Electron detector for use in a gaseous environment

Claim 2

An improved environmental scanning electron microscope comprising: (a) means for generating and directing an electron beam towards a specimen; (b) means for detecting signals emanating from the surface of the specimen; said detecting means including a generally annular electrode assembly having an inner electron detector formed of a thin ring, an intermediate electron detector positioned radially outwardly of said inner electron detector and being formed of a first plurality of concentric arc segments, and an outer electron detector positioned radially outwardly of said intermediate electron detector and being formed of a second plurality of concentric arc segments, said first plurality of concentric arc segments being positioned generally normal to said second plurality of concentric arc segments to obtain a directional topography contrast, said inner, intermediate, and outer electron detectors being aligned along generally the same horizontal plane; and (c) means for separately biasing said inner, intermediate and outer electron detector initially at the same electrical potential.

Claim 3

The improved environmental scanning electron microscope of claim 1 wherein said inner electron detector is a wire having a wire thickness of approximately 50 to 100 microns.

Claim 4

The improved environmental scanning electron microscope as set forth in claim 1 wherein said inner electron detector is made from metal.

Claim 5

The improved environmental scanning electron microscope as set forth in claim 1 wherein said intermediate electron detector has an inner diameter of approximately 0.8 mm and an outer diameter of approximately 3 mm.

Claim 6

The improved environmental scanning electron microscope as set forth in claim 1 wherein said inner, intermediate, and outer electron detectors are initially biased at approximately 400 volts.

Claim 7

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam; (c) focusing means located within the vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting aperture, which maintains the specimen enveloped in gas at a pressure of approximately 1 to 25 Torr in registration with the pressure limiting aperture such that a surface of the sample may be exposed to a charged particle beam emitted from the charged particle beam source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen approximately 1 mm below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) first means for detecting signals emanating from the surface of the specimen; said first detecting means including a generally annular electrode assembly having an inner electron detector formed of a thin ring, and intermediate electron detector positioned radially outwardly of said inner electron detector and being formed of a first plurality of concentric are segments, and an outer electron detector positioned radially outwardly of said intermediate electron detector and being formed of a second plurality of concentric arc segments; said first plurality of concentric arc segments being positioned generally normal to said second plurality of concentric arc segments; said inner, intermediate, and outer electron detectors being aligned along generally the same horizontal plane; and (g) means for separately biasing said inner, intermediate and outer electron detectors initially at the same electrical potential.

Claim 8

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam; (c) focusing means located within the vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting aperture, which maintains the specimen enveloped in gas at a pressure of approximately 1 to 25 Torr in registration with the pressure limiting aperture such that a surface of the sample may be exposed to a charged particle beam emitted from the charged particle beam source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen approximately 1 mm below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) first means for detecting signals emanating from the surface of the specimen; said first detecting means including a generally annular electrode assembly having an inner electron detector formed of a thin ring, and intermediate electron detector positioned radially outwardly of said inner electron detector and being formed of a first plurality of concentric are segments, and an outer electron detector positioned radially outwardly of said intermediate electron detector and being formed of a second plurality of concentric arc segments; said first plurality of concentric arc segments being positioned generally normal to said second plurality of concentric arc segments; said inner, intermediate, and outer electron detectors being aligned along generally the same horizontal plane; and (g) means for separately biasing said inner, intermediate and outer electron detectors initially at the same electrical potential.

Claim 9

The improved environmental scanning electron microscope as set forth in claim 6 wherein said pressure limiting aperture is approximately 500 microns in diameter.

Claim 10

The improved environmental scanning electron microscope as set forth in claim 6 wherein said inner electron detector is a wire having a wire thickness of approximately 50 to 100 microns.

Claim 11

The improved environmental scanning electron microscope as set forth in claim 6 wherein said inner electron detector made of metal.

Claim 12

The improved environmental scanning electron microscope as set forth in claim 6 wherein said specimen chamber is enveloped in nitrogen.

