US4853343A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for fabricating a semiconductor integrated circuit device having thick oxide films and groove etch and refill
Assignee: Hitachi Ltd
•
Filing: 1988-03-18
•
Granted: 1989-08-01
•
Expires: 2008-03-18
Abstract
Abstract A semiconductor device employing a new isolation process is disclosed, wherein an isolation area is a region in which a burying material is buried in a deep groove formed in a semiconductor body with a substantially constant width by anisotropic dry etching, semiconductor elements are formed in selected ones of semiconductor regions isolated by the isolation area, and others of the semiconductor regions, with no semiconductor element formed therein, have their whole surface covered with a thick oxide film which is produced by the local oxidation of the semiconductor body. The new isolation process is well-suited for a bipolar type semiconductor device, wherein the deep groove is formed so as to reach a semiconductor substrate through an N + -type buried layer, and a thick oxide film formed simultaneously with the aforementioned thick oxide film isolates the base region and collector contact region of a bipolar transistor.
Inventors
- 👤 Akihisa Uchida
- 👤 Daisuke Okada
- 👤 Toshihiko Takakura
- 👤 Katsumi Ogiue
- 👤 Yoichi Tamaki
- 👤 Masao Kawamura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 16:41
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/012; H10W10/041; H10W10/10; H10W10/13; H10W10/17; H10W10/40; Y; Y10; Y10S; Y10S438/00; Y10S438/981
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
321 words
A method of manufacturing a semiconductor device comprising the steps of: (a) preparing a semiconductor body having a major surface; (b) selectively forming an oxidation impermeable mask on the major surface of said semiconductor body, said mask covering a first surface portion of each of a plurality of first semiconductor regions in which semiconductor elements are to be respectively formed and a second surface portion of a second semiconductor region which lies among said plurality of first semiconductor regions and in which an isolation region is to be formed, excepting at least a third surface portion of a third semiconductor region which is surrounded with said second semiconductor region to form said isolation region therein; (c) forming a thick oxide film on the third surface portion by thermal oxidation of the major surface of said semiconductor substrate by employing said oxidation impermeable mask to selectively provide said thick oxide film in said third surface portion; (d) removing said oxidation impermeable mask on said second surface portion; (e) forming a groove in said second surface portion of said major surface of said semiconductor body by employing as an etching mask said thick oxide film formed in said third surface portion and said oxidation impermeable mask covering said first surface portion, said groove extending with a substantially constant width and with a depth electrically isolating said major surface of said semiconductor body into said plurality of said first semiconductor regions; (f) filling said groove with a material so as to form an isolation structure; (g) forming the semiconductor elements in said first semiconductor regions, the major surface of said each first semiconductor region having a thin oxide film which is formed by thermal oxidation and which is thinner than said thick oxide film of said third surface portion; and (h) forming wiring layers on said thick oxide film of said third surface portion, said wiring layers being used for interconnecting said semiconductor elements.
Claim 2
Independent Claim
321 words
A method of manufacturing a semiconductor device comprising the steps of: (a) preparing a semiconductor body having a major surface; (b) selectively forming an oxidation impermeable mask on the major surface of said semiconductor body, said mask covering a first surface portion of each of a plurality of first semiconductor regions in which semiconductor elements are to be respectively formed and a second surface portion of a second semiconductor region which lies among said plurality of first semiconductor regions and in which an isolation region is to be formed, excepting at least a third surface portion of a third semiconductor region which is surrounded with said second semiconductor region to form said isolation region therein; (c) forming a thick oxide film on the third surface portion by thermal oxidation of the major surface of said semiconductor substrate by employing said oxidation impermeable mask to selectively provide said thick oxide film in said third surface portion; (d) removing said oxidation impermeable mask on said second surface portion; (e) forming a groove in said second surface portion of said major surface of said semiconductor body by employing as an etching mask said thick oxide film formed in said third surface portion and said oxidation impermeable mask covering said first surface portion, said groove extending with a substantially constant width and with a depth electrically isolating said major surface of said semiconductor body into said plurality of said first semiconductor regions; (f) filling said groove with a material so as to form an isolation structure; (g) forming the semiconductor elements in said first semiconductor regions, the major surface of said each first semiconductor region having a thin oxide film which is formed by thermal oxidation and which is thinner than said thick oxide film of said third surface portion; and (h) forming wiring layers on said thick oxide film of said third surface portion, said wiring layers being used for interconnecting said semiconductor elements.
Claim 3
Dependent Claim
45 words
A method of manufactoring a semiconductor device according to claim 1, including, before the filling step, the step of oxidizing a surface of said semiconductor body inside said groove, thereby to form a film of an oxide of semiconductor material of the semiconductor body thereon.
Claim 4
Dependent Claim
21 words
A method of manufacturing a semiconductor device according to claim 2, wherein said material, for filling said groove, is silicon dioxide.
