement relative to said interferometer means.

Claim 4

A laser gauge interferometer according to claim 1, wherein said first and second interferometer means are separate from each other and respectively positioned on opposite sides of said object of measurement.

Claim 5

A laser gauge interferometer according to claim 1, wherein said interferometer means establishes separate paths of travel of said measuring beam and said correcting beam in air between said interferometer means and the object of measurement such that said paths correspondingly vary with movement of said object of the measurement and differ from each other by a fixed substantial length.

Claim 6

A laser gauge interferometer according to claim 1, wherein said interferometer means has a solid/air interface surface through which said measuring and correcting beams radiate toward the object of measurement; and abutment surface means providing positive contact between a surface of said interferometer means and a fixed reference surface that is coplanar with said solid/air interface surface and perpendicular to the paths of said measuring and correcting beams.

Claim 7

A laser gauge interferometer according to claim 1, further including motor means for moving the object of measurement along the direction of said paths and providing a positional feedback signal; means comparing said positional feedback signal with said object positional output signal and producing a correction signal for energizing said motor means.

Claim 10

A laser interferometer, comprising: interferometer means for splitting a laser beam into a measuring beam and a correcting beam; said laser interferometer means having a solid/air interface surface for passing the measuring beam between transmission in a solid within the interferometer means and transmission along a path passing through air between the interferometer means and an object of measurement; said interferometer means having a solid abutment surface rigidly interconnected with the solid and having a reference abutment surface point generally located adjacent to the point where the measuring beam passes through said solid/air interface surface; said surfaces being oriented such that a line drawn through said points intersects the path through the air at about 90 degrees; a rigid mounting base having a rigid solid reference face directly engaging said reference abutment surface point of said interferometer means for positively preventing movement of said interferometer means along the path in one direction toward said base face and providing lost motion between said interferometer means and said base in the opposite direction; and means biasing said interferometer means in said one direction relative to said base for fixing one end of the air path independently of thermal expansion of said interferometer means.

Claim 11

A laser interferometer, comprising: interferometer means for splitting a laser beam into a measuring beam and a correcting beam; said laser interferometer means having a solid/air interface surface for passing the measuring beam between transmission in a solid within the interferometer means and transmission along a path passing through air between the interferometer means and an object of measurement; said interferometer means having a solid abutment surface rigidly interconnected with the solid and having a reference abutment surface point generally located adjacent to the point where the measuring beam passes through said solid/air interface surface; said surfaces being oriented such that a line drawn through said points intersects the path through the air at about 90 degrees; a rigid mounting base having a rigid solid reference face directly engaging said reference abutment surface point of said interferometer means for positively preventing movement of said interferometer means along the path in one direction toward said base face and providing lost motion between said interferometer means and said base in the opposite direction; and means biasing said interferometer means in said one direction relative to said base for fixing one end of the air path independently of thermal expansion of said interferometer means.

Claim 12

The apparatus according to claim 8, wherein said interferometer means emits the measuring beam through said solid/air surface and receives the reflective measuring beam through said solid/air surface; and said solid/air surface extends planar and perpendicular to the air path.

Claim 13

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and or said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; reflecting means for reflecting the measurement beam of each of said measuring beam and said correcting beam at the end of their respective gas optical paths opposite from said interferometer means; one of said reflecting means and interferometer means being fixed relative to the object and the other of said reflecting means and interferometer means being fixed at a reference position; and said reflecting means and interferometer means establishing closely adjacent parallel gas optical paths for said measurement beams of each of said measuring beam and correcting beam with said gas optical paths having a fixed substantial difference in length independent of the relative movement between said object and said reference position.

Claim 14

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and or said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; reflecting means for reflecting the measurement beam of each of said measuring beam and said correcting beam at the end of their respective gas optical paths opposite from said interferometer means; one of said reflecting means and interferometer means being fixed relative to the object and the other of said reflecting means and interferometer means being fixed at a reference position; and said reflecting means and interferometer means establishing closely adjacent parallel gas optical paths for said measurement beams of each of said measuring beam and correcting beam with said gas optical paths having a fixed substantial difference in length independent of the relative movement between said object and said reference position.

