US4825284A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor resin package structure
Assignee: Hitachi Ltd
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Filing: 1986-12-10
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Granted: 1989-04-25
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Expires: 2006-12-10
Abstract
Abstract A semiconductor resin package structure formed according to the flip-chip connection method and permitting to cool the rear surface of semiconductor chips, comprising semiconductor chip and carrier substrate which is soldered on one surface thereof to electrodes of the semiconductor chip according to the flip-chip connection method, the gap between the semiconductor chip and the carrier substrate being filled with resin having a thermal expansion coefficient, which is approximately equal to that of used solder, the electrodes of the semiconductor chip being electrically connected with terminals on the other surface of the carrier substrate through the soldered portions and a through-hole conductor disposed on the carrier substrate, the thermal expansion coefficient of the carrier substrate being approximately equal to that of a multi-layer substrate, with which the substrate is connected by soldering with the terminals.
Inventors
- 👤 Tasao Soga
- 👤 Marahiro Goda
- 👤 Fumio Nakano
- 👤 Tadao Kushima
- 👤 Nobuyuki Ushifusa
- 👤 Fumiyuki Kobayashi
- 👤 Mamoru Sawahata
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 20:55
CPC Classifications
H; H10; H10W; H10W40/00; H10W40/70; H10W40/77; H10W40/772; H10W70/00; H10W70/60; H10W70/611; H10W70/62; H10W70/63; H10W70/635; H10W74/00; H10W74/01; H10W74/012; H10W74/10; H10W74/15; H10W90/00; H10W90/401; H10W70/65; H10W70/654; H10W70/655; H10W72/00; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/20; H10W72/251; H10W72/252; H10W72/851; H10W72/853; H10W72/856; H10W72/874; H10W72/877; H10W74/131; H10W74/142; H10W90/701; H10W90/721; H10W90/724; H10W90/731; H10W90/734; H10W90/736
Claims Analysis
Total Claims: 27
Claim 1
Independent Claim
207 words
A semiconductor resin package structure formed according to flip-chip connection method and permitting the rear surface of a semiconductor chip to be cooled, comprising: a semiconductor chip; and a carrier substrate which is solder on one surface thereof to electrodes of a front face of said semiconductor chip according to the flip-chip connection method wherein solder connections extend from the carrier substrate to electrodes on said semiconductor chip to form a gap between the carrier substrate and the semiconductor chip, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient which is equal to that of the solder forming the solder connections, the electrodes of said semiconductor chip being electrically connected with terminals on the other surface of said carrier substrate through the solders connections and at least one through-hole conductor disposed within said carrier substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of a multi-layer substrate, with which said carrier substrate is connected by soldering with said terminals; solder for connecting said carrier substrate with said multi-layer substrate having a melting point that is lower than the melting point of the solder for connecting said semiconductor chip with said carrier substrate.
Claim 2
Dependent Claim
207 words
A semiconductor resin package structure formed according to flip-chip connection method and permitting the rear surface of a semiconductor chip to be cooled, comprising: a semiconductor chip; and a carrier substrate which is solder on one surface thereof to electrodes of a front face of said semiconductor chip according to the flip-chip connection method wherein solder connections extend from the carrier substrate to electrodes on said semiconductor chip to form a gap between the carrier substrate and the semiconductor chip, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient which is equal to that of the solder forming the solder connections, the electrodes of said semiconductor chip being electrically connected with terminals on the other surface of said carrier substrate through the solders connections and at least one through-hole conductor disposed within said carrier substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of a multi-layer substrate, with which said carrier substrate is connected by soldering with said terminals; solder for connecting said carrier substrate with said multi-layer substrate having a melting point that is lower than the melting point of the solder for connecting said semiconductor chip with said carrier substrate.
Claim 3
Dependent Claim
34 words
A semiconductor resin package structure according to claim 1, wherein the bending rigidity of said carrier substrate is so great that the bending rigidity of said semiconductor chip can be neglected with respect thereto.
Claim 4
Dependent Claim
22 words
A semiconductor resin package structure according to claim 1, wherein said resin is epoxy resin containing quartz powder of 30-60 vol. %.
