Device and method to measure a short radiation pulse or an electric pulse

Claim 3

A short pulse measuring device according to claim 1 comprising a plurality of said measuring units for which the lifetime of the majority carriers of the photoconductors differs from one unit to another, each being suitable for carrying out p measurement points of a short pulse of determined duration.

Claim 4

A short pulse measuring device according to claim 1, wherein each measuring unit comprises p+1 photoconductors, the lifetime τ of the majority carriers of said photoconductors being less than or equal to 10% of θ so as to have p measuring points for a pulse whose duration is equal to θ.

Claim 5

A short pulse measuring device according to claim 1, wherein each photoconductor includes a layer of cadmium telluride or gallium arsenide or indium phosphide.

Claim 6

A short pulse measuring method using a device according to claim 1 and consisting of closing the conductive line on which photoconductors are connected on the characteristic impedance at a single extremity of this line, a short electric pulse to be analyzed being sent onto the other extremity, a shorter radiation pulse being sent in synchronism with the descending front part of the electric pulse, a set of charges corresponding to a sampling of the electric pulse to be analyzed being obtained, each charge being recorded on one output electrodes of each photoconductor.

Claim 7

A short pulse measuring device according to claim 1 and including a first substrate having opposite first and second faces said first face being metallized; a set of conductive tracks and a conductive line on said second face, said conductive line being roughly perpendicular to said tracks and being spaced from the latter; a second substrate placed on said tracks and conductive line, said second substrate being coated with a metallic coating and including openings whose length is longer than the space existing between said tracks and conductive line, said photoconductors being constituted by blocks comprising a substrate, a semiconductive coating deposited on the substrate and a first and a second contact on the semiconductive coating at each of the extremities of the block, each block having dimensions enabling it to be housed inside a said opening of the second substrate; a first contact placed on said conductor line, and a second contact placed on one of said tracks.

Claim 8

A method for measuring a short pulse comprising the steps of closing the conductive line of the short pulse measuring device defined in claim 1 at each of its extremities by virtue of its characteristic impedance; sending a short radiation pulse, the first photoconductor being polarized by a predetermined d.c. voltage; sending through the line an image electric signal of the incident pulse so that S(t)=k·E(t), said signal polarizing the second photoconductor, said second photoconductor generating a current proportional to the convolution product of the pulse and its delayed image E 1 (t) where E 1 (t)=E(t+x/v), x being the length of the line separating these two photoconductors, v the propagation speed on the line, and x being selected so that the delay is equal to θ/p, with the photoconductors bearing majority carriers whose lifetime is less than or equal to 10% of θ, said signal successively polarizing in the same way all the other photoconductors with a delay increased each time by θ/p, and collecting a charge resultant of said convolution products at the output of each photoconductor except for the first one, each charge thus providing the measurement of a point of the autocorrelation function of the pulse to be measured.

Claim 9

A method for measuring a short pulse comprising the steps of closing the conductive line of the short pulse measuring device defined in claim 1 at its two extremities by virtue of its characteristic impedance; sending a short radiation pulse to be analyzed lighting all of the photoconductors; sending in synchronism with said pulse a shorter radiation pulse whose duration is less than or equal to the lifetime concerning the first photoconductor, said first photoconductor being polarized by a predetermined d.c. voltage, and obtaining a set of charges corresponding to a temporal sampling of the radiation pulse to be analyzed, each charge being recovered on an output electrode of each photoconductor except the first one.

Claim 10

The measurement method according to claim 8, wherein said short radiation pulse to be analyzed is sent onto the first photoconductor and said shorter pulse, whose duration is less than or equal to 6, onto all the photoconductors.

Claim 11

A method for measuring a short pulse comprising the steps of closing the conductive line connected to p photoconductors of the short pulse measuring device defined in claim 1; sending via its characteristic impedance at a single extremity a short electric pulse to be analyzed onto the other extremity; and sending a shorter radiation pulse onto said photoconductors in synchronism with the descending front part of the electric pulse thereby obtaining a set of charges corresponding to a sampling of the electric pulse to be analyzed, each charge being recovered on one output electrode of each photoconductor.