Claim 15

The apparatus of claim 10, wherein said reflecting means comprises two reflecting mirrors spaced apart said fixed substantial distance for respectively reflecting the measurement beams of said measuring beam and correcting beam.

Claim 16

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; and said interferometer means comprises two separate interferometer means respectively for said measuring beam and said correcting beam for establishing respective measurement beams generally coaxial with each other and on opposite sides of the object whose position is being measured.

Claim 17

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; and said interferometer means comprises two separate interferometer means respectively for said measuring beam and said correcting beam for establishing respective measurement beams generally coaxial with each other and on opposite sides of the object whose position is being measured.

Claim 18

The apparatus according to claim 12, further including reflecting means for reflecting the measurement beam of each of said measuring beam and said correcting beam at the end of their respective gas optical paths opposite from said interferometer means; and one of said reflecting means and interferometer means being fixed relative to the object and the other of said reflecting means and interferometer means being fixed at a reference position.

Claim 19

The apparatus according to claim 13, wherein said reflecting means includes two oppositely facing reflective surfaces rigidly interconnected and respectively reflecting said measurement beams of said measuring beam and correcting beam.

Claim 20

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correction output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; and said operational means including means providing a reference refraction index value for the optical material of said gas optical path and providing a reference position value for an initial position for said object, and combining said reference position value and said reference refraction index value with said outputs of said optical path measuring means for producing an output signal correlated to the coordinate position of the object.

Claim 21

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correction output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; and said operational means including means providing a reference refraction index value for the optical material of said gas optical path and providing a reference position value for an initial position for said object, and combining said reference position value and said reference refraction index value with said outputs of said optical path measuring means for producing an output signal correlated to the coordinate position of the object.

Claim 22

The apparatus according to claim 15, further including reflecting means for reflecting the measurement beam of each of said measuring beam and said correcting beam at the end of their respective gas optical paths opposite from said interferometer means; and one of said reflecting means and interferometer means being fixed relative to the object of the other of said reflecting means and interferometer means being fixed at a reference position.

Claim 23

A laser gauge interferometer using interference of laser beans, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environment characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; motor means for moving the object of measurement along the direction of said paths and providing a positional feedback signal; and means comparing said positional feedback signal with said object positional output signal and producing a correction signal for energizing said motor means.

Claim 24

A laser gauge interferometer using interference of laser beans, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a reference optical path of fixed known length and fixed optical properties; means for passing each of said measurement beams along a gas optical path of unknown measurement length having optical-properties that change with environment characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; motor means for moving the object of measurement along the direction of said paths and providing a positional feedback signal; and means comparing said positional feedback signal with said object positional output signal and producing a correction signal for energizing said motor means.

Claim 25

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a gas optical path of fixed known length and fixed optical properties; means for passing each of said mesurement along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; said interferometer means having a solid/air interface surface through which said measuring and correcting beams radiate toward the object of measurement; and abutment surface means providing positive contact between a surface of said interferometer means and a fixed reference surface that is coplanar with said solid/air interface surface and perpendicular to the paths of said measuring and correcting means.

Claim 26

A laser gauge interferometer using interference of laser beams, comprising: means for splitting a laser beam into a correcting beam and a separate measuring beam; means for splitting each of said measuring beam and said correcting beam into a reference beam and a measurement beam; means for passing each of said reference beams along a gas optical path of fixed known length and fixed optical properties; means for passing each of said mesurement along a gas optical path of unknown measurement length having optical-properties that change with environmental characteristics, with the paths of said measurement beams being at least adjacent each other for generally subjecting them to the same changing optical properties; said interferometer means establishing an interference pattern between said reference beam and said measurement beam for each of said measuring beam and correcting beam; optical path measuring means for converting the interference pattern for said measuring beam and for said directing beam respectively, to produce measuring and correcting output signals correlated to the length of said gas optical path; operational means for combining said measuring and correcting output signals to thereby cancel measurement errors due to changing optical properties of said gas optical path and producing an object positional output signal correlated to the length of said gas optical path that is independent of changing optical properties; said interferometer means having a solid/air interface surface through which said measuring and correcting beams radiate toward the object of measurement; and abutment surface means providing positive contact between a surface of said interferometer means and a fixed reference surface that is coplanar with said solid/air interface surface and perpendicular to the paths of said measuring and correcting means.