Two-dimensional compton profile imaging method

Claim 1

A device for determining a two dimensional Compton profile image of an examination plane which is divided into pixels comprising: a radiation source which generates monochromatic radiation at an energy which is attenuated essentially by Compton scattering in the examination plane; a diaphragm which forms a primary pencil beam of said monochromatic radiation from the source which passes through the examination plane; means which redirect the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions; first detector means disposed to measure the intensity of the primary beam which emerges from examination zone; second, energy resolving detector means disposed to measure the intensity, as a function of energy, of scattered radiation which emerges from the examination zone at a selected angle with respect to the primary beam; pulse amplitude analyzing means coupled to said second detector means; and arithmetic computing means coupled to the pulse amplitude analyzing means and the first detector means which iteratively determines the Compton profile of pixels corresponding to elemental areas in the examination zone from values measured by the first and second detector means by: reconstructing attenuation values for the primary beam in the pixels from the measurements of the intensity of the emerging primary beams; calculating, from the attenuation distribution and a known dependence of Compton scatter density upon quantum energy, the intensity of Compton scattered radiation for each beam path; and then calculating the difference between the measured intensity and the calculated intensity of Compton radiation for each beam path and determining correction factors for the Compton scatter density in the pixels therefrom.

Claim 2

A device for determining a two dimensional Compton profile image of an examination plane which is divided into pixels comprising: a radiation source which generates monochromatic radiation at an energy which is attenuated essentially by Compton scattering in the examination plane; a diaphragm which forms a primary pencil beam of said monochromatic radiation from the source which passes through the examination plane; means which redirect the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions; first detector means disposed to measure the intensity of the primary beam which emerges from examination zone; second, energy resolving detector means disposed to measure the intensity, as a function of energy, of scattered radiation which emerges from the examination zone at a selected angle with respect to the primary beam; pulse amplitude analyzing means coupled to said second detector means; and arithmetic computing means coupled to the pulse amplitude analyzing means and the first detector means which iteratively determines the Compton profile of pixels corresponding to elemental areas in the examination zone from values measured by the first and second detector means by: reconstructing attenuation values for the primary beam in the pixels from the measurements of the intensity of the emerging primary beams; calculating, from the attenuation distribution and a known dependence of Compton scatter density upon quantum energy, the intensity of Compton scattered radiation for each beam path; and then calculating the difference between the measured intensity and the calculated intensity of Compton radiation for each beam path and determining correction factors for the Compton scatter density in the pixels therefrom.

Claim 6

A method for two dimensional Compton profile imaging of an examination plane within an object, said examination zone being divided into pixels, comprising the steps of: directing a monochromatic primary pencil beam of radiation which has an energy chosen so that attenuation of the primary beam in the examination plane is caused essentially by Compton scattering through the examination plane; measuring the intensity of the primary beam which emerges after passing through the examination plane; measuring the intensity, as a function of wavelength, of scattered radiation which emerges from the examination plane at a predetermined angle with respect to the primary beam; redirecting the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions and repeating the measuring steps for each of said paths; reconstructing attenuation values for the primary beam in the pixels from the measurements of the intensity of the emerging primary beams; calculating, from the attenuation distribution and a known dependence of Compton scatter density upon quantum energy, the intensity of Compton scattered radiation for each beam path; and then calculating the difference between the measured intensity and the calculated intensity of Compton radiation for each beam path and determining correction factors for the Compton scatter density in the pixels therefrom.

Claim 7

A method for two dimensional Compton profile imaging of an examination plane within an object, said examination zone being divided into pixels, comprising the steps of: directing a monochromatic primary pencil beam of radiation which has an energy chosen so that attenuation of the primary beam in the examination plane is caused essentially by Compton scattering through the examination plane; measuring the intensity of the primary beam which emerges after passing through the examination plane; measuring the intensity, as a function of wavelength, of scattered radiation which emerges from the examination plane at a predetermined angle with respect to the primary beam; redirecting the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions and repeating the measuring steps for each of said paths; reconstructing attenuation values for the primary beam in the pixels from the measurements of the intensity of the emerging primary beams; calculating, from the attenuation distribution and a known dependence of Compton scatter density upon quantum energy, the intensity of Compton scattered radiation for each beam path; and then calculating the difference between the measured intensity and the calculated intensity of Compton radiation for each beam path and determining correction factors for the Compton scatter density in the pixels therefrom.

Claim 8

A device for determining a two dimensional Compton profile image of an examination plane which is divided into pixels comprising: a radiation source which generates monochromatic radiation at an energy which is attenuated essentially by Compton scattering in the examination plane; a diaphragm which forms a primary pencil beam of said monochromatic radiation from the source which passes through the examination plane; means which redirect the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions; first detector means disposed to measure the intensity of the primary beam which emerges from examination zone; second, energy resolving detector means disposed to measure the intensity, as a function of energy, of scattered radiation which emerges from the examination zone at a selected angle with respect to the primary beam; pulse amplitude analyzing means coupled to said second detector means; and arithmetic computing means coupled to the pulse amplitude analyzing means and the first detector means which iteratively determines the Compton profile of pixels corresponding to elemental areas in the examination zone from values measured by the first and second detector means.

Claim 9

A device for determining a two dimensional Compton profile image of an examination plane which is divided into pixels comprising: a radiation source which generates monochromatic radiation at an energy which is attenuated essentially by Compton scattering in the examination plane; a diaphragm which forms a primary pencil beam of said monochromatic radiation from the source which passes through the examination plane; means which redirect the primary beam so that it passes through the examination plane along a multitude of parallel beam paths in a multitude of directions; first detector means disposed to measure the intensity of the primary beam which emerges from examination zone; second, energy resolving detector means disposed to measure the intensity, as a function of energy, of scattered radiation which emerges from the examination zone at a selected angle with respect to the primary beam; pulse amplitude analyzing means coupled to said second detector means; and arithmetic computing means coupled to the pulse amplitude analyzing means and the first detector means which iteratively determines the Compton profile of pixels corresponding to elemental areas in the examination zone from values measured by the first and second detector means.