Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
180 words
An information recording thin film capable of changing an atomic configuration upon exposure to a recording beam, formed on a substrate directly or through a protective layer composed of at least one of inorganic materials and organic materials, an average composition in the film thickness direction of the information-recording thin film being represented by the following general formula: A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β F.sub.γ wherein X, Y, Z, α, β and γ are in ranges of 0≦X+β<20, 1≦Y≦30, 25≦Z+γ≦60, 25≦Z≦60 and 35≦α≦70 in atomic percentage, F is at least one element of As, Sb, Si, and Ge; E is at least one element of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Co, Rh, Ni, and Pd; D is at least one element of Se and S; C is at least one element of Sn, Pb, Bi, Zn, Cd, Ga and In; B is at least one element of Tl, halogen elements and alkali metal elements; and A is at least one of other elements than those represented by B, C, D, E and F.
Claim 2
Dependent Claim
180 words
An information recording thin film capable of changing an atomic configuration upon exposure to a recording beam, formed on a substrate directly or through a protective layer composed of at least one of inorganic materials and organic materials, an average composition in the film thickness direction of the information-recording thin film being represented by the following general formula: A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β F.sub.γ wherein X, Y, Z, α, β and γ are in ranges of 0≦X+β<20, 1≦Y≦30, 25≦Z+γ≦60, 25≦Z≦60 and 35≦α≦70 in atomic percentage, F is at least one element of As, Sb, Si, and Ge; E is at least one element of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Co, Rh, Ni, and Pd; D is at least one element of Se and S; C is at least one element of Sn, Pb, Bi, Zn, Cd, Ga and In; B is at least one element of Tl, halogen elements and alkali metal elements; and A is at least one of other elements than those represented by B, C, D, E and F.
Claim 3
Dependent Claim
20 words
An information-recording thin film according to claim 1, wherein the element represented by D in the general formula is Se.
Claim 4
Dependent Claim
20 words
An information-recording thin film according to claim 1, wherein the element represented by C in the general formula is In.
Claim 5
Independent Claim
199 words
A method for recording and reproducing information which comprises a step of exposing to a recording beam an information-recording thin film provided on a substrate direction or through a protective layer, an average composition of the thin being represented by the general formula: A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β Fγ wherein X, Y, Z, α, β and γ are in ranges of 0≦X+β<20, 1≦Y≦30, 25≦Z+γ≦60, 25≦Z≦60 and 35≦α≦70 in atomic percentage, F is at least one element of As, Sb, Si, and Ge; E is at least one element of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Co, Rh, Ni, and Pd,; D is at least one element of Se and S; C is at lest one element of Sn, Pb, Bi, Zn, Cd, Ga and In; B is at least one element of Tl, halogen elements and alkali metal elements; and A is at least one of other elements than those represented by B, C, D, E and F, thereby changing the atomic configuration at the exposed part of the thin film, and a step of exposing a reproducing beam to the thin film, thereby reading out the change in the atomic configuration.
Claim 6
Independent Claim
199 words
A method for recording and reproducing information which comprises a step of exposing to a recording beam an information-recording thin film provided on a substrate direction or through a protective layer, an average composition of the thin being represented by the general formula: A.sub.X B.sub.Y C.sub.Z D.sub.α E.sub.β Fγ wherein X, Y, Z, α, β and γ are in ranges of 0≦X+β<20, 1≦Y≦30, 25≦Z+γ≦60, 25≦Z≦60 and 35≦α≦70 in atomic percentage, F is at least one element of As, Sb, Si, and Ge; E is at least one element of Cu, Ag, Au, Sc, Y, Ti, Zr, V, Nb, Cr, Mo, Mn, Fe, Co, Rh, Ni, and Pd,; D is at least one element of Se and S; C is at lest one element of Sn, Pb, Bi, Zn, Cd, Ga and In; B is at least one element of Tl, halogen elements and alkali metal elements; and A is at least one of other elements than those represented by B, C, D, E and F, thereby changing the atomic configuration at the exposed part of the thin film, and a step of exposing a reproducing beam to the thin film, thereby reading out the change in the atomic configuration.
Claim 7
Dependent Claim
14 words
A method according to claim 4, wherein the recording beam is a laser beam.
Claim 8
Dependent Claim
18 words
A method according to claim 4, wherein the element represented by D in the general formula is Se.