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US4969199A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus for inspecting the molded case of an IC device

Assignee: Toshiba Corp
•
Filing: 1987-02-27
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Granted: 1990-11-06
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Expires: 2007-02-27
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Abstract

Abstract An inspection apparatus includes a device which prepares a circumscribing line of an object to be inspected from pictured image information of the inspected object, and a device which judges the quality of the inspected object from the image information on a portion of the inspected object defined by the circumscribing line prepared by the circumscribing line preparation device. The inspection apparatus may include a device which detects an inclination angle of a nondefective article with respect to a predetermined reference line from pictured image information of the nondefective article, said nondefective article serving as a reference which has the same configuration as the inspected object and registers the inclination angle as a reference angle, and a device for inspecting the quality of the inspected object based on the reference angle in the reference angle detecting and registering device. Moreover, the inspection apparatus may include a device which memorizes pictured image information of the object to be inspected by quantizing it, a device which rotates the quantized image information of the inspected object that is memorized in the quantization and memory device, and a device which memorizes the quantized image information rotated by the image information rotation device after making it multi-valued.

Inventors

  • 👤 Seietsu Nara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 20:00
CPC Classifications
G; G01; G01M; G01M3/00; G06; G06T; G06T7/00; G06T7/0002; G06T7/0004; G06T7/001; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/95; G01N21/956; G01N21/95607; G06T2207/00; G06T2207/30; G06T2207/30108; G06T2207/30148

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 94 words
An apparatus for inspecting the molded case portion of an IC device having connecting pins for connecting the IC device to other members, comprising: imaging means for taking an image of the IC device to be inspected; means for deriving positional information of the connecting pins from the image; means for making a circumscribing line enclosing the molded case portion of the image of the IC device in accordance with the positional information of the connecting pins; and means for judging quality of the molded case portion from the image inside the circumscribing line.
Claim 2
Independent Claim 94 words
An apparatus for inspecting the molded case portion of an IC device having connecting pins for connecting the IC device to other members, comprising: imaging means for taking an image of the IC device to be inspected; means for deriving positional information of the connecting pins from the image; means for making a circumscribing line enclosing the molded case portion of the image of the IC device in accordance with the positional information of the connecting pins; and means for judging quality of the molded case portion from the image inside the circumscribing line.
Claim 3
Dependent Claim 44 words
The apparatus as claimed in claim 1 wherein the deriving means derives the positional information of the connecting pins as a function of the pin orientation image in which the connecting pins are emphasized by quantizing the image according to a predetermined slice level.
Claim 4
Dependent Claim 27 words
The apparatus as claimed in claim 1 wherein the judging means includes means for obtaining projection information regarding projections of the image of the molded case portion.
Claim 5
Dependent Claim 20 words
The apparatus as claimed in claim 1 further comprising means for deducing multi-valued image information defined by the circumscribing line.
Claim 6
Dependent Claim 25 words
The apparatus as claimed in claim 4 further comprising means for determining an average image density within the circumscribing line of the multi-valued image information.
Claim 7
Dependent Claim 47 words
The apparatus as claimed in claim 5 further comprising means for quantizing the multi-valued image information within the circumscribing line on a basis of the averaged image density in order to obtain case image information indicating image of the molded case portion enclosed inside the circumscribing line.
Claim 8
Dependent Claim 27 words
The apparatus as claimed in claim 6 wherein the judging means judges the quality of the molded case portion as a function of the case image information.
Claim 9
Dependent Claim 31 words
The apparatus as claimed in claim 7 wherein the judging means includes means for obtaining projection information to be utilized in judging the quality of structure of the molded case portion.
Claim 10
Dependent Claim 40 words
The apparatus as claimed in claim 1 wherein the making means includes means for deriving pin image information in which the connecting pins are emphasized by quantizing the image taken by the imaging means according to a predetermined slice level.
Claim 11
Dependent Claim 26 words
The apparatus as claimed in claim 9 wherein the making means includes means for calculating the size of the connecting pins from the pin image information.
Claim 12
Dependent Claim 31 words
The apparatus as claimed in claim 10 wherein the judging means also judges quality of the connecting pins by comparing the calculated size of the connecting pins with a reference size.

References Cited (Backward Citations)

US4334241A Cited
US4525747A Cited
US4670788A Cited
US4696047A Cited
US4644410A Cited
US4737845A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-11-05 1994-05-07 1994-11-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-11-05 1998-05-07 1998-11-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-11-05 2002-05-07 2002-11-06 $7700.00 Window Closed / Lapsed

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