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US4874476A Expired / Lapsed US ⏱️ 0.0 years remaining

Fixture for plating tall contact bumps on integrated circuit

Assignee: Texas Instruments Inc
•
Filing: 1988-10-05
•
Granted: 1989-10-17
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Expires: 2008-10-05
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Abstract

Abstract A method of plating bumps on metallization on the face of a wafer, including the steps of placing the wafer in a transportable fixture wherein cathode needles press against the face of the wafer to make electrical contact and to force the back side of the wafer against a sealing member to prevent the plating bath from contacting the back side. The fixture with the wafer therein is placed in a clean up or presoak bath and is then transported to a plating bath without an operator having to touch the wafer.

Inventors

  • 👤 Roger J. Stierman
  • 👤 Archie N. McCauley
  • 👤 Robert C. Zart

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 15:29
CPC Classifications
C; C25; C25D; C25D17/00; C25D17/06; C25D7/00; C25D7/12; C25D7/123

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 148 words
A method of plating bumps on metallization on the face of a wafer, comprising the steps of: placing the wafer face up on sealing means in a bump-plating fixture so that the back of the wafer abuts the sealing means and the wafer is disposed below an anode means in the fixture: placing force means against the metallization on the face of the wafer to effect electrical connection of the force means with the metallization: whereby said force means causes the back of the wafer to press against the sealing means to form a high integrity seal to prevent the plating bath from coming into contact with the back of the wafer: inserting the fixture with the wafer into a clean up or presoak bath: removing the fixture and wafer from the clean up or presoak bath; and inserting the fixture with the wafer into the plating bath.
Claim 2
Independent Claim 148 words
A method of plating bumps on metallization on the face of a wafer, comprising the steps of: placing the wafer face up on sealing means in a bump-plating fixture so that the back of the wafer abuts the sealing means and the wafer is disposed below an anode means in the fixture: placing force means against the metallization on the face of the wafer to effect electrical connection of the force means with the metallization: whereby said force means causes the back of the wafer to press against the sealing means to form a high integrity seal to prevent the plating bath from coming into contact with the back of the wafer: inserting the fixture with the wafer into a clean up or presoak bath: removing the fixture and wafer from the clean up or presoak bath; and inserting the fixture with the wafer into the plating bath.
Claim 3
Dependent Claim 48 words
The method of claim 1 wherein the step of inserting the bump plating fixture with the wafer into the plating bath is carried out with the limitation that the fixture is inserted into the plating bath only far enough as is necessary to just cover the anode means.
Claim 4
Dependent Claim 39 words
The method of claim 1 further comprising the steps of: electrically connecting the anode means to the positive terminal of a plating power supply; and electrically connecting the force means to the negative terminal of the plating power supply.

References Cited (Backward Citations)

US2362228A Cited
US3536594A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-10-16 1993-04-17 1993-10-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-10-16 1997-04-17 1997-10-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-10-16 2001-04-17 2001-10-17 $7700.00 Window Closed / Lapsed

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