US4837444A
Expired / Lapsed
US
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Electron microscope
Assignee: Jeol Ltd
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Filing: 1988-05-17
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Granted: 1989-06-06
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Expires: 2008-05-17
Abstract
Abstract There is disclosed an electron microscope equipped with two specimen-positioning devices one of which includes a small specimen holder adapted for high-resolution observation. The other includes a large specimen holder adapted for special observation. The holders are interchangeably placed on the optical axis of the electron beam between upper and lower magnetic pole pieces.
Inventors
- 👤 Kimio Ohi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 20:25
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/20
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
128 words
An electron microscope having an, objective lens including upper and lower magnetic pole pieces and specimen-positioning devices each of which moves a specimen holder along a plane perpendicular to the optical axis of an electron beam and brings the specimen holder onto the optical axis between the pole pieces, said electron microscope comprising: a small specimen holder for, high-resolution observation; a large specimen holder for special observation; a first drive mechanism for moving the small specimen holder along said plane onto the optical axis; and a second drive mechanism for moving the large specimen holder along said plane from a direction different from the direction in which the small specimen holder is moved by the first drive mechanism, to bring the large specimen holder onto the optical axis.
Claim 2
Dependent Claim
128 words
An electron microscope having an, objective lens including upper and lower magnetic pole pieces and specimen-positioning devices each of which moves a specimen holder along a plane perpendicular to the optical axis of an electron beam and brings the specimen holder onto the optical axis between the pole pieces, said electron microscope comprising: a small specimen holder for, high-resolution observation; a large specimen holder for special observation; a first drive mechanism for moving the small specimen holder along said plane onto the optical axis; and a second drive mechanism for moving the large specimen holder along said plane from a direction different from the direction in which the small specimen holder is moved by the first drive mechanism, to bring the large specimen holder onto the optical axis.
Claim 3
Dependent Claim
24 words
The electron microscope of claim 1, wherein the two specimen holders are moved onto the optical axis from directions substantially perpendicular to each other.
Claim 4
Dependent Claim
22 words
The electron microscope of claim 1, wherein the two specimen holders are moved onto the optical axis from substantially diametrically opposite directions.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-06-05 | 1992-12-05 | 1993-06-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-05 | 1996-12-05 | 1997-06-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-06-05 | 2000-12-05 | 2001-06-06 | $7700.00 | Window Closed / Lapsed |