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US4911809A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin film deposition process

Assignee: GEC-MARONI Ltd
•
Filing: 1988-08-05
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Granted: 1990-03-27
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Expires: 2008-08-05
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Abstract

Abstract A thin film deposition process comprises the steps of providing a first target area on a magnetron electrode, sputtering particles from said area so that they fall onto a heated substrate body for forming the required deposit, simultaneously operating a sputtering gun such that further particles are dislodged from a second target area and directed towards the substrate, the two resulting particle plasmas mixing at the substrate surface such that a deposit of a predetermined chemical composition is produced. This allows a multicomponent material such as a PLZT ceramic to be deposited without a change in composition due to different volatilities etc. of the components.

Inventors

  • 👤 Christopher J. Wort
  • 👤 Lynn Y. Dorey

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 11:31
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/34; C23C14/35; C23C14/352; C23C14/3457

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 87 words
A thin film deposition process, the process comprising the steps of providing a first target area on a magnetron electrode, sputtering particles from said first target area so that they fall onto a heated substrate body for forming the required deposit, simultaneously operating a sputtering gun such that particles are dislodged from a second target area and directed towards the substrate, resulting in two particle plasmas, the two resulting particle plasmas mixing at the substrate surface such that a deposit of a predetermined chemical composition is produced.
Claim 2
Dependent Claim 87 words
A thin film deposition process, the process comprising the steps of providing a first target area on a magnetron electrode, sputtering particles from said first target area so that they fall onto a heated substrate body for forming the required deposit, simultaneously operating a sputtering gun such that particles are dislodged from a second target area and directed towards the substrate, resulting in two particle plasmas, the two resulting particle plasmas mixing at the substrate surface such that a deposit of a predetermined chemical composition is produced.
Claim 3
Dependent Claim 19 words
A process as claimed in claim 1, in which the said first target is of a ceramic PLZT material.
Claim 4
Dependent Claim 17 words
A process as claimed in claim 1, in which the said second target is a metal body.
Claim 5
Dependent Claim 25 words
A process as claimed in claim 3, in which the said metal body is formed with areas of two metals having a common dividing line.
Claim 6
Dependent Claim 143 words
Apparatus for a thin film deposition process, the apparatus comprising a vacuum chamber, means inside the chamber for supporting a substrate body and means for heating said body, a first deposition source and a target area in the chamber, the first deposition source being capable of providing a particle stream directed at the target area to dislodge material from the target area and direct said dislodged material in the form of a plasma cloud towards said substrate body, a second deposition source which is a magnetron electrode capable of forming a second particle plasma cloud adjacent said substrate body and mutually independent control means for each of the two deposition sources, the arrangement being such that a mixture of the two plasma clouds can be formed adjacent said body and a deposit of a predetermined chemical composition laid down on said substrate body.
Claim 7
Dependent Claim 143 words
Apparatus for a thin film deposition process, the apparatus comprising a vacuum chamber, means inside the chamber for supporting a substrate body and means for heating said body, a first deposition source and a target area in the chamber, the first deposition source being capable of providing a particle stream directed at the target area to dislodge material from the target area and direct said dislodged material in the form of a plasma cloud towards said substrate body, a second deposition source which is a magnetron electrode capable of forming a second particle plasma cloud adjacent said substrate body and mutually independent control means for each of the two deposition sources, the arrangement being such that a mixture of the two plasma clouds can be formed adjacent said body and a deposit of a predetermined chemical composition laid down on said substrate body.
Claim 8
Dependent Claim 19 words
Apparatus as claimed in claim 5, in which said first deposition source is a fast atomic beam sputtering gun.
Claim 9
Dependent Claim 17 words
Apparatus as claimed in claim 5, in which said first deposition source is an ion beam gun.
Claim 10
Dependent Claim 51 words
Apparatus as claimed in claim 5, in which said target area for the first deposition source is provided with discrete surface regions of differing chemical composition, means being provided to direct the particle stream towards one or more of said regions to permit variation in the composition of the dislodged material.
Claim 11
Dependent Claim 36 words
Apparatus as claimed in claim 5, in which said target area for the first deposition source is mounted on a support such that the angle through which the particle stream may be directed can be adjusted.

References Cited (Backward Citations)

US4731172A Cited
GB2180262A Cited
US4793908A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1993-03-26 1993-09-25 1994-03-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1997-03-26 1997-09-25 1998-03-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2001-03-26 2001-09-25 2002-03-27 $7700.00 Window Closed / Lapsed

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