US4818334A
Expired / Lapsed
US
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Method of etching a layer including polysilicon
Assignee: General Electric Co
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Filing: 1988-03-15
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Granted: 1989-04-04
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Expires: 2008-03-15
Abstract
Abstract The present invention relates to a method of forming gate lines of polycrystalline silicon, polysilicon, which may have a layer of a metal silicide thereon. The gate lines are formed over islands of silicon on an insulating substrate with the islands being covered with a layer of silicon oxide. A polysilicon layer is coated over the silicon oxide layer on the silicon island and on the adjacent surface of the substrate. Resist masking strips are formed over the area of the polysilicon layer which are to form the gate lines. The exposed area of the polysilicon layer is first plasma etched in a gaseous mixture of nitrogen, chlorine and chloroform. The chlorine etches the polysilicon and the chloroform forms a protective coating of a polymer over the side walls of the formed gate lines. The device is then subjected to a second plasma etch in a gaseous mixture of helium, chlorine and carbon dioxide. The chlorine etches away any polysilicon stringers which may extend between the gate lines along the side walls of the silicon island. The carbon dioxide provides oxygen to maintain the silicon oxide layer on the islands and carbon to maintain the polymer. Thus, any stringers which could short out the gate lines are removed without undercutting the gate lines and without removing the silicon oxide layer.
Inventors
- 👤 Stanley Shwartzman
- 👤 Michael F. Leahy
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 22:48
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268; H10D; H10D86/00; H10D86/01; H10D86/03
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
149 words
A method of plasma etching a layer which includes polycrystalline silicon and which extends over an island of silicon on a substrate, said method comprising the steps of: (a) covering a portion of said layer with a masking layer; (b) subjecting the exposed portion of the layer to a gaseous mixture of nitrogen, chlorine and chloroform while passing a current through the gas to create a plasma so as to etch away the exposed portion of the layer and coat the exposed walls of the remaining portion of the layer with a thin polymer layer; and then (c) subjecting the polycrystalline layer to a gaseous mixture of an inert gas, chlorine and a gas containing oxygen and carbon while passing a current through the gas to create a plasma so as to etch away any stringers of the layer which may remain on the side walls of the island.
Claim 2
Independent Claim
149 words
A method of plasma etching a layer which includes polycrystalline silicon and which extends over an island of silicon on a substrate, said method comprising the steps of: (a) covering a portion of said layer with a masking layer; (b) subjecting the exposed portion of the layer to a gaseous mixture of nitrogen, chlorine and chloroform while passing a current through the gas to create a plasma so as to etch away the exposed portion of the layer and coat the exposed walls of the remaining portion of the layer with a thin polymer layer; and then (c) subjecting the polycrystalline layer to a gaseous mixture of an inert gas, chlorine and a gas containing oxygen and carbon while passing a current through the gas to create a plasma so as to etch away any stringers of the layer which may remain on the side walls of the island.
Claim 3
Dependent Claim
35 words
A method in accordance with claim 1 wherein in step (b) the gases are present in the amount of by volume of 1 part of nitrogen, 2 parts of chlorine and 1 part of chloroform.
Claim 4
Dependent Claim
42 words
A method in accordance with claim 2 in which in step (c) the gases are present in the amount by volume of 1.5 parts of the inert gas, 4 parts of chlorine and 1 part of the gas containing oxygen and carbon.
Claim 5
Dependent Claim
24 words
A method in accordance with claim 3 in which the inert gas is helium and the gas containing oxygen and carbon is carbon dioxide.
Claim 6
Dependent Claim
59 words
A method in accordance with claim 4 in which the gases in step (b) are present in the amount of 10 sccm of nitrogen, 20 sccm of chlorine and 10 sccm of chloroform, and the gases in step (c) are present in the amount of 1.5 sccm of helium, 40 sccm of chlorine and 10 sccm of carbon dioxide.
Claim 7
Dependent Claim
41 words
A method in accordance with claim 5 in which in step (b) the gases are at a pressure of about 125 mtorr and a current at a power of about 500 watts is placed across the gases to create the plasma.
