US4816767A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Vector network analyzer with integral processor
Assignee: Agilent Technologies Inc
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Filing: 1986-09-11
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Granted: 1989-03-28
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Expires: 2006-09-11
Abstract
Abstract An RF network analyzer is disclosed which is suitable for both laboratory and automated production measurements. An important feature of the invention is the ability of the user to completely specify the method of calibration to be used. In particular the user can select any three arbitrary RF standards having known electromagnetic response characteristics and can attach them in any arbitrary order to perform the calibration of the instrument. This calibration is carried out by measuring the RF scattering parameters S 11 , S 21 , S 12 , and S 22 , storing the data in a memory, and then calculating vector error correction coefficients that are characteristic of systematic errors introduced by the RF network analyzer into measured scattering parameters.
Inventors
- 👤 Wayne C. Cannon
- 👤 John T. Barr, IV
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 04:22
CPC Classifications
G; G01; G01R; G01R27/00; G01R27/28; G01R27/30; G01R23/00; G01R23/16; G01R35/00
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
157 words
A method of calibrating an RF network analyzer, comprising the steps of: selecting by a user of the network analyzer at least three calibrated RF standards having any known electromagnetic response characteristics; communicating to the RF network analyzer by the user the known electromagnetic response characteristics of the calibrated RF standards chosen; selecting by the user any arbitrary order for measuring the RF responses of said calibrated RF standards; measuring with the RF network analyzer RF scattering parameters S 11 , S 21 , S 12 , and S 22 of said calibrated RF standards in the order selected by the user; storing data in a memory in the RF network analyzer which corresponds to said measured RF scattering parameters of said calibrated RF standards; and calculating vector error correction coefficients which are characteristic of systematic errors introduced by the RF network analyzer, into measured scattering parameters including dc offset, attenuation, signal directivity, tracking, and source match.
Claim 2
Independent Claim
157 words
A method of calibrating an RF network analyzer, comprising the steps of: selecting by a user of the network analyzer at least three calibrated RF standards having any known electromagnetic response characteristics; communicating to the RF network analyzer by the user the known electromagnetic response characteristics of the calibrated RF standards chosen; selecting by the user any arbitrary order for measuring the RF responses of said calibrated RF standards; measuring with the RF network analyzer RF scattering parameters S 11 , S 21 , S 12 , and S 22 of said calibrated RF standards in the order selected by the user; storing data in a memory in the RF network analyzer which corresponds to said measured RF scattering parameters of said calibrated RF standards; and calculating vector error correction coefficients which are characteristic of systematic errors introduced by the RF network analyzer, into measured scattering parameters including dc offset, attenuation, signal directivity, tracking, and source match.
Claim 3
Dependent Claim
74 words
The method of claim 1 further comprising: measuring with the RF network analyzer RF scattering parameters S 11 , S 21 , S 12 , and S 22 of a device under test having unkown RF response characteristics; correcting the measured RF responses of the device under test for systematic errors introduced by the RF network analyzer into the measured RF scattering parameters of the device under test using said vector error correction coefficients.
Claim 4
Dependent Claim
63 words
The method of claim 1 where the selection of at least three calibrated RF standards is made from the group consisting of an open; a short; a load; an imperfect open having known capacitance and offset characteristics; an imperfect short having known offset characteristics; a plurality of offset shorts; and an offset having a known offset delay, offset loss, and offset characteristic impedance.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-03-27 | 1992-09-26 | 1993-03-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-03-27 | 1996-09-26 | 1997-03-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-03-27 | 2000-09-26 | 2001-03-28 | $7700.00 | Window Closed / Lapsed |