Method of producing an X-ray image by means of a photoconductor, and device for performing the method

Claim 1

A method of producing an X-ray image by means of a photoconductor comprising a plurality of pixels, which converts X-rays into a charge pattern at each pixel, which is uniformly charged prior to X-ray exposure and is discharged during the X-ray exposure as a function of the intensity of the X-rays, said discharged photoconductor tending to exhibit faults at one or more pixel locations, said faults causing artefacts in said image, said artefacts having an amplitude (A (x i , y i ), said amplitude tending to vary in value in zones surrounding a fault, the photoconductor surface being scanned in order to determine the charge density at said pixels, for each pixel there being formed an image value which depends on the discharge at the corresponding pixel, said method characterized in measuring the positions (x i , y i ) of the one or more fault locations on the photoconductor, storing the positions of the fault locations and the variation (a(x i y)) of the artefacts caused by the faults in surrounding zones of the faults, determining from image values at the position of the fault locations (B(x i , y i )) and at the positions surrounding the fault locations (B(x, y) during subsequent X-ray exposures the amplitude (A(x i , y i )) of the artefacts at a fault location calculating the variation of the artefacts in the X-ray image in the surrounding zones from the amplitude (A(x i , y i )) and the stored variation (a(x, y)), and correcting the image values in the surrounding zones based upon said calculated variation.

Claim 2

A method of producing an X-ray image by means of a photoconductor comprising a plurality of pixels, which converts X-rays into a charge pattern at each pixel, which is uniformly charged prior to X-ray exposure and is discharged during the X-ray exposure as a function of the intensity of the X-rays, said discharged photoconductor tending to exhibit faults at one or more pixel locations, said faults causing artefacts in said image, said artefacts having an amplitude (A (x i , y i ), said amplitude tending to vary in value in zones surrounding a fault, the photoconductor surface being scanned in order to determine the charge density at said pixels, for each pixel there being formed an image value which depends on the discharge at the corresponding pixel, said method characterized in measuring the positions (x i , y i ) of the one or more fault locations on the photoconductor, storing the positions of the fault locations and the variation (a(x i y)) of the artefacts caused by the faults in surrounding zones of the faults, determining from image values at the position of the fault locations (B(x i , y i )) and at the positions surrounding the fault locations (B(x, y) during subsequent X-ray exposures the amplitude (A(x i , y i )) of the artefacts at a fault location calculating the variation of the artefacts in the X-ray image in the surrounding zones from the amplitude (A(x i , y i )) and the stored variation (a(x, y)), and correcting the image values in the surrounding zones based upon said calculated variation.

Claim 4

A device comprising an X-ray source, a photoconductor surface which is positioned to be exposed by X-rays from the X-ray source, a charging device for charging the photoconductor, an electrometer device for measuring the charge density on the surface of the photoconductor and for forming image values as a function of the charge density, and a first memory for storing the image values of an X-ray image, said device further comprising: a further memory for storing the position of fault locations and the variation of resultant artefacts in a zone surrounding said fault locations, an arithmetic unit for calculating the variation of the resultant artefacts in the X-ray image from the stored variation (a(x, y)) and from the amplitude (A(x i , y i )) of an artefact in the X-ray image, and means for correcting the image values (B(x, y)) within the surrounding zone based upon said calculated variation of the resultant artefacts.

Claim 5

A device comprising an X-ray source, a photoconductor surface which is positioned to be exposed by X-rays from the X-ray source, a charging device for charging the photoconductor, an electrometer device for measuring the charge density on the surface of the photoconductor and for forming image values as a function of the charge density, and a first memory for storing the image values of an X-ray image, said device further comprising: a further memory for storing the position of fault locations and the variation of resultant artefacts in a zone surrounding said fault locations, an arithmetic unit for calculating the variation of the resultant artefacts in the X-ray image from the stored variation (a(x, y)) and from the amplitude (A(x i , y i )) of an artefact in the X-ray image, and means for correcting the image values (B(x, y)) within the surrounding zone based upon said calculated variation of the resultant artefacts.