US4900939A
Expired / Lapsed
US
⏱️ 0.0 years remaining
System for processing and conveying substrate
Assignee: Nikon Corp
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Filing: 1988-12-27
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Granted: 1990-02-13
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Expires: 2008-12-27
Abstract
Abstract A substrate processing system basically comprises a coater-developer apparatus, an exposure processing apparatus and a conveyance controlling apparatus. The coater-developer apparatus comprises a coater unit including a coater for applying photo-resist on the substrate, and a developer unit for developing the substrate. The exposure processing apparatus includes an exposing means, and an inspection means for inspecting the photo-resist pattern on the substrate. The conveyance controlling apparatus conveys or feeds the substrate through the coater unit, exposure processing apparatus and developer unit in order. The conveyance controlling apparatus includes means forming a first conveying path for conveying a wafer from a loader cassette to the exposure processing apparatus through the coater unit, means forming a second conveying path for conveying the wafer from the exposure processing apparatus to an unloader cassette through the developer unit, and auxiliary conveying means forming a third conveying path for directly conveying the wafer on the first conveying path to the exposure processing apparatus without through the coater unit or directly conveying the wafer on the second conveying path to the exposure processing apparatus without through the developer unit. The wafer is returned from the second conveying path to an inspection device in the exposure processing apparatus by means of the auxiliary conveying means, and a forming state of a resist pattern formed on the wafer is checked by the inspection device. Further, there is provided a main controller for determining an optimum forming condition for the resist pattern on the basis of the checked forming state and for properly controlling a processing condition of either coater-developer or exposing means to process the wafer in accordance with the determined optimum condition.
Inventors
- 👤 Masaaki Aoyama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 07:46
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70483; G03F7/70605; G03F7/70616; G03F7/16; G03F7/20; G03F7/26; G03F7/30; G03F7/3021; G03F7/3028; G03F7/70691; G03F7/70733; G03F7/7075; H; H10; H10P; H10P72/00; H10P72/50; H10P72/57
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
190 words
A substrate processing system, comprising: a resist processing apparatus including an applying unit for applying photoresist to a substrate and a developing unit for developing said substrate, which are arranged between a processing start position and a processing end position; an exposure processing apparatus including means for exposing said substrate and inspection means for inspecting physical condition of the photoresist applied to said substrate; means forming a first conveying path for conveying said substrate from said processing start position to said exposure processing apparatus through said applying unit; means forming a second conveying path for conveying said substrate from said exposure processing apparatus to said processing end position through said developing unit; means forming a bypass conveying path provided for conveying said substrate independently of said second conveying path, between a predetermined position on said second conveying path and said exposure processing apparatus; and control means for controlling said means forming the bypass conveying path and said inspection means in such a manner that said substrate is conveyed from said second conveying path to said exposure processing apparatus by said bypass conveying path and is inspected by said inspection means.
Claim 2
Dependent Claim
190 words
A substrate processing system, comprising: a resist processing apparatus including an applying unit for applying photoresist to a substrate and a developing unit for developing said substrate, which are arranged between a processing start position and a processing end position; an exposure processing apparatus including means for exposing said substrate and inspection means for inspecting physical condition of the photoresist applied to said substrate; means forming a first conveying path for conveying said substrate from said processing start position to said exposure processing apparatus through said applying unit; means forming a second conveying path for conveying said substrate from said exposure processing apparatus to said processing end position through said developing unit; means forming a bypass conveying path provided for conveying said substrate independently of said second conveying path, between a predetermined position on said second conveying path and said exposure processing apparatus; and control means for controlling said means forming the bypass conveying path and said inspection means in such a manner that said substrate is conveyed from said second conveying path to said exposure processing apparatus by said bypass conveying path and is inspected by said inspection means.
Claim 3
Dependent Claim
54 words
A substrate processing system according to claim 1, wherein said means forming the bypass conveying path connects a portion of said second conveying path positioned between said developing unit and said processing end position to said exposure processing apparatus, whereby said substrate passed through said developing unit is returned to said exposure processing apparatus.
Claim 4
Dependent Claim
48 words
A substrate processing system according to claim 1, wherein said control means includes means for determining a processing condition of at least one of said resist processing apparatus and said exposure processing apparatus, on the basis of said physical condition of the photoresist obtained from said inspection means.
Claim 5
Dependent Claim
54 words
A substrate processing system according to claim 1, wherein said control means further controls said means forming the bypass conveying path and said inspection means in such a manner that said substrate inspected by said inspection means is conveyed from said exposure processing apparatus onto said second conveying path by said bypass conveying path.
Claim 6
Dependent Claim
170 words
A substrate processing system, comprising: a resist processing apparatus including an applying unit for applying photoresist to a substrate and a developing unit for developing said substrate, which are arranged between a processing start position and a processing end position; an exposure processing apparatus for exposing said substrate; means forming a first conveying path for conveying said substrate from said processing start position to said exposure processing apparatus through said applying unit; means forming a second conveying path for conveying said substrate from said exposure processing apparatus to said processing end position through said developing unit; means forming a third conveying path provided for conveying said substrate independently of said first and second conveying paths, between a predetermined position on at least one of said first and second conveying paths and said exposure processing apparatus; and control means for controlling said means the forming third conveying path in such a manner that said substrate is conveyed from said predetermined position to said exposure processing apparatus by said third conveying path.
Claim 7
Dependent Claim
170 words
A substrate processing system, comprising: a resist processing apparatus including an applying unit for applying photoresist to a substrate and a developing unit for developing said substrate, which are arranged between a processing start position and a processing end position; an exposure processing apparatus for exposing said substrate; means forming a first conveying path for conveying said substrate from said processing start position to said exposure processing apparatus through said applying unit; means forming a second conveying path for conveying said substrate from said exposure processing apparatus to said processing end position through said developing unit; means forming a third conveying path provided for conveying said substrate independently of said first and second conveying paths, between a predetermined position on at least one of said first and second conveying paths and said exposure processing apparatus; and control means for controlling said means the forming third conveying path in such a manner that said substrate is conveyed from said predetermined position to said exposure processing apparatus by said third conveying path.
Claim 8
Dependent Claim
48 words
A substrate processing system according to claim 5, wherein said first and second conveying paths have path portions extending in the same direction, respectively, said path portions including said predetermined position, said third conveying path being positioned between said path portions of said first and second conveying paths.
Claim 9
Dependent Claim
50 words
A substrate processing system according to claim 6, wherein said means forming the third conveying path includes holding means for picking up said substrate to be conveyed to said exposure processing apparatus at said predetermined position and for bringing said substrate from said exposure processing apparatus to said predetermined position.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-02-12 | 1993-08-14 | 1994-02-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-02-12 | 1997-08-14 | 1998-02-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-02-12 | 2001-08-14 | 2002-02-13 | $7700.00 | Window Closed / Lapsed |