Claim 5
Dependent Claim
18 words
A semiconductor resin package structure according to claim 3, wherein said resin contains polybutadiene of 5-15 wt. %.
Claim 6
Dependent Claim
27 words
A semiconductor package structure according to claim 1, wherein inorganic filler is included in said resin to make thermal coefficient of said resin low as a whole.
Claim 7
Dependent Claim
15 words
A semiconductor package structure according to claim 7, wherein said inorganic filler is quartz powder.
Claim 8
Dependent Claim
22 words
A semiconductor package structure according to claim 1, wherein said resin covers the part below a rear surface of said semiconductor chip.
Claim 9
Dependent Claim
33 words
A semiconductor package structure according to claim 1 wherein a rear surface of said semiconductor chip is soldered with a heat conductive plate whose size is larger than that of said semiconductor chip.
Claim 10
Dependent Claim
33 words
A semiconductor package structure according to claim 1, wherein a rear surface of said semiconductor chip is adhered with a heat conductive plate whose size is larger than that of said semiconductor chip.
Claim 11
Dependent Claim
43 words
A semiconductor package structure according to claim 1, wherein said carrier substrate has function of matching terminal pitch of said semiconductor chip to terminal pitch of said multi-layer when the terminal pitch of said multi-layer is larger than that of said semiconductor chip.
Claim 12
Dependent Claim
185 words
A semiconductor resin package structure comprising: a semiconductor chip; and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method wherein solder connections extend from the carrier substrate to the electrodes of said semiconductor chip to form a gap between the carrier substrate and the semiconductor chip, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient which is equal to that of the solder forming the solder connections, the electrodes of said semiconductor chip being electrically connected with terminals of the other surface of said carrier substrate through the solder connections and at least one through-hole conductor disposed on said carrier substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of a multi-layer substrate, with said carrier substrate is connected by soldering with said terminals; solder for connecting said carrier substrate with said multi-layer substrate having a melting point that is lower than the melting point of the solder for connecting said semiconductor chip with said carrier substrate.
Claim 13
Dependent Claim
185 words
A semiconductor resin package structure comprising: a semiconductor chip; and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method wherein solder connections extend from the carrier substrate to the electrodes of said semiconductor chip to form a gap between the carrier substrate and the semiconductor chip, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient which is equal to that of the solder forming the solder connections, the electrodes of said semiconductor chip being electrically connected with terminals of the other surface of said carrier substrate through the solder connections and at least one through-hole conductor disposed on said carrier substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of a multi-layer substrate, with said carrier substrate is connected by soldering with said terminals; solder for connecting said carrier substrate with said multi-layer substrate having a melting point that is lower than the melting point of the solder for connecting said semiconductor chip with said carrier substrate.
Claim 14
Dependent Claim
183 words
A semiconductor mounting structure comprising: at least one semiconductor package structure formed according to flip-chip connection method and adopted to be cooled at the rear surface of semiconductor chip, each package including a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with terminals on the other surface of said carrier substrate through the solder portions and a through-hole conductor disposed on said carrier substrate; a multi-layer substrate who which said carrier substrate is connected by soldering with said terminals, with solder whose melting point is lower than the melting point of the solder for connecting said carrier substrate with said multi-layer substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of said carrier substrate; and means for cooling the rear side of the semiconductor chips.
Claim 15
Dependent Claim
183 words
A semiconductor mounting structure comprising: at least one semiconductor package structure formed according to flip-chip connection method and adopted to be cooled at the rear surface of semiconductor chip, each package including a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with terminals on the other surface of said carrier substrate through the solder portions and a through-hole conductor disposed on said carrier substrate; a multi-layer substrate who which said carrier substrate is connected by soldering with said terminals, with solder whose melting point is lower than the melting point of the solder for connecting said carrier substrate with said multi-layer substrate, the thermal expansion coefficient of said carrier substrate being approximately equal to that of said carrier substrate; and means for cooling the rear side of the semiconductor chips.
Claim 16
Dependent Claim
122 words
A semiconductor package structure formed according to flip-chip connection method and permitting to cool the rear surface of semiconductor chip, comprising: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder, the thermal expansion coefficient said carrier substrate being approximately equal to that of a multi-layer substrate, with which said carrier substrate is connected by inserting said pin leads therein.
