US4878996A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for reduction of filaments between electrodes
Assignee: Texas Instruments Inc
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Filing: 1989-01-23
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Granted: 1989-11-07
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Expires: 2009-01-23
Abstract
Abstract The disclosure relates to a method for reducing filament formation over the BN+ oxide in semiconductor devices wherein a sidewall oxide is formed on the side walls of the first polysilicon layer prior to subsequent formation of the intermediate insulating layer, formation of a second polysilicon layer and subsequent anisotropic etch to provide for removal of all polysilicon over the field oxide.
Inventors
- 👤 Allan T. Mitchell
- 👤 Howard L. Tigelaar
- 👤 Shaym G. Garg
- 👤 Kalipatnam V. Rao
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 04:22
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/40; H10P76/408; H10P76/4085; H10D; H10D64/00; H10D64/01; H10D64/031; H10D64/035
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
105 words
A method for fabricating an integrated circuit at a surface of a semiconductor body, comprising: forming a first polysilicon electrode layer over selected portions of said surface; forming an interlevel dielectric layer over said first electrode layer, said interlevel dielectric layer comprising a material which inhibits oxidation of silicon and extending over an edge of said first polysilicon electrode layer; forming a second electrode layer over said dielectric layer and overlying a portion of said first polysilicon electrode layer; removing said interlevel dielectric layer over an undesired portion of said first polysilicon electrode layer; and removing said undesired portion of said first polysilicon electrode layer.
Claim 2
Independent Claim
105 words
A method for fabricating an integrated circuit at a surface of a semiconductor body, comprising: forming a first polysilicon electrode layer over selected portions of said surface; forming an interlevel dielectric layer over said first electrode layer, said interlevel dielectric layer comprising a material which inhibits oxidation of silicon and extending over an edge of said first polysilicon electrode layer; forming a second electrode layer over said dielectric layer and overlying a portion of said first polysilicon electrode layer; removing said interlevel dielectric layer over an undesired portion of said first polysilicon electrode layer; and removing said undesired portion of said first polysilicon electrode layer.
Claim 3
Dependent Claim
21 words
The method of claim 1, wherein said step of forming said interlevel dielectric layer comprises: depositing a layer of silicon nitride.
Claim 4
Dependent Claim
33 words
The method of claim 2, wherein said step of forming said interlevel dielectric layer further comprises: depositing a layer of silicon oxide, prior to said step of depositing a layer of silicon nitride.
Claim 5
Dependent Claim
25 words
The method of claim 3, wherein said step of forming said interlevel dielectric layer further comprises: oxidizing a portion of said layer of silicon nitride.
Claim 6
Dependent Claim
30 words
The method of claim 1, wherein said step of forming a second electrode comprises: depositing a second polysilicon electrode layer; and removing selected portions of said second polysilicon electrode layer.
Claim 7
Dependent Claim
35 words
The method of claim 1, further comprising: forming a buried doped region; and forming an oxide layer overlying said buried doped region; wherein said first polysilicon electrode layer overlies a portion of said oxide layer.
Claim 8
Dependent Claim
96 words
The method of claim 1, further comprising: forming first and second buried doped regions; forming a first and a second oxide structure overlying said first and said second buried doped regions, respectively; and forming a gate dielectric over a portion of said surface lying between said first and second oxide structures; wherein a portion of said first polysilicon electrode layer remaining after said step of removing said undesired portion of said polysilicon electrode layer overlies said gate dielectric and extends from an edge of said first oxide structure to an edge of said second oxide structure.
Claim 9
Dependent Claim
15 words
The method of claim 7, wherein said step of forming said interlevel dielectric layer comprises:
Claim 10
Dependent Claim
6 words
depositing a layer of silicon nitride.
Claim 11
Dependent Claim
6 words
depositing a layer of silicon nitride.
Claim 12
Dependent Claim
33 words
The method of claim 8, wherein said step of forming said interlevel dielectric layer further comprises: depositing a layer of silicon oxide, prior to said step of depositing a layer of silicon nitride.
Claim 13
Dependent Claim
25 words
The method of claim 9, wherein said step of forming said interlevel dielectric layer further comprises: oxidizing a portion of said layer of silicon nitride.
Claim 14
Dependent Claim
41 words
The method of claim 1, further comprising: after said step of forming a first polysilicon electrode layer, and prior to said step of forming an interlevel dielectric layer, forming sidewall dielectric structures adjacent the edges of said first polysilicon electrode layer.
References Cited (Backward Citations)
US4749443A
Cited
US4806201A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-11-06 | 1993-05-08 | 1993-11-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-11-06 | 1997-05-08 | 1997-11-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-11-06 | 2001-05-08 | 2001-11-07 | $7700.00 | Window Closed / Lapsed |