Claim 8
Dependent Claim
41 words
A method in accordance with claim 6 in which in step (c) the gases are at a pressure of about 100 mtorr and a current at a power of about 225 watts is placed across the gases to create the plasma.
Claim 9
Independent Claim
214 words
A method of forming on a semiconductor device gate lines of polycrystalline silicon over an island of single crystalline silicon on an insulating substrate and covered with a thin layer of silicon oxide comprising the steps of: (a) forming a layer of polycrystalline silicon over the silicon oxide layer and the adjacent area of the substrate surface; (b) forming masking strips over the areas of the polycrystalline silicon layer which are to form the gate lines; (c) subjecting the polycrystalline silicon layer to a first etch wherein the polycrystalline silicon layer is exposed to a gaseous mixture of nitrogen, chlorine and chloroform with a current placed across the gases to create a plasma to etch away the exposed area of the polycrystalline silicon layer to the silicon oxide layer and the surface of the substrate while applying a coating of a polymer on the side walls of the gate lines under the masking strips; and then (d) subjecting the device to a second etch of a gaseous mixture of an inert gas, chlorine and a gas containing oxygen and carbon with a current placed across the gases to create a plasma so as to etch away any stringers of the polycrystalline silicon extending along the side walls of the island between the gate lines.
Claim 10
Independent Claim
214 words
A method of forming on a semiconductor device gate lines of polycrystalline silicon over an island of single crystalline silicon on an insulating substrate and covered with a thin layer of silicon oxide comprising the steps of: (a) forming a layer of polycrystalline silicon over the silicon oxide layer and the adjacent area of the substrate surface; (b) forming masking strips over the areas of the polycrystalline silicon layer which are to form the gate lines; (c) subjecting the polycrystalline silicon layer to a first etch wherein the polycrystalline silicon layer is exposed to a gaseous mixture of nitrogen, chlorine and chloroform with a current placed across the gases to create a plasma to etch away the exposed area of the polycrystalline silicon layer to the silicon oxide layer and the surface of the substrate while applying a coating of a polymer on the side walls of the gate lines under the masking strips; and then (d) subjecting the device to a second etch of a gaseous mixture of an inert gas, chlorine and a gas containing oxygen and carbon with a current placed across the gases to create a plasma so as to etch away any stringers of the polycrystalline silicon extending along the side walls of the island between the gate lines.
Claim 11
Dependent Claim
34 words
A method in accordance with claim 8 wherein in step (c) the gases are present in the amount of by volume 1 part of nitrogen, 2 parts of chlorine and 1 part of chloroform.
Claim 12
Dependent Claim
42 words
A method in accordance with claim 9 in which in step (d) the gases are present in the amount by volume of 1.5 parts of the inert gas, 4 parts of chlorine and 1 part of the gas containing oxygen and carbon.
Claim 13
Dependent Claim
24 words
A method in accordance with claim 10 in which the inert gas is helium and the gas containing oxygen and carbon is carbon dioxide
Claim 14
Dependent Claim
59 words
A method in accordance with claim 11 in which the gases in step (c) are present in the amount of 10 sccm of nitrogen, 20 sccm of chlorine and 10 sccm of chloroform, and the gases in step (d) are present in the amount of 1.5 sccm of helium, 40 sccm of chlorine and 10 sccm of carbon dioxide.
Claim 15
Dependent Claim
41 words
A method in accordance with claim 12 in which in step (c) the gases are at a pressure of about 125 mtorr and a current at a power of about 500 watts is placed across the gases to create a plasma.
Claim 16
Dependent Claim
41 words
A method in accordance with claim 13 in which in step (d) the gases are at a pressure of about 100 mtorr and a current at a power of about 225 volts is placed across the gases to create a plasma.
Claim 17
Dependent Claim
23 words
A method in accordance with claim 14 including before step (b) applying a layer of a metal silicide over the polycrystalline silicon layer.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-04-03 | 1992-10-03 | 1993-04-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-04-03 | 1996-10-03 | 1997-04-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-04-03 | 2000-10-03 | 2001-04-04 | $7700.00 | Window Closed / Lapsed |