Tester for solid state electronic components

Claim 1

A quality tester for electronic components, said tester selectively providing indications of simple circuit continuity and, in two- and three-terminal solid state components, of short and open conditions, transistor type, and latchability of SCR's and triacs, said tester comprising: a DC voltage source having a positive side and a negative side; bistable switching means connected to the positive and negative sides of said voltage source, said switching means having first and second stable positions; a first lead selectively connected to the positive and negative sides of said voltage source; a second lead selectively coupled to the negative and positive sides of said voltage source; a first resistor connected between said second lead and said switching means; a third lead connected between said first resistor and said switching means; a second resistor connected in said third lead; and a three-state visual indicator and diode means connected in parallel with said first resistor, said visual indicator and diode means having first and second terminals and providing selective quality indications for the component being tested; said first and second leads being adapted to be connected to the leads of a two-lead device such as an LED, fuse, diode and two circuit leads for circuit continuity testing, the emitter and collector of a transistor, the two main terminals of a triac and the anode and cathode of a silicon controlled rectifier (SCR), to determine shorts and open circuits, said third lead being adapted to be connected to the base of the transistor, and the gate of the triac and the SCR, whereby said second resistor biases the transistor ON and latches the triac and the SCR; said switching means and said visual indicator and diode means being adapted to distinguish NPN and PNP transistors from each other and to determine state of latching ability of SCR's and triacs in either their positive or negative state by reversing the polarity of the applied voltage of said first and second leads and to said visual indicator and diode means, said switching means further changing the voltage polarity on said first and second leads to determine shorts, opens and conductive direction through various of the electronic components to be tested.

Claim 12

A method for testing electronic components with a tester capable of providing indications of simple circuit continuity and, in two- and three-terminal solid state components, of short and open conditions, transistor type, and latchability of SCR's and triacs, the tester comprising a DC voltage source having a positive side and a negative side, switching means connected to the positive negative sides of said voltage source, said switching means having first and second positions, a first lead selectively connected to the positive and negative sides of said voltage source, a second lead selectively coupled to the negative and positive sides of said voltage source, a first resistor connected between said second lead and said switching means, a third lead coupled between said first resistor and said switching means, a second resistor connected in said third lead, a three-state visual indicator and diode means connected in parallel with said first resistor, said visual indicator and diode means having first and second terminals, said method comprising the steps of: setting said switching means to said first position; connecting said first lead to one terminal of an electronic component to be tested; connecting said second lead to a second terminal of said component; observing visual indication means responses to provide information on electrical shorts within said component; when testing a three terminal component, connecting said third lead to the third terminal of said component thereby biasing said component ON through said second resistor; observing responses of said visual indication means to provide information as to quality of said component; and setting said switching means to said second position to determine type of component.

Claim 13

A method for testing electronic components with a tester capable of providing indications of simple circuit continuity and, in two- and three-terminal solid state components, of short and open conditions, transistor type, and latchability of SCR's and triacs, the tester comprising a DC voltage source having a positive side and a negative side, switching means connected to the positive negative sides of said voltage source, said switching means having first and second positions, a first lead selectively connected to the positive and negative sides of said voltage source, a second lead selectively coupled to the negative and positive sides of said voltage source, a first resistor connected between said second lead and said switching means, a third lead coupled between said first resistor and said switching means, a second resistor connected in said third lead, a three-state visual indicator and diode means connected in parallel with said first resistor, said visual indicator and diode means having first and second terminals, said method comprising the steps of: setting said switching means to said first position; connecting said first lead to one terminal of an electronic component to be tested; connecting said second lead to a second terminal of said component; observing visual indication means responses to provide information on electrical shorts within said component; when testing a three terminal component, connecting said third lead to the third terminal of said component thereby biasing said component ON through said second resistor; observing responses of said visual indication means to provide information as to quality of said component; and setting said switching means to said second position to determine type of component.