Integrated circuit having an improved bond pad

Claim 2

An integrated circuit module comprising: a package for enclosing an integrated circuit and containing a plurality of package bond pads; a semiconductor substrate defining a substrate plane and having a central area and a peripheral area located between said central area and an edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, each having a center point, connected to said integrated circuit and being disposed at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said edge of said substrate, and each of said circuit bond pads having a bond pad width along said pad axis and being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; and a plurality of wires, each bonded to a predetermined circuit bond pad at a single pad bond area on said circuit bond pad and to a corresponding package bond pad, whereby each of said plurality of wires extends above a predetermined wire path in said substrate plane and has a predetermined wire to pad distance of closest approach in three dimensions to an adjacent second bond pad, characterized in that: each circuit bond pad has a set of two pad bond areas comprising a first pad bond area and an alternative pad bond area, both of said first pad bond area and said alternative pad bond areas being located at predetermined non-central locations within said bond pad, an outer non-central location being located toward said edge of said substrate and an inner non-central location being located toward said central area and each of said plurality of wires is bonded to said predetermined circuit bond pad at one of said first pad bond area and alternative pad bond area; each of said predetermined wire paths makes a predetermined wire path angle with said pad axis, thereby defining maximum and minimum wire path angles associated with predetermined maximum angle and minimum angle pads of said plurality of circuit bond pads; and the wire path extending from said inner non-central location of a closest circuit bond pad adjacent to said minimum angle pad has a wire path to pad distance of closest approach that is greater than a predetermined wire path to pad tolerance.

Claim 3

An integrated circuit module according to claim 1, further characterized in that said plurality of generally rectangular circuit bond pads each have a first chamfer, having a first chamfer distance greater than said wire path diameter on the outer corner closest to a wire path, whereby the distance of closest approach from said wire path to an adjacent bond pad is increased.

Claim 4

An integrated circuit module according to claim 2, further characterized in that said plurality of generally rectangular bond pads are disposed in two groups on opposite sides of a transverse axis perpendicular to said pad axis, and that said first chamfers are formed on the outer corner of a bond pad that is closer to said transverse axis.

Claim 5

An integrated circuit module according to claim 3, further characterized in that said first pad bond area is located between said center point and said first chamfer.

Claim 6

An integrated circuit module according to claim 3, further characterized in that said plurality of generally rectangular circuit bond pads each have a second chamfer on an opposite corner from said first chamfer.

Claim 7

An integrated circuit module according to claim 2, further characterized in that said first pad bond area is located between said center point and said first chamfer.

Claim 8

An integrated circuit module according to claim 6, further characterized in that said plurality of generally rectangular bond pads each have a second chamfer on an opposite corner from said first chamfer.

Claim 9

An integrated circuit module according to claim 2, further characterized in that said plurality of generally rectangular circuit bond pads each have a second chamfer, having a second chamfer distance greater than said wire path diameter on an opposite corner from said first chamfer.

Claim 10

An integrated circuit module comprising: a package for enclosing an integrated circuit and containing a plurality of package bond pads; a semiconductor substrate defining a substrate plane and having a central area and a peripheral area located between said central area and an edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said edge of said substrate, and each of said circuit bond pads having a bond pad width along said pad axis being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; and a plurality of wires, each bonded to a predetermined circuit bond pad at a pad bond area on said circuit bond pad and to a corresponding package bond pad, whereby each of said plurality of wires extends above a predetermined wire to path in said substrate plane and has a predetermined wire to pad distance of closest approach in three dimensions to an adjacent second bond pad, characterized in that: each circuit bond pad has a set of two pad bond areas comprising a first pad bond area and a alternative pad bond area, both of said first pad bond and said alternative pad bond areas being located at predetermined non-central locations within said bond pad, an outer non-central location being located toward said edge of said substrate and an inner non-central location being located toward said central area and each of said plurality of wires is bonded to said predetermined circuit bond pad at one of said first pad bond area and alternative pad bond areas; each of said predetermined wire paths makes a predetermined wire path angle with said pad axis, thereby defining maximum and minimum wire path angles associated with predetermined maximum angle and minimum angle pads of said plurality of circuit bond pads; and that wire path extending from said outer non-central location on said minimum angle pad and the wire path extending from said inner non-central location of said closest bond pad adjacent to said minimum angle pad have a wire path distance of closest approach in said substrate plane that is greater than a predetermined wire path tolerance.

Claim 11

An integrated circuit module comprising: a package for enclosing an integrated circuit and containing a plurality of package bond pads; a semiconductor substrate defining a substrate plane and having a central area and a peripheral area located between said central area and an edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said edge of said substrate, and each of said circuit bond pads having a bond pad width along said pad axis being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; and a plurality of wires, each bonded to a predetermined circuit bond pad at a pad bond area on said circuit bond pad and to a corresponding package bond pad, whereby each of said plurality of wires extends above a predetermined wire to path in said substrate plane and has a predetermined wire to pad distance of closest approach in three dimensions to an adjacent second bond pad, characterized in that: each circuit bond pad has a set of two pad bond areas comprising a first pad bond area and a alternative pad bond area, both of said first pad bond and said alternative pad bond areas being located at predetermined non-central locations within said bond pad, an outer non-central location being located toward said edge of said substrate and an inner non-central location being located toward said central area and each of said plurality of wires is bonded to said predetermined circuit bond pad at one of said first pad bond area and alternative pad bond areas; each of said predetermined wire paths makes a predetermined wire path angle with said pad axis, thereby defining maximum and minimum wire path angles associated with predetermined maximum angle and minimum angle pads of said plurality of circuit bond pads; and that wire path extending from said outer non-central location on said minimum angle pad and the wire path extending from said inner non-central location of said closest bond pad adjacent to said minimum angle pad have a wire path distance of closest approach in said substrate plane that is greater than a predetermined wire path tolerance.

