Reflection density measuring system

Claim 2

A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second of photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h 1 and h 2 , the angles θ which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ1 and θ2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r 1 and r 2 , the first photodetector is disposed so that h 1 is smaller than value h 10 which is the value of h at which output I 1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I 1 with the distance h when the distance h is varied under the combination of r 1 and θ 1 , and the second photodetector is disposed so that h 2 is larger than value h 20 which is the value of h at which output I 2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I 2 with the distance h when the distance h is varied under the combination of r 2 and θ 2 , the reflection density of the surface-to-be-measured being determined on the basis of the sum of the outputs of the photosensors.

Claim 3

A reflection density measuring system as defined in claim 1 in which each of said photodetectors solely consists of a photosensor and said light inlet side element is the photosensor itself.

Claim 4

A reflection density measuring system as defined in claim 1 in which each of said photodetectors comprises a photosensor and a lens disposed in front of the photosensor and said light inlet side element is the lens.

Claim 5

A reflection density measuring system as defined in claim 1 in which each of said photodetector comprises a photosensor and an optical stop disposed in front of the photosensor and said light inlet side element is the optical stop.

Claim 6

A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h 1 and h 2 , the angles θ which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ1 and θ2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r 1 and r 2 , the first photodetector is disposed so that h 1 is smaller than value h 10 which is the value of h at which output I 1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I 1 with the distance h when the distance h is varied under the combination of r 1 and θ 1 , and the second photodetector is disposed so that h 2 is larger than value h 20 which is the value of h at which output I 2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I 2 with the distance h when the distance h is varied under the combination of r 2 and θ 2 , the reflection density of the surface-to-be-measured being determined on the basis of the highest of the outputs of the photosensors.

Claim 7

A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h 1 and h 2 , the angles θ which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ1 and θ2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r 1 and r 2 , the first photodetector is disposed so that h 1 is smaller than value h 10 which is the value of h at which output I 1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I 1 with the distance h when the distance h is varied under the combination of r 1 and θ 1 , and the second photodetector is disposed so that h 2 is larger than value h 20 which is the value of h at which output I 2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I 2 with the distance h when the distance h is varied under the combination of r 2 and θ 2 , the reflection density of the surface-to-be-measured being determined on the basis of the highest of the outputs of the photosensors.

Claim 8

A reflection density measuring system as defined in claim 5 in which each of said photodetectors solely consists of a photosensor and said light inlet side element is the photosensor itself.

Claim 9

A reflection density measuring system as defined in claim 5 in which each of said photodetectors comprises a photosensor and a lens disposed in front of the photosensor and said light inlet side element is the lens.

Claim 10

A reflection density measuring system as defined in claim 5 in which each of said photodetector comprises a photosensor and an optical stop disposed in front of the photosensor and said light inlet side element is the optical stop.

Claim 11

A reflection density measuring system comprising means for projecting an irradiation light onto a surface-to-be-measured of a sample at at least first and second photodetectors each of which as a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h 1 and h 2 , the angles θ which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ1 and θ2, and the distances r between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r 1 and r 2 , the first photodetector is disposed so that h 1 is smaller than a value h 10 which is the value of h at which output I 1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I 1 with the distance h when the distance h is varied under the combination of r 1 and θ1, and the second photodetector is disposed so that h 2 is larger than value h 20 which is the value of h at which output h 2 is larger than value h 20 which is the value of h at which output I 2 of the photosensor of the second photodector takes a peak value on an output curve representing the change of the output I 2 with the distance h when the distance h is varied under the combination of r 2 and θ2, the reflection density of the surface-to-be-measured being determined on the basis of a combination of the outputs of the photosensors.

Claim 12

A reflection density measuring system comprising means for projecting an irradiation light onto a surface-to-be-measured of a sample at at least first and second photodetectors each of which as a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h 1 and h 2 , the angles θ which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ1 and θ2, and the distances r between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r 1 and r 2 , the first photodetector is disposed so that h 1 is smaller than a value h 10 which is the value of h at which output I 1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I 1 with the distance h when the distance h is varied under the combination of r 1 and θ1, and the second photodetector is disposed so that h 2 is larger than value h 20 which is the value of h at which output h 2 is larger than value h 20 which is the value of h at which output I 2 of the photosensor of the second photodector takes a peak value on an output curve representing the change of the output I 2 with the distance h when the distance h is varied under the combination of r 2 and θ2, the reflection density of the surface-to-be-measured being determined on the basis of a combination of the outputs of the photosensors.