Claim 13

The improved environmental scanning electron microscope as set forth in claim 6 wherein said intermediate electron detector has an inner diameter of approximately 0.8 mm and an outer diameter of approximately 3 mm.

Claim 14

The improved environmental scanning electron microscope as set forth in claim 6 wherein said pressure limiting aperture includes second means for detecting signals emanating from said specimen being formed integrally therewith.

Claim 15

The improved environmental scanning electron microscope as set forth in claim 12 wherein said second detecting means is initially biased at a predetermined electrical potential.

Claim 16

The improved environmental scanning electron microscope of claim 12 wherein said second detecting means is biased at varying electrical potentials.

Claim 17

The improved environmental scanning electron microscope as set forth in claim 6 and further including third means for detecting signals emanating from said specimen being positioned above said pressure limiting aperture within an aperture carrier.

Claim 18

The improved environmental scanning electron microscope as set forth in claim 15 wherein said third detector means is a thin annular ring formed preferably of metal.

Claim 19

The improved environmental scanning electron microscope as set forth in claim 15 wherein said third detecting means is biased at varying electrical potentials.

Claim 20

The improved environmental scanning electron microscope as set forth in claim 6 wherein said inner electron detector includes means for collecting predominantly amplified lower energy secondary electron signals.

Claim 21

The improved environmental scanning electron microscope as set forth in claim 6 wherein said intermediate electron detector includes means for collecting predominantly amplified higher energy backscattered related signals.

Claim 22

The improved environmental scanning electron microscope as set forth in claim 6 wherein said outer electron detector includes means for collecting predominantly amplified low angle reflected signals.

Claim 23

The improved environmental scanning electron microscope as set forth in claim 12 wherein said second detecting means includes means for collecting predominantly amplified low energy secondary electron signals.

Claim 24

The improved environmental scanning electron microscope as set forth in claim 15 wherein said third detector means includes means for collecting predominantly amplified high angle reflected signals.

Claim 25

An improved environmental scanning electron microscope comprising: (a) means for generating and directing an electron beam toward a specimen; and (b) means for detecting signals emanating from the surface of the specimen, said detection means including a generally annular electrode assembly having an inner electron detector formed of a thin ring and an outer electron detector positioned radially outwardly of said inner electron detector which is formed of a plurality of concentric arc segments which are biased at different electrical potentials.

Claim 26

An improved environmental scanning electron microscope comprising: (a) means for generating and directing an electron beam toward a specimen; and (b) means for detecting signals emanating from the surface of the specimen, said detection means including a generally annular electrode assembly having an inner electron detector formed of a thin ring and an outer electron detector positioned radially outwardly of said inner electron detector which is formed of a plurality of concentric arc segments which are biased at different electrical potentials.

Claim 29

The apparatus of claim 24 and further including means for separately biasing said inner, intermediate and outer electron detectors initially at the same electrical potential.

Claim 30

An improved environmental scanning electron microscope comprising: (a) a substantially cylindrical objective lens magnetic housing containing an axially disposed vacuum liner tube having a pressure limiting aperture and containing means for magnetically focusing the beam of electrons passing through said liner tube toward a specimen; (b) a specimen chamber positioned below said objective lens, said specimen chamber maintaining the specimen enveloped in gas in registration with the pressure limiting aperture such that a surface of the specimen may be exposed to the focused beam of electrons; (c) means for detecting signals emanating from the surface of the specimen, said detection means including: (1) a first electron detection formed integrally with said pressure limiting aperture; (2) a second electron detection positioned below said pressure limiting aperture formed of a thin ring; (3) third and fourth electron detectors positioned radially outwardly of said second electron detector and each formed as a plurality of concentric arc segments; and (4) a fifth electron detector positioned above said pressure limiting aperture.