Claim 12

An integrated circuit module comprising: a package for enclosing an integrated circuit and containing a plurality of package bond pads; a semiconductor substrate having a central area and a peripheral area located between said central area and an edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed with a predetermined pitch at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said edge of said substrate from an origin, each of said circuit bond pads having a center point and a bond pad width along said pad axis and being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; and a plurality of wires, each bonded to a predetermined circuit bond pad at a pad bond area on said circuit bond pad and to a corresponding package bond pad, whereby each of said plurality of wires extends along a predetermined wire path in the plane of said substrate and has a predetermined wire to pad distance of closest approach in said plane of said substrate to an adjacent circuit second bond pad, characterized in that: each circuit bond pad has a predetermined width along said axis and a predetermined length perpendicular to said axis, said length being greater than said width; each bond pad has a chamfer, having a chamfer edge and a chamfer distance greater than said wire path diameter, on that corner located toward said edge and toward said origin; each of said predetermined wire paths makes a predetermined wire path angle with said pad axis, thereby defining a maximum and a minimum wire path angle associated with predetermined maximum angle and minimum angle pads of said plurality of circuit bond pads; and that wire to pad distance of closest approach extending to said minimum angle pad from the wire path associated with said closest circuit bond pad adjacent to said minimum angle pad extends to said chamfer edge by a wire to pad distance of closest approach that is greater than a predetermined tolerance.

Claim 13

An integrated circuit module comprising: a package for enclosing an integrated circuit and containing a plurality of package bond pads; a semiconductor substrate having a central area and a peripheral area located between said central area and an edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed with a predetermined pitch at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said edge of said substrate from an origin, each of said circuit bond pads having a center point and a bond pad width along said pad axis and being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; and a plurality of wires, each bonded to a predetermined circuit bond pad at a pad bond area on said circuit bond pad and to a corresponding package bond pad, whereby each of said plurality of wires extends along a predetermined wire path in the plane of said substrate and has a predetermined wire to pad distance of closest approach in said plane of said substrate to an adjacent circuit second bond pad, characterized in that: each circuit bond pad has a predetermined width along said axis and a predetermined length perpendicular to said axis, said length being greater than said width; each bond pad has a chamfer, having a chamfer edge and a chamfer distance greater than said wire path diameter, on that corner located toward said edge and toward said origin; each of said predetermined wire paths makes a predetermined wire path angle with said pad axis, thereby defining a maximum and a minimum wire path angle associated with predetermined maximum angle and minimum angle pads of said plurality of circuit bond pads; and that wire to pad distance of closest approach extending to said minimum angle pad from the wire path associated with said closest circuit bond pad adjacent to said minimum angle pad extends to said chamfer edge by a wire to pad distance of closest approach that is greater than a predetermined tolerance.

Claim 14

An integrated circuit according to claim 10, further characterized in that each of said plurality of circuit bond pads has a second chamfer, having a second chamfer distance greater than said wire path diameter on a corner diagonally opposite said first chamfer.

Claim 15

An integrated circuit comprising: a semiconductor substrate having a central area and a peripheral area located between said central area and a substrate edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed with a predetermined pitch at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said substrate edge of said substrate from an origin, each of said circuit bond pads having a reference point, having a bond pad width along said pad axis and being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; characterized in that: each circuit bond pad has a predetermined width along said axis and a predetermined length perpendicular to said axis, said length being greater than said width by an amount such that a first wire bond area may be placed within said circuit bond pad between said reference point and said chamfer and a second wire bond area may be placed symmetrically with respect to said reference point, said length and said width being further related by the condition that said first and second wire bond areas be no closer to any edge of said pad than a predetermined edge tolerance.

Claim 16

An integrated circuit comprising: a semiconductor substrate having a central area and a peripheral area located between said central area and a substrate edge of said substrate; a plurality of electronic components formed into an integrated circuit within said central area; a plurality of generally rectangular circuit bond pads, connected to said integrated circuit and being disposed with a predetermined pitch at predetermined locations within said peripheral area, said predetermined locations being located along a pad axis extending parallel to said substrate edge of said substrate from an origin, each of said circuit bond pads having a reference point, having a bond pad width along said pad axis and being separated by a pad gap distance less than said bond pad width along said axis from a closest bond pad; characterized in that: each circuit bond pad has a predetermined width along said axis and a predetermined length perpendicular to said axis, said length being greater than said width by an amount such that a first wire bond area may be placed within said circuit bond pad between said reference point and said chamfer and a second wire bond area may be placed symmetrically with respect to said reference point, said length and said width being further related by the condition that said first and second wire bond areas be no closer to any edge of said pad than a predetermined edge tolerance.

Claim 17

An integrated circuit according to claim 12, further characterized in that each circuit bond pad has a first chamfer, having a first chamfer edge, on that corner located toward said substrate edge and toward said origin.

Claim 18

An integrated circuit according to claim 13, further characterized in that each of said circuit bond pads has a second chamfer, on a corner opposite said first chamfer.