US4904620A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing a semiconductor device including a titanium disilicide contact
Assignee: US Philips Corp
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Filing: 1988-04-04
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Granted: 1990-02-27
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Expires: 2008-04-04
Abstract
Abstract The invention relates to a method of manufacturing a semiconductor device, in which a titanium disilicide layer is formed on a substrate by means of a chemical reaction activated by a plasma from the gaseous phase. In a readily reproducible manner, this is achieved in that titanium silicide layers (2,4,6) having an atomic ratio of titanium to silicon of at least about 4:5 and silicon layers (3,5,7) are alternately deposited from the gaseous phase and these layers are homogenized in a heat treatment to a titanium disilicide layer.
Inventors
- 👤 Johannes E. J. Schmitz
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 13:10
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0112; Y; Y10; Y10S; Y10S148/00; Y10S148/147
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
80 words
A method of manufacturing a semiconductor device comprising the steps of: (a) forming alternate layers of equal numbers of titanium silicide and silicon on a substrate by a CVD technique, said layers of titanium silicide having an atomic ratio of titanium to silicon of about 4:5, wherein said alternate layers are deposited on said substrate alternately from a gaseous phase, and (b) subsequently heating said alternate layers of titanium silicide and layers of silicon to a homogenized titanium disilicide layer.
Claim 2
Independent Claim
80 words
A method of manufacturing a semiconductor device comprising the steps of: (a) forming alternate layers of equal numbers of titanium silicide and silicon on a substrate by a CVD technique, said layers of titanium silicide having an atomic ratio of titanium to silicon of about 4:5, wherein said alternate layers are deposited on said substrate alternately from a gaseous phase, and (b) subsequently heating said alternate layers of titanium silicide and layers of silicon to a homogenized titanium disilicide layer.
Claim 3
Dependent Claim
32 words
A method according to claim 1, wherein each layer of said layers of titanium silicide and each layer of said layers of silicon are formed with a layer thickness of 20 nm.
Claim 4
Dependent Claim
24 words
A method according to claim 1 or claim 2, wherein said homogenized layer of titanium disilicide is formed to a thickness of 800 nm.
Claim 5
Dependent Claim
26 words
A method according to claim 1 or claim 2, wherein said titanium silicide and silicon are alternatively deposited in an even number of about 40 layers.
Claim 6
Dependent Claim
43 words
A method according to claim 1 or claim 2, wherein for the entire deposited titanium silicide layers and silicon layers an average ratio of titanium to silicon of 1:2 is provided, and wherein said step (b) is carried out in a non-oxidizing atmosphere.
Claim 7
Dependent Claim
44 words
A method according to claim 1 or claim 2, wherein for the entire deposited titanium silicide layers and silicon layers an average ratio of titanium to silicon smaller than 1:2 is provided, and wherein said step (b) is carried out in an oxidizing atmosphere.
Claim 8
Dependent Claim
33 words
A method according to claim 1 or claim 2, wherein said layers of titanium silicide are deposited in said gaseous phase in a volume ratio of about 1:1 of titanium tetrachloride and silane.
Claim 9
Dependent Claim
42 words
A method according to claim 1 or claim 2, wherein said homogenized titanium disilicide layer is formed on said substrate, said substrate being polysilicon, and wherein a conductor pattern is provided in said homogenized titanium disilicide layer and said substrate of polysilicon.
Claim 10
Dependent Claim
102 words
A method according to claim 1 or claim 2, wherein said substrate is silicon oxide having openings, and wherein said homogenized titanium disilicide layer is formed over said silicon oxide, said openings being filled with depressions of said homogenized titanium disilicide, further comprising the steps of: (c) forming a photoresist layer on said homogenized titanium disilicide layer, (d) removing said photoresist layer except on said depressions of said homogenized titanium disilicide, (e) removing said homogenized titanium disilicide using said photoresist layer on said depressions as a mask, and (f) entirely removing said photoresist layer to maintain homogenized titanium disilicide in said openings.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-02-26 | 1993-08-28 | 1994-02-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-02-26 | 1997-08-28 | 1998-02-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-02-26 | 2001-08-28 | 2002-02-27 | $7700.00 | Window Closed / Lapsed |