Claim 31

An improved environmental scanning electron microscope comprising: (a) a substantially cylindrical objective lens magnetic housing containing an axially disposed vacuum liner tube having a pressure limiting aperture and containing means for magnetically focusing the beam of electrons passing through said liner tube toward a specimen; (b) a specimen chamber positioned below said objective lens, said specimen chamber maintaining the specimen enveloped in gas in registration with the pressure limiting aperture such that a surface of the specimen may be exposed to the focused beam of electrons; (c) means for detecting signals emanating from the surface of the specimen, said detection means including: (1) a first electron detection formed integrally with said pressure limiting aperture; (2) a second electron detection positioned below said pressure limiting aperture formed of a thin ring; (3) third and fourth electron detectors positioned radially outwardly of said second electron detector and each formed as a plurality of concentric arc segments; and (4) a fifth electron detector positioned above said pressure limiting aperture.

Claim 32

The improved environmental scanning electron microscope as set forth in claim 26 and further including means for separately biasing each electron detector initially at the same electrical potential.

Claim 33

The improved environmental scanning electron microscope as set forth in claim 27 and further including means for recording information detected by each said detector, said recording means including a separate current amplifier connected to each said detector to receive the current collected at each said detector.

Claim 34

The improved environmental scanning electron microscope as set forth in claim 27 and further including means for recording information detected by each said detector, said recording means including a single current amplifier connected to each said biasing means to receive separately the current collected at each said detector.

Claim 35

The improved environmental scanning electron microscope as set forth in claim 26 wherein said pressure limiting aperture is approximately 500 microns in diameter and said second detector has a wire thickness which is approximately 50 to 100 microns.

Claim 36

The improved environmental scanning electron microscope as set forth in claim 26 wherein said second detector is made of metal.

Claim 37

The improved environmental scanning electron microscope as set forth in claim 26 wherein said third detector has an inner diameter of approximately 0.8 mm and an outer diameter of approximately 3 mm.

Claim 38

The improved environmental scanning electron microscope as set forth in claim 26 wherein the concentric arc segments of said third and fourth electron detectors are positioned generally opposite to one another to obtain a directional topography contrast.

Claim 39

The improved environmental scanning electron microscope as set forth in claim 26 wherein said second electron detector includes means for collecting predominantly amplified secondary electron signals.

Claim 40

The improved environmental scanning electron microscope as set forth in claim 26 wherein said third electron detector includes means for collecting predominantly amplified higher energy backscattered related signals.

Claim 41

The improved environmental scanning electron microscope as set forth in claim 26 wherein said fourth electron detector includes means for collecting predominantly amplified related low angle reflected signals.

Claim 42

The improved environmental scanning electron microscope as set forth in claim 26 wherein said fifth electron detector includes means for collecting predominantly amplified high angle reflected signals.

Claim 43

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam through said pressure limiting aperture; (c) focusing means located within said vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting pressure which maintains the specimen, enveloped in gas, at a pressure of approximately 1 to 25 Torr in registration with said pressure limiting aperture such that a surface of the sample way be exposed to a charged particle beam emitted from said charged particle beam source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen approximately 1 to 20 mm below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) an electron detector means including a generally annular electrode assembly having an inner electron detector formed of a thin ring and an outer electron detector which is formed of a plurality of concentric arc segments and a pressure limiting aperture detector formed integrally with said pressure limiting aperture; (g) a control grid being biased at an electrical potential which is between the bias applied to said specimen mount and said electron detector means so as to accelerate the signals emitted from the specimen towards said control grid for further amplification of secondary electrons.

Claim 44

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam through said pressure limiting aperture; (c) focusing means located within said vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting pressure which maintains the specimen, enveloped in gas, at a pressure of approximately 1 to 25 Torr in registration with said pressure limiting aperture such that a surface of the sample way be exposed to a charged particle beam emitted from said charged particle beam source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen approximately 1 to 20 mm below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) an electron detector means including a generally annular electrode assembly having an inner electron detector formed of a thin ring and an outer electron detector which is formed of a plurality of concentric arc segments and a pressure limiting aperture detector formed integrally with said pressure limiting aperture; (g) a control grid being biased at an electrical potential which is between the bias applied to said specimen mount and said electron detector means so as to accelerate the signals emitted from the specimen towards said control grid for further amplification of secondary electrons.

