US4837435A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Tunneling scanning microscope having light source
Assignee: Hitachi High-Tech Analysis Corp
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Filing: 1988-06-24
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Granted: 1989-06-06
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Expires: 2008-06-24
Abstract
Abstract The tunneling scanning microscope which is provided with a light source to irradiate a sample with light, particularly with light having one wavelength. The apparatus is used for the investigation of the surface structure of materials which have very low conductivity but increase their conductivities under light irradiation. In particular, the apparatus selectively provides an atomic image of an element of a compound in response to a selected wavelength.
Inventors
- 👤 Toshihiko Sakuhara
- 👤 Fumiki Sakai
- 👤 Tetsuo Uchiyama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 07:55
CPC Classifications
G; G01; G01Q; G01Q60/00; G01Q60/10; G01Q60/16; G01Q10/00; G01Q10/02; G01Q10/04; G01Q10/06; G01Q30/00; G01Q30/04; Y; Y10; Y10S; Y10S977/00; Y10S977/84; Y10S977/849; Y10S977/86; Y10S977/861; Y10S977/868
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
102 words
A tunneling scanning microscope comprising: a probe having a fine conductive tip; means for positioning the tip of said probe sufficiently close to a sample surface to be investigated so that tunneling current flows; means for scanning across said sample surface with the tip of said probe; means for automatically controlling a distance between the tip of said probe and said sample surface during scanning in response to measured tunnel current; means for graphically displaying the spatial coordinates of said sample surface and producing an image of the configuration of said sample surface; and a light source for irradiating said sample surface.
Claim 2
Dependent Claim
102 words
A tunneling scanning microscope comprising: a probe having a fine conductive tip; means for positioning the tip of said probe sufficiently close to a sample surface to be investigated so that tunneling current flows; means for scanning across said sample surface with the tip of said probe; means for automatically controlling a distance between the tip of said probe and said sample surface during scanning in response to measured tunnel current; means for graphically displaying the spatial coordinates of said sample surface and producing an image of the configuration of said sample surface; and a light source for irradiating said sample surface.
Claim 3
Dependent Claim
24 words
A tunneling scanning microscope defined in claim 1, further comprising means for producing light having substantially a single wavelength for irradiating said sample surface.
References Cited (Backward Citations)
US4343993A
Cited
US4724318A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-06-05 | 1992-12-05 | 1993-06-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-05 | 1996-12-05 | 1997-06-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-06-05 | 2000-12-05 | 2001-06-06 | $7700.00 | Window Closed / Lapsed |