Claim 17
Dependent Claim
122 words
A semiconductor package structure formed according to flip-chip connection method and permitting to cool the rear surface of semiconductor chip, comprising: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder, the thermal expansion coefficient said carrier substrate being approximately equal to that of a multi-layer substrate, with which said carrier substrate is connected by inserting said pin leads therein.
Claim 18
Dependent Claim
33 words
A semiconductor package structure according to claim 13, wherein said resin is adhered not only to the lower surface of said semiconductor chip but also to the side surface of said semiconductor chip.
Claim 19
Dependent Claim
24 words
A semiconductor package structure according to claim 13, wherein said resin covers the part around and below the rear surface of said semiconductor chip.
Claim 20
Dependent Claim
26 words
A semiconductor package structure according to claim 13, wherein inorganic filler is included in said resin to make thermal expansion of said resin as a whole.
Claim 21
Dependent Claim
15 words
A semiconductor package structure according to claim 13, wherein said inorganic filler is quartz powder.
Claim 22
Dependent Claim
141 words
A semiconductor package structure formed according to flip-chip connection method and adapted to be cooled at the rear surface of semiconductor chip, each package including a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder; a multi-layer substrate to which said carrier substrate is connected by inserting said pin leads therein, the thermal expansion coefficient of said carrier substrate being approximately equal to that of said carrier substrate; and means for cooling the rear side of the semiconductor chips.
Claim 23
Dependent Claim
141 words
A semiconductor package structure formed according to flip-chip connection method and adapted to be cooled at the rear surface of semiconductor chip, each package including a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the gap between said semiconductor chip and said carrier substrate being filled with resin having a thermal expansion coefficient, which is equal to that of used solder, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder; a multi-layer substrate to which said carrier substrate is connected by inserting said pin leads therein, the thermal expansion coefficient of said carrier substrate being approximately equal to that of said carrier substrate; and means for cooling the rear side of the semiconductor chips.
Claim 24
Dependent Claim
91 words
A semiconductor package structure formed according to flip-chip connection method and permitting to cool the rear surface of semiconductor chip, comprising: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder, the thermal expansion coefficient, which is equal to that of a multi-layer substrate, with which said carrier substrate is connected by inserting pin leads therein.
Claim 25
Dependent Claim
91 words
A semiconductor package structure formed according to flip-chip connection method and permitting to cool the rear surface of semiconductor chip, comprising: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder, the thermal expansion coefficient, which is equal to that of a multi-layer substrate, with which said carrier substrate is connected by inserting pin leads therein.
Claim 26
Dependent Claim
116 words
A semiconductor mounting structure comprising: at least one semiconductor package structure formed according to flip-chip connection method and adapted to be cooled at the rear surface of semiconductor chip, each package including: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder; a multi-layer substrate to which said carrier substrate is connected by inserting pin leads therein, the thermal expansion coefficient, which is equal to that of a multi-layer substrate; and means for cooling the rear side of the semiconductor chip.
Claim 27
Dependent Claim
116 words
A semiconductor mounting structure comprising: at least one semiconductor package structure formed according to flip-chip connection method and adapted to be cooled at the rear surface of semiconductor chip, each package including: a semiconductor chip, and a carrier substrate which is soldered on one surface thereof to electrodes of said semiconductor chip according to the flip-chip connection method, the electrodes of said semiconductor chip being electrically connected with pin leads provided in said carrier substrate by solder; a multi-layer substrate to which said carrier substrate is connected by inserting pin leads therein, the thermal expansion coefficient, which is equal to that of a multi-layer substrate; and means for cooling the rear side of the semiconductor chip.
References Cited (Backward Citations)
JPS59996A
Cited
JPS5931046A
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JPS6063951A
Cited
US4667220A
Cited
JPS60257156A
Cited
US4604644A
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-04-24 | 1992-10-24 | 1993-04-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-04-24 | 1996-10-24 | 1997-04-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-04-24 | 2000-10-24 | 2001-04-25 | $7700.00 | Window Closed / Lapsed |