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US4838632A Expired / Lapsed US ⏱️ 0.0 years remaining

Two-dimensional beam scanner

Assignee: Lumisys Inc
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Filing: 1988-05-06
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Granted: 1989-06-13
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Expires: 2008-05-06
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Abstract

Abstract A beam scanning system having a beam reflecting element, such as a mirror, disposed in the path of an incident beam defining an optical axis, which is pivotable about two perpendicular axes so as to provide for scanning a reflected beam in two dimensions. A pivot axis is perpendicular to the optical axis and may be provided by a spindle supporting a galvanometer mirror. The second axis coincides with the optical axis and may be provided by a meter driven shaft attached to the mirror support which is rotatable about the optical axis. The reflecting element reflects the beam toward an image plane that is parallel to the incident beam so as to scan a sequence of parallel lines without pincushion errors. An optical f-θ correcting lens may be provided in the reflected beam path to correct for tangential spacing errors in the image plane.

Inventors

  • 👤 Bala S. Manian

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 18:48
CPC Classifications
G; G02; G02B; G02B26/00; G02B26/08; G02B26/10; H; H04; H04N; H04N1/00; H04N1/04; H04N1/113

Claims Analysis

Total Claims: 14
Claim 1
Independent Claim 84 words
A beam scanning system comprising: a beam source for emitting an incident beam along an axis, means in the path of said incident beam axis for reflecting said incident beam, means supporting said reflecting means for pivoting said reflecting means about a pivot axis, said pivot axis being perpendicular to said incident beam axis, and means for pivoting said reflecting means about a rotational axis coinciding with the incident beam axis, the reflected beam intercepting an image plane parallel to the incident beam axis.
Claim 2
Dependent Claim 84 words
A beam scanning system comprising: a beam source for emitting an incident beam along an axis, means in the path of said incident beam axis for reflecting said incident beam, means supporting said reflecting means for pivoting said reflecting means about a pivot axis, said pivot axis being perpendicular to said incident beam axis, and means for pivoting said reflecting means about a rotational axis coinciding with the incident beam axis, the reflected beam intercepting an image plane parallel to the incident beam axis.
Claim 3
Dependent Claim 15 words
The beam scanning system of claim 1 wherein said reflecting means is a planar mirror.
Claim 4
Dependent Claim 27 words
The beam scanning system of claim 1 wherein said means for pivoting said reflecting means about said pivot axis comprises means for sinusoidally oscillating said reflecting means.
Claim 5
Dependent Claim 30 words
The beam scanning system of claim 1 wherein said means for pivoting said reflecting means about said pivot axis comprises means for rotating said reflecting means at a known rate.
Claim 6
Dependent Claim 21 words
The beam scanning system of claim 1 further defined by an f-θ lens disposed in the path of the reflected beam.
Claim 7
Dependent Claim 116 words
A beam scanning system comprising, a galvanometer mirror in the path of an incident beam, said beam defining an incident beam axis and being reflected by said mirror, means for pivotally supporting said galvanometer mirror about a pivot axis perpendicular to said incident beam axis, said mirror capable of turning about the pivot axis, a rotatable shaft connected to said supporting means, said shaft having an axis of rotation coinciding with said incident beam axis, means communicating with said shaft for turning said shaft in equal angular steps, and an f-θ correcting lens in the path of the reflected beam, the reflected beam being directed toward an image plane lying parallel to said incident beam axis.
Claim 8
Dependent Claim 116 words
A beam scanning system comprising, a galvanometer mirror in the path of an incident beam, said beam defining an incident beam axis and being reflected by said mirror, means for pivotally supporting said galvanometer mirror about a pivot axis perpendicular to said incident beam axis, said mirror capable of turning about the pivot axis, a rotatable shaft connected to said supporting means, said shaft having an axis of rotation coinciding with said incident beam axis, means communicating with said shaft for turning said shaft in equal angular steps, and an f-θ correcting lens in the path of the reflected beam, the reflected beam being directed toward an image plane lying parallel to said incident beam axis.
Claim 9
Dependent Claim 16 words
The beam scanning system of claim 6 wherein said galvanometer mirror is a linearly scanning mirror.
Claim 10
Dependent Claim 16 words
The beam scanning system of claim 6 wherein said galvanometer mirror is a sinusoidally oscillating mirror.
Claim 11
Dependent Claim 59 words
The beam scanning system of claim 6 wherein said means for turning said shaft comprises a wheel connected to said shaft at a center of the wheel, a stepper motor for driving said wheel, and a belt connecting a shaft of said motor to an outside diameter of said wheel, said outer diameter being substantially larger than said shaft.
Claim 12
Independent Claim 91 words
A method of scanning a beam comprising, directing an incident beam defining an incident beam axis onto a reflecting element, the incident beam being reflected thereby, pivoting said reflecting element about a pivot axis perpendicular to said incident beam axis so as to sweep said reflected beam in a line across an image plane, stepping said reflecting element by known angular amounts about the incident beam axis so as to cause said beam to sweep additional lines across said image plane, said image plane lying parallel to said incident beam axis.
Claim 13
Independent Claim 91 words
A method of scanning a beam comprising, directing an incident beam defining an incident beam axis onto a reflecting element, the incident beam being reflected thereby, pivoting said reflecting element about a pivot axis perpendicular to said incident beam axis so as to sweep said reflected beam in a line across an image plane, stepping said reflecting element by known angular amounts about the incident beam axis so as to cause said beam to sweep additional lines across said image plane, said image plane lying parallel to said incident beam axis.
Claim 14
Dependent Claim 19 words
The method of claim 10 further defined by correcting the path of said reflected beam with an f-θ lens.

References Cited (Backward Citations)

US4256364A Cited
US4375063A Cited
US4505578A Cited
JPH108514A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-06-12 1992-12-12 1993-06-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-06-12 1996-12-12 1997-06-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-06-12 2000-12-12 2001-06-13 $7700.00 Window Closed / Lapsed

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