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US4843440A Expired / Lapsed US ⏱️ 0.0 years remaining

Microwave field effect transistor

Assignee: National Aeronautics and Space Administration
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Filing: 1984-11-29
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Granted: 1989-06-27
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Expires: 2004-11-29
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Abstract

Abstract Electrodes of a high power, microwave field effect transistor are substantially matched to external input and output networks. The field effect transistor includes a metal ground plane layer, a dielectric layer on the ground plane layer, a gallium arsenide active region on the dielectric layer, and substantially coplanar spaced source, gate and drain electrodes having active segments covering the active region. The active segment of the gate electrode is located between edges of the active segments of the source and drain electrodes. The gate and drain electrodes include inactive pads remote from the active segments thereof. The pads are connected directly to the input and output networks. The source electrode is connected to the ground plane layer. The space between the electrodes and the geometry of the electrodes establish parasitic shunt capacitances and series inductances that provide substantial matches between the input network and the gate electrode and between the output network and the drain electrode. Many of the devices are connected in parallel and share a common active region, so that each pair of adjacent devices shares the same source electrodes and each pair of adjacent devices shares the same drain electrodes. The gate electrodes for the parallel devices are formed by a continuous stripe that extends between adjacent devices and is connected at different points to the common gate pad.

Inventors

  • 👤 Ho-Chung Huang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 21:30
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/20; H10D64/23; H10D64/251; H10D64/257; H10D30/00; H10D30/80; H10D30/87; H10D64/27; H10D64/311; H10D64/411

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 96 words
A microwave field effect transistor formed in a semiconductor chip comprising: active and inactive semiconductor regions, planar source, gate and drain electrodes an said chip with predetermined geometry and spacing therebetween, each having active and inactive segments respectively connected to said active and inactive regions, impedance matching means including said predetermined geometry and spacing of said inactive segments of at least one of the electrodes for establishing predetermined parasitic shunt capacitances and series inductances to provide substantial impedance matching on said chip to a signal source and/or a load driving and driven by said transistor, respectively.
Claim 2
Dependent Claim 96 words
A microwave field effect transistor formed in a semiconductor chip comprising: active and inactive semiconductor regions, planar source, gate and drain electrodes an said chip with predetermined geometry and spacing therebetween, each having active and inactive segments respectively connected to said active and inactive regions, impedance matching means including said predetermined geometry and spacing of said inactive segments of at least one of the electrodes for establishing predetermined parasitic shunt capacitances and series inductances to provide substantial impedance matching on said chip to a signal source and/or a load driving and driven by said transistor, respectively.
Claim 3
Dependent Claim 40 words
The microwave field effect transistor of claim 1 wherein said impedance matching means includes a conductive pad as a portion of the inactive segment of the gate electrode, said pad being spaced from the active segment of the gate electrode.
Claim 4
Dependent Claim 45 words
The microwave field effect transistor of claim 1 wherein said impedance matching means includes a conductive pad as a portion of the inactive segment of either the source or drain electrode, said pad being spaced from said active segments of the source and drain electrodes.
Claim 5
Dependent Claim 41 words
The microwave field effect transistor of claim 1 wherein said impedance matching means includes the active segment of the gate electrode, a portion of the active segment being long and narrow with respect to the inactive segment of the gate electrode.
Claim 6
Dependent Claim 18 words
The microwave field effect transistor of claim 1 wherein said inactive semiconductor regions are comprised of intrinsic GaAs.
Claim 7
Dependent Claim 52 words
The microwave field effect transistor of claim 1 wherein said transistor is rigidly connectable, in a flip-chip configuration, to a dielectric pellet with a metallic electrode pattern thereof, said pellet and electrode pattern forming a transmission line for providing further impedance matching to a signal source and a load for said transistor.
Claim 8
Dependent Claim 21 words
The microwave field effect transistor of claim 11 wherein said transistor is comprised of a plurality of field effect transistor cells.
Claim 9
Dependent Claim 28 words
The microwave field effect transistor of claim 7 wherein said source, gate and drain electrodes are each comprised of a series of interdigitated fingers connected to said cells.
Claim 10
Dependent Claim 41 words
The microwave field effect transistor of claim 8 wherein at least one of said source, gate and drain electrodes includes at least one conductive pad, said at least one pad being less in number than the interdigitated fingers of said electrode.
Claim 11
Dependent Claim 24 words
The microwave field effect transistor of claim 1 wherein said impedance matching means provides an impedance with an order of magnitude of 20 ohms.
Claim 12
Dependent Claim 33 words
The microwave field effect transistor of claim 1 wherein said inactive segments of said electrodes are less than a wavelength of the frequency of a signal source to which the transistor is connectable.

References Cited (Backward Citations)

US4135168A Cited
US4183041A Cited
JPS5521184A Cited
JPS5591134A Cited
JPS55151370A Cited
US4380022A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-06-26 1992-12-26 1993-06-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-06-26 1996-12-26 1997-06-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-06-26 2000-12-26 2001-06-27 $7700.00 Window Closed / Lapsed

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