US4983541A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor laser device fabrication
Assignee: Mitsubishi Electric Corp
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Filing: 1989-11-13
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Granted: 1991-01-08
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Expires: 2009-11-13
Abstract
Abstract Disclosed herein is a semiconductor laser device capable of exhibiting very low threshold current and operating in a fundamental transverse mode stably even at a high power operation, and a method for fabricating the same. The fabricating method includes only two crystal growth steps to thereby produce the semiconductor laser device capable of operating in the fundamental transverse mode at high power operation. The thus obtained device has high reproducability due to the simple fabricating process.
Inventors
- 👤 Hisao Kumabe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 19:24
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/223; H01S5/2232; H01S5/10; H01S5/16
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
235 words
A method for fabricating a semiconductor laser device comprising the steps of: forming a U-shaped stripe groove on an upper surface of a first-conductivity type semiconductor crystal substrate in a resonator direction; forming a first-conductivity type lower cladding layer on said substrate, which is bent along said groove; forming a first-conductivity type active layer on said lower cladding layer, which is bent along said groove, refractive index of said active layer being larger than that of said lower cladding layer; forming a second-conductivity type upper cladding layer on said active layer, which is bent along said groove, refractive index of said upper cladding layer being smaller than that of said active layer and forbidden band width of said upper cladding layer being larger than that of said active layer; forming a first-conductivity type current blocking layer on said upper cladding layer, which is bent along said groove; forming a rectangular groove at a center portion, except neighborhood of resonator mirrors, of said current blocking layer, so that a part of said upper cladding layer is exposed at a bottom of said rectangular groove; and forming a second-conductivity type contact layer on said current blocking layer and on said upper cladding layer in said rectangular groove successively, and simultaneously diffusing impurities at a center portion, except neighborhood of the resonator mirrors, of said active layer to thereby make forbidden band width of the diffusion region smaller.
Claim 2
Independent Claim
235 words
A method for fabricating a semiconductor laser device comprising the steps of: forming a U-shaped stripe groove on an upper surface of a first-conductivity type semiconductor crystal substrate in a resonator direction; forming a first-conductivity type lower cladding layer on said substrate, which is bent along said groove; forming a first-conductivity type active layer on said lower cladding layer, which is bent along said groove, refractive index of said active layer being larger than that of said lower cladding layer; forming a second-conductivity type upper cladding layer on said active layer, which is bent along said groove, refractive index of said upper cladding layer being smaller than that of said active layer and forbidden band width of said upper cladding layer being larger than that of said active layer; forming a first-conductivity type current blocking layer on said upper cladding layer, which is bent along said groove; forming a rectangular groove at a center portion, except neighborhood of resonator mirrors, of said current blocking layer, so that a part of said upper cladding layer is exposed at a bottom of said rectangular groove; and forming a second-conductivity type contact layer on said current blocking layer and on said upper cladding layer in said rectangular groove successively, and simultaneously diffusing impurities at a center portion, except neighborhood of the resonator mirrors, of said active layer to thereby make forbidden band width of the diffusion region smaller.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-01-07 | 1994-07-09 | 1995-01-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-01-07 | 1998-07-09 | 1999-01-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-01-07 | 2002-07-09 | 2003-01-08 | $7700.00 | Window Closed / Lapsed |