Claim 45

The environmental scanning electron microscope of claim 38 wherein said control grid is positioned closer to said specimen mount than to said electrode detector.

Claim 46

The improved environmental scanning electron microscope of claim 38 wherein said electrode detector is biased at approximately 300V+.

Claim 47

The improved environmental scanning electron microscope of claim 40 wherein said control grid is biased at 90V+.

Claim 48

The improved environmental scanning electron microscope of claim 41 wherein said specimen mount is biased at ground.

Claim 49

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam; (c) focusing means located within the vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting aperture, which maintains the specimen, enveloped in gas, at a pressure of approximately 1 to 25 Torr in registration with the pressure limiting aperture such that a surface of the sample may be exposed to a charged particle beam emitted from the charged particle source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) a generally annular electrode assembly having an inner electrode detector formed of a thin ring, an intermediate electron detector positioned radially outwardly of said inner electron detector and being formed of a first plurality of concentric arc segments, and an outer electron detector positioned radially outwardly of said intermediate electron detector and being formed of a second plurality of concentric arc segments; and (e) a control grid positioned between said specimen mount and said generally annular electrode assembly within said specimen chamber, said control grid being biased at an electrical potential greater than the bias applied to the specimen mount and less than the bias applied to said generally annular electrode assembly such that the electrons are accelerated from the specimen to said control grid to produce increased amplification.

Claim 50

An improved environmental scanning electron microscope comprising: (a) a vacuum column having a pressure limiting aperture at the lower end thereof; (b) a charged particle beam source located within the vacuum column which emits a charged particle beam; (c) focusing means located within the vacuum column which directs a charged particle beam emitted by said charged particle beam source through said pressure limiting aperture; (d) a specimen chamber, positioned below said pressure limiting aperture, which maintains the specimen, enveloped in gas, at a pressure of approximately 1 to 25 Torr in registration with the pressure limiting aperture such that a surface of the sample may be exposed to a charged particle beam emitted from the charged particle source and directed through said pressure limiting aperture; (e) a specimen mount located within said specimen chamber and positioned for supporting said specimen below said pressure limiting aperture so as to allow the focused beam of electrons to interact with said specimen; (f) a generally annular electrode assembly having an inner electrode detector formed of a thin ring, an intermediate electron detector positioned radially outwardly of said inner electron detector and being formed of a first plurality of concentric arc segments, and an outer electron detector positioned radially outwardly of said intermediate electron detector and being formed of a second plurality of concentric arc segments; and (e) a control grid positioned between said specimen mount and said generally annular electrode assembly within said specimen chamber, said control grid being biased at an electrical potential greater than the bias applied to the specimen mount and less than the bias applied to said generally annular electrode assembly such that the electrons are accelerated from the specimen to said control grid to produce increased amplification.

Claim 51

The improved environmental scanning electron microscope of claim 43 wherein said first plurality of concentric arc segments are positioned generally opposite to said second plurality of concentric arc segments.

Claim 52

The improved environmental scanning electron microscope of claim 43 wherein said inner, intermediate and outer electron detectors are aligned along generally the same horizontal plane.

Claim 53

The improved environmental scanning electron microscope of claim 43 wherein said generally annular electrode assembly is positioned approximately 10 mm above said specimen mount.

Claim 54

The improved environmental scanning electron microscope of claim 46 wherein said control grid is positioned approximately 1 mm from said specimen mount.

Claim 55

The improved environmental scanning electron microscope of claim 47 wherein said generally annular electrode assembly is biased at 300V+.

Claim 56

The improved environmental scanning electron microscope of claim 48 wherein said specimen mount is biased at ground.

Claim 57

The improved environmental scanning electron microscope of claim 49 wherein said control grid is biased at 90V+.