US4950981A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for testing a circuit board
Assignee: Tektronix Inc
•
Filing: 1989-04-14
•
Granted: 1990-08-21
•
Expires: 2009-04-14
Abstract
Abstract A probe for testing a circuit board having a plurality of test points distributed in a predetermined pattern over a main surface of the board comprises a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to the predetermined pattern. Probe elements extend in the passages respectively, the probe elements being movable independently of one another in the respective passages. Flexible conductors are connected to the probe elements. When the locating member is in confronting relationship with the main surface of the circuit board and the passages are in register with the test points and pressure is applied to the probe elements, the probe elements are brought into pressure contact with the test points.
Inventors
- 👤 Bozidar Janko
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:01
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
160 words
Apparatus for testing a circuit board having a plurality of test points distributed in a predetermined pattern at a main surface of the board, the apparatus comprising a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to said predetermined pattern, probe elements extending in said passages respectively, said probe elements being movable independently of one another in the respective passages, a flexible sheet of dielectric material to which the probe elements are attached, conductor runs adhered to the flexible sheet of dielectric material and connected to said probe elements respectively, and means for applying pressure to the flexible sheet of dielectric material when the locating member is in confronting relationship with the main surface of the circuit board and the passages are in register with the test points, whereby the flexible sheet of dielectric material is deflected and the probe elements are brought into pressure contact with the test points respectively.
Claim 2
Dependent Claim
160 words
Apparatus for testing a circuit board having a plurality of test points distributed in a predetermined pattern at a main surface of the board, the apparatus comprising a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to said predetermined pattern, probe elements extending in said passages respectively, said probe elements being movable independently of one another in the respective passages, a flexible sheet of dielectric material to which the probe elements are attached, conductor runs adhered to the flexible sheet of dielectric material and connected to said probe elements respectively, and means for applying pressure to the flexible sheet of dielectric material when the locating member is in confronting relationship with the main surface of the circuit board and the passages are in register with the test points, whereby the flexible sheet of dielectric material is deflected and the probe elements are brought into pressure contact with the test points respectively.
Claim 3
Dependent Claim
47 words
Apparatus according to claim 1, wherein the locating member is in the form of a generally rectangular frame and the passages are spaced apart along the sides of the frame, whereby the probe elements can be used to contact test points distributed about a rectangular electronic component.
Claim 4
Dependent Claim
15 words
Apparatus according to claim 1, wherein the passages are bores extending through the locating member.
Claim 5
Dependent Claim
17 words
Apparatus according to claim 1, wherein the passages are grooves at an edge of the locating member.
Claim 6
Dependent Claim
22 words
Apparatus according to claim 1, wherein the flexible sheet of dielectric material has multiple discrete fingers attached to the probe elements respectively.
Claim 7
Dependent Claim
14 words
Apparatus according to claim 5, wherein the conductor runs extend along the fingers respectively.
Claim 8
Dependent Claim
18 words
Apparatus according to claim 1, wherein the flexible sheet of dielectric material is attached to the locating member.
Claim 9
Dependent Claim
12 words
Apparatus according to claim 1, wherein the probe elements are rod like.
Claim 10
Dependent Claim
17 words
Apparatus according to claim 8, wherein the rod like probe elements extend substantially parallel to each other.
Claim 11
Dependent Claim
71 words
Apparatus according to claim 1, wherein the flexible sheet of dielectric material comprises first and second plies, the first ply being attached to the locating member and being attached to the second ply at locations spaced from the locating member and being movable relative to the second ply at locations close to the locating member, and the second ply comprising multiple discrete fingers to which the probe elements are respectively attached.
Claim 12
Dependent Claim
14 words
Apparatus according to claim 10, wherein the conductor runs extend along the fingers respectively.
Claim 13
Dependent Claim
157 words
In combination, a circuit board having a plurality of test points exposed in a predetermined pattern at a main surface thereof, and apparatus for testing the circuit board, the apparatus comprising a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to said predetermined pattern, probe elements extending in said passages respectively, said probe elements being movable independently of one another in the respective passages, a flexible sheet of dielectric material to which the probe elements are attached, conductor runs adhered to the flexible sheet of dielectric material and connected to said probe elements respectively, and means for applying pressure to the flexible sheet of dielectric material when the locating member is positioned in confronting relationship with the circuit board and the passages are in register with the test points, to deflect the flexible sheet of dielectric material and bring the probe elements into contact with the test points.
Claim 14
Dependent Claim
157 words
In combination, a circuit board having a plurality of test points exposed in a predetermined pattern at a main surface thereof, and apparatus for testing the circuit board, the apparatus comprising a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to said predetermined pattern, probe elements extending in said passages respectively, said probe elements being movable independently of one another in the respective passages, a flexible sheet of dielectric material to which the probe elements are attached, conductor runs adhered to the flexible sheet of dielectric material and connected to said probe elements respectively, and means for applying pressure to the flexible sheet of dielectric material when the locating member is positioned in confronting relationship with the circuit board and the passages are in register with the test points, to deflect the flexible sheet of dielectric material and bring the probe elements into contact with the test points.
Claim 15
Dependent Claim
26 words
A combination according to claim 12, wherein the flexible sheet of dielectric material includes multiple discrete finger portions to which the probe elements are respectively attached.
Claim 16
Dependent Claim
15 words
A combination according to claim 13, wherein the conductor runs extend along the fingers respectively.
Claim 17
Dependent Claim
19 words
A combination according to claim 12, wherein the flexible sheet of dielectric material is attached to the locating member.
Claim 18
Dependent Claim
72 words
A combination according to claim 12, wherein the flexible sheet of dielectric material comprises first and second plies, the first ply being attached to the locating member and being attached to the second ply at locations spaced from the locating member and being movable relative to the second ply at locations close to the locating member, and the second ply comprising multiple discrete fingers to which the probe elements are respectively attached.
Claim 19
Dependent Claim
15 words
A combination according to claim 16, wherein the conductor runs extend along the fingers respectively.
Claim 20
Dependent Claim
53 words
A combination according to claim 12, wherein the locating member is in the form of a generally rectangular frame and the passages are spaced apart along the sides of the frame, whereby the probe elements can be used to contact test points distributed about a rectangular electronic component mounted on the circuit board.
Claim 21
Dependent Claim
16 words
A combination according to claim 12, wherein the passages are bores extending through the locating member.
Claim 22
Dependent Claim
18 words
A combination according to claim 12, wherein the passages are grooves at an edge of the locating member.
Claim 23
Dependent Claim
13 words
A combination according to claim 12, wherein the probe elements are rod like.
Claim 24
Dependent Claim
41 words
A combination according to claim 21, wherein the probe elements each have first and second ends and the first and second ends of each probe element lie on a line extending substantially perpendicular to the general plane of the circuit board.
References Cited (Backward Citations)
US3445770A
Cited
US3824462A
Cited
US3970934A
Cited
US4177425A
Cited
US4232928A
Cited
US4647851A
Cited
US4514022A
Cited
US4649339A
Cited
US4658330A
Cited
US4658331A
Cited
US4758785A
Cited
US4820976A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-08-20 | 1994-02-19 | 1994-08-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-08-20 | 1998-02-19 | 1998-08-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-08-20 | 2002-02-19 | 2002-08-21 | $7700.00 | Window Closed / Lapsed |