High density DRAM

Claim 2

A high density dynamic random access memory comprising: a semiconductor substrate having a plurality of spaced apart pedestals formed thereon and defining a plurality of trenches therebetween; semiconductor material positioned in the trenches and isolated from said pedestals by a capacitor dielectric to form a plurality of capacitors in conjunction with said plurality of pedestals, said semiconductor material electrically connected to said substrate; an insulating field oxide surrounding said pedestals proximate the bottom of said trench; a plurality of field effect transistors (FETs) formed in the trenches, each having a gate electrode, a drain electrode and a vertical source, each of said plurality of transistors being formed in conjunction with one of the plurality of capacitors; first electrically conducting lines connecting selected ones of the drain electrodes of the plurality of transistors; and second electrically conducting lines connecting selected ones of the gate electrodes of the plurality of transistors.

Claim 3

A high density dynamic random access memory as claimed in claim 1 wherein contacts for the drains of the plurality of transistors are formed, one each, on the upper surface of each of the pedestals.

Claim 4

A high density dynamic random access memory as claimed in claim 2 wherein the first lines connecting selected ones of the drain electrodes is formed of a relatively low resistance metal attached between contacts on the upper surfaces of the pedestals.

Claim 5

A high density dynamic random access memory as claimed in claim 1 wherein the substrate includes a lower, relatively heavily doped P + type layer and an upper, lightly doped P - type layer.

Claim 6

A high density dynamic random access memory as claimed in claim 1 wherein the gate electrode of each of the FETs includes a layer of relatively heavily doped poly-silicon substantially surrounding a pedestal adjacent the upper end thereof and insulated from the pedestal by the thin layer of gate oxide on the sides of the pedestal, and the drain electrode of each of the FETs includes an N + doped layer of silicon at the upper end of the pedestal.

Claim 7

A high density dynamic random access memory as claimed in claim 5 wherein the second line includes portions of the layer of relatively heavily doped poly-silicon extending between the selected ones of the gate electrodes.

Claim 8

A high density dynamic random access memory comprising: a semiconductor substrate; a plurality of pedestals of a first conductivity type formed on said substrate in spaced apart relationship to define a plurality of trenches therebetween; a second conductivity type layer positioned on each of said pedestals to form drain electrodes for a plurality of field effect transistors (FETs); a first gate layer of electrically insulating material formed on the sides of said pedestals in the trenches; a bulk layer of the second conductivity type semiconductor material positioned in the trenches, electrically connected to said substrate, and insulated from said pedestals by said first gate layer so as to form a capacitor in conjunction with each of said pedestals; a virtual source formed on the side of said pedestals for each of said FETs; a second gate layer of electrically insulating material formed on said bulk layer in the trenches and overlying a channel region extending from said drain electrode to said virtual source of each of said FETs; gate electrode material positioned in each of the trenches adjacent said second conductivity type layer and insulated from said pedestals, including said second conductivity type layer, by said first gate layer and insulated from said bulk layer by said second gate layer to form a plurality of gate electrodes, one gate electrode for each of the plurality of FETs; a relatively thick field oxide layer positioned on the sides of the pedestals adjacent the trench bottoms; first lines connecting selected ones of said plurality of drain electrodes; and second lines connecting selected ones of said plurality of gate electrodes.

Claim 9

A high density dynamic random access memory comprising: a semiconductor substrate; a plurality of pedestals of a first conductivity type formed on said substrate in spaced apart relationship to define a plurality of trenches therebetween; a second conductivity type layer positioned on each of said pedestals to form drain electrodes for a plurality of field effect transistors (FETs); a first gate layer of electrically insulating material formed on the sides of said pedestals in the trenches; a bulk layer of the second conductivity type semiconductor material positioned in the trenches, electrically connected to said substrate, and insulated from said pedestals by said first gate layer so as to form a capacitor in conjunction with each of said pedestals; a virtual source formed on the side of said pedestals for each of said FETs; a second gate layer of electrically insulating material formed on said bulk layer in the trenches and overlying a channel region extending from said drain electrode to said virtual source of each of said FETs; gate electrode material positioned in each of the trenches adjacent said second conductivity type layer and insulated from said pedestals, including said second conductivity type layer, by said first gate layer and insulated from said bulk layer by said second gate layer to form a plurality of gate electrodes, one gate electrode for each of the plurality of FETs; a relatively thick field oxide layer positioned on the sides of the pedestals adjacent the trench bottoms; first lines connecting selected ones of said plurality of drain electrodes; and second lines connecting selected ones of said plurality of gate electrodes.

Claim 10

A high density dynamic random access memory as claimed in claim 7 wherein the pedestals are integral with and a part of the substrate.

Claim 11

A high density dynamic random access memory as claimed in claim 7 wherein the gate electrode material is formed as a plurality of rings each extending substantially around one of the plurality of pedestals to form the gate electrode therewith.

Claim 12

A high density dynamic random access memory as claimed in claim 7 wherein the first lines are formed from a relatively low resistance material.

Claim 13

A high density dynamic random access memory as claimed in claim 10 wherein the gate electrode material is heavily doped poly-silicon and the second lines are formed of the gate electrode material extending between the selected gate electrodes.