Claim 5
Dependent Claim
134 words
A method of manufacturing a semiconductor device according to claim 3, wherein said step of preparing said semiconductor body consists of the substep of forming an N-type buried region on a surface of a P-type semiconductor substrate, and the substep of forming an N-type epitaxial layer lower in impurity concentration than said buried region on the surface of said buried region; wherein said groove is formed so as to reach said semiconductor substrate; and wherein said step of forming said semiconductor elements includes the substep of forming an N-type collector contact region reaching said buried region in a part of said each first semiconductor region, the substep of forming a P-type base region in another part of said first semiconductor region, and the substep of forming an N-type emitter region within said base region.
Claim 6
Dependent Claim
84 words
A method of manufacturing a semiconductor device according to claim 4, wherein said oxidation impermeable mask is formed on the respective first surface portions except surface parts over regions to become regions between the collector contact regions and the base regions; and a thick oxide film is formed on regions between said collector contact regions and said base regions by thermal oxidation of said major surface of said semiconductor body simultaneously with the formation of the thick oxide film on said third surface portion.
Claim 7
Dependent Claim
18 words
A method of manufacturing a semiconductor device according to claim 2, wherein said burying material is polycrystalline silicon.
Claim 8
Dependent Claim
28 words
A method of manufacturing a semiconductor device according to claim 6, wherein the polycrystalline silicon is covered with an oxide film which is formed by thermal oxidation thereof.
Claim 9
Dependent Claim
134 words
A method of manufacturing a semiconductor device according to claim 7, wherein said step of preparing said semiconductor body consists of the substep of disposing an N-type buried region on a surface of a P-type semiconductor substrate, and the substep of disposing an N-type epitaxial layer lower in impurity concentration than said buried region on the surface of said buried region; wherein said groove is formed so as to reach said semiconductor substrate; and wherein said step of forming said semiconductor elements includes the substep of forming an N-type collector contact region reaching said buried region in a part of said each first semiconductor region, the substep of forming a P-type base region in another part of said first semiconductor region, and the substep of forming an N-type emitter region within said base region.
Claim 10
Dependent Claim
84 words
A method of manufacturing a semiconductor device according to claim 8, wherein said oxidation impermeable mask is formed on the respective first surface portions except surface parts over regions to become regions between the collector contact regions and the base regions; and a thick oxide film is formed on regions between said collector contact regions and said base regions by thermal oxidation of said major surface of said semiconductor body simultaneously with the formation of said thick oxide film of said third surface portion.
Claim 11
Dependent Claim
23 words
A method of manufacturing a semiconductor device according to claim 1, wherein said oxidation impermeable mask is made of a silicon nitride film.
Claim 12
Dependent Claim
54 words
A method of manufacturing a semiconductor device according to claim 10, wherein said silicon nitride film consists of silicon nitride films of a first level and a second level, the former of which is formed on said first surface portion and the latter of which is formed on at least said second surface portion.
Claim 13
Dependent Claim
40 words
A method of manufacturing a semiconductor device according to claim 11, wherein a film different in property from said silicon nitride film is disposed between said silicon nitride films of said first and second levels in order to isolate them.
Claim 14
Independent Claim
24 words
A method of manufacturing a semiconductor device according to any of claims 1 to 12, wherein said groove is formed by reactive ion etching.
Claim 15
Dependent Claim
22 words
A method of manufacturing a semiconductor device according to claim 2, wherein said material, for filling said groove, is a polyimide resin.
Claim 16
Dependent Claim
22 words
A method of manufacturing a semiconductor device according to claim 1, wherein said material, for filling said groove, is an insulating material.
Claim 17
Dependent Claim
37 words
A method of manufacturing a semiconductor device according to claim 1, wherein, before the step (e), the thick oxide films are etched to expose more of the semiconductor body, at the ends of the thick oxide films.
Claim 18
Dependent Claim
41 words
A method of manufacturing a semiconductor device according to claim 1, wherein the groove is filled by depositing the material at least to the depth of the groove and then removing excess deposited material to flatten the surface of the material.
Claim 19
Dependent Claim
19 words
A method of manufacturing a semiconductor device according to claim 17, wherein said removing is performed by isotropic etching.
Claim 20
Dependent Claim
27 words
A method of manufacturing a semiconductor device according to claim 17, wherein prior to said removing the material is coated with a layer of photoresist or spin-on-glass.
Claim 21
Dependent Claim
40 words
A method of manufacturing a semiconductor device according to claim 2, wherein said semiconductor body is formed of silicon, and said oxide film formed by oxidizing a surface of said semiconductor body inside said groove is a silicon dioxide film.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-07-31 | 1993-01-30 | 1993-08-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-07-31 | 1997-01-30 | 1997-08-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-07-31 | 2001-01-30 | 2001-08-01 | $7700.00 | Window Closed / Lapsed |