← Back to Patent Explorer
US4965448A Expired / Lapsed US ⏱️ 0.0 years remaining

Internal calibration source for infrared radiation detector

Assignee: Honeywell Inc
•
Filing: 1986-04-24
•
Granted: 1990-10-23
•
Expires: 2006-04-24
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An internal calibration source for an infrared radiation detector has a low emissivity surface with a high emissivity reticle thereon. An image of the detector is focused on the surface so that it is retroreflected back to the detector. The image is scanned between the high and low emissivity regions during calibration.

Inventors

  • 👤 Paul G. Morse
  • 👤 Charles C. Petty

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 19:27
CPC Classifications
G; G01; G01D; G01D18/00; G01D18/002; H; H04; H04N; H04N23/00; H04N23/20

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 63 words
An internal calibration source for an infrared radiation detector which scans a normal field of regard; a low emissivity surface with a high emissivity reticle thereon; means to focus an image of said detector on said surface so that said image is retroreflected back to said detector; and means to scan said image between said high and low emissivity region of said surface.
Claim 2
Dependent Claim 63 words
An internal calibration source for an infrared radiation detector which scans a normal field of regard; a low emissivity surface with a high emissivity reticle thereon; means to focus an image of said detector on said surface so that said image is retroreflected back to said detector; and means to scan said image between said high and low emissivity region of said surface.
Claim 3
Dependent Claim 24 words
An internal calibration source as in claim 1 wherein said surface is on a plate which has an aperture framing said field of regard.
Claim 4
Dependent Claim 34 words
An internal calibration source as in claim 2 wherein said reticle is a line which in length subtends the image of said detector and in width is less than the width of said detector.
Claim 5
Dependent Claim 31 words
An internal calibration source as in claim 2 wherein said reticle is a line which in length subtends said image and in width is greater than the width of said image.
Claim 6
Dependent Claim 34 words
An internal calibration source as in claim 1 wherein said reticle is a line which in length subtends the image of said detector and in width is less than the width of said detector.
Claim 7
Dependent Claim 31 words
An internal calibration source as in claim 1 wherein said reticle is a line which in length subtends said image and in width is greater than the width of said image.
Claim 8
Dependent Claim 104 words
An internal calibration source for an infrared radiation detector comprising in combination; means for scanning an image of said detector; means for driving said scanning means to scan said image through a normal field of regard in response to a scan drive input; a low emissivity surface with a high emissivity reticle thereon disposed outside said normal field of regard to retroreflect reflect an image of said detector back to said detector; and said driving means driving said scanning means to scan said image of said detector between said low emissivity surface and said high emissivity reticle in response to a calibration drive input.
Claim 9
Dependent Claim 104 words
An internal calibration source for an infrared radiation detector comprising in combination; means for scanning an image of said detector; means for driving said scanning means to scan said image through a normal field of regard in response to a scan drive input; a low emissivity surface with a high emissivity reticle thereon disposed outside said normal field of regard to retroreflect reflect an image of said detector back to said detector; and said driving means driving said scanning means to scan said image of said detector between said low emissivity surface and said high emissivity reticle in response to a calibration drive input.
Claim 10
Dependent Claim 24 words
An internal calibration source as in claim 7 wherein said surface is on a plate which has an aperture framing said field of regard.
Claim 11
Dependent Claim 34 words
An internal calibration source as in claim 7 wherein said reticle is a line which in length subtends the image of said detector and in width is less than the width of said detector
Claim 12
Dependent Claim 31 words
An internal calibration source as in claim 2 wherein said reticle is a line which in length subtends said image and in width is greater than the width of said image.
Claim 13
Dependent Claim 120 words
An internal calibration source for an infrared radiation detector comprising in combination; means for scanning an image of said detector; means for driving said scanning means to scan said image through a normal field of regard in response to a scan drive input; means including said scanning means for focusing an image of said detector at an internal focal plane; a low emissivity surface with a low emissivity reticle thereon disposed outside said normal field of regard to retroreflect an image of said detector back to said detector; and said driving means driving said scanning means to scan said image of said detector between said high emissivity surface and said low emissivity reticle in response to a calibration drive input.
Claim 14
Dependent Claim 120 words
An internal calibration source for an infrared radiation detector comprising in combination; means for scanning an image of said detector; means for driving said scanning means to scan said image through a normal field of regard in response to a scan drive input; means including said scanning means for focusing an image of said detector at an internal focal plane; a low emissivity surface with a low emissivity reticle thereon disposed outside said normal field of regard to retroreflect an image of said detector back to said detector; and said driving means driving said scanning means to scan said image of said detector between said high emissivity surface and said low emissivity reticle in response to a calibration drive input.
Claim 15
Dependent Claim 24 words
An internal calibration source as in claim 11 wherein said surface is on a plate which has an aperture framing said field of regard.
Claim 16
Dependent Claim 34 words
An internal calibration source as in claim 11 wherein said reticle is a line which in length subtends the image of said detector and in width is less than the width of said detector
Claim 17
Dependent Claim 31 words
An internal calibration source as in claim 11 wherein said reticle is a line which in length subtends said image and in width is greater than the width of said image.

References Cited (Backward Citations)

US3612879A Cited
US3694624A Cited
US3986384A Cited
US4280050A Cited
US4383173A Cited
US4378489A Cited
US4433924A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-10-22 1994-04-23 1994-10-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-10-22 1998-04-23 1998-10-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-10-22 2002-04-23 2002-10-23 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag