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US4814283A Expired / Lapsed US ⏱️ 0.0 years remaining

Simple automated discretionary bonding of multiple parallel elements

Assignee: Silicon Power Corp
•
Filing: 1988-04-08
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Granted: 1989-03-21
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Expires: 2008-04-08
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Abstract

Abstract A method for the discretionary interconnection of plural devices into an array includes the steps of designing bridge sites between the devices, individually testing the devices, inking over the bridge sites to devices which do not meet predetermined parameters, and soldering in a manner to cause the solder to bridge the gap between the acceptable devices and the rest of the array but not to bridge the gap to unacceptable devices. In devices comprised of multiple parallel elements, only sub-elements which fall within predetermined functional requirement ranges are incorporated into the parallel array produced. This method of discretionary interconnection is readily adapted to automated techniques for fabricating semiconductor MOS devices such as MCTs, IGBTs and parallel MOSFET arrays.

Inventors

  • 👤 Victor A. K. Temple
  • 👤 Stephen D. Arthur

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 14:10
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/491; H05; H05K; H05K1/00; H05K1/02; H05K1/0286; H05K1/0293; H10P; H10P74/00; H10P74/23; H10P74/232; H10W72/00; H05K1/0266; H05K1/0268; H05K2201/00; H05K2201/03; H05K2201/0302; H05K2201/0305; H05K2203/00; H05K2203/17; H05K2203/173; H05K3/00; H05K3/22; H05K3/28; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/49155; Y10T29/49156; Y10T29/49165; Y10T29/49167

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 145 words
A method for the discretionary interconnection of acceptable devices on a substrate which contains a plurality of devices, comprising the steps of: forming bridge sites for each device of said plurality, said bridge sites comprising closely spaced metal pads which electrically isolate each device of said plurality, said metal pads respectively being associated with each device, respectively, in said plurality; testing each device of said plurality so as to determine functionality of said each device in terms of predetermined operational parameters, thereby distinguishing acceptable devices from unacceptable devices; inking over said bridge sites of said unacceptable devices by coating said bridge sites with inking fluid to prevent solder wetting; and applying solder over said plurality of devices such that said bridge sites of said acceptable devices are electrically connected by solder bridging between said closely spaced metal pads while said unacceptable devices remain electrically isolated.
Claim 2
Independent Claim 145 words
A method for the discretionary interconnection of acceptable devices on a substrate which contains a plurality of devices, comprising the steps of: forming bridge sites for each device of said plurality, said bridge sites comprising closely spaced metal pads which electrically isolate each device of said plurality, said metal pads respectively being associated with each device, respectively, in said plurality; testing each device of said plurality so as to determine functionality of said each device in terms of predetermined operational parameters, thereby distinguishing acceptable devices from unacceptable devices; inking over said bridge sites of said unacceptable devices by coating said bridge sites with inking fluid to prevent solder wetting; and applying solder over said plurality of devices such that said bridge sites of said acceptable devices are electrically connected by solder bridging between said closely spaced metal pads while said unacceptable devices remain electrically isolated.
Claim 3
Dependent Claim 51 words
The method for the discretionary interconnection of acceptable devices on a substrate as recited in claim 1 wherein said forming of bridge sites is performed by optical lithography and wet etching of said metal pads in a preferred pattern such that said metal pads are closely spaced only in specific locations.
Claim 4
Dependent Claim 26 words
The method for the discretionary interconnection of acceptable devices on a substrate as recited in claim 2 wherein said inking fluid comprises a polyimide inking fluid.
Claim 5
Dependent Claim 60 words
The method for the discretionary interconnection of acceptable devices on a substrate as recited in claim 1 wherein said forming of bridge sites is performed by optical lithography and dry etching of a passivation layer which overcoats said closely spaced metal pads so as to open said passivation layer in specific locations to thereby expose said closely spaced metal pads.
Claim 6
Dependent Claim 26 words
The method for the discretionary interconnection of acceptable devices on a substrate as recited in claim 2 wherein said inking fluid comprises a polyimide inking fluid.
Claim 7
Independent Claim 213 words
A method for fabricating a metal-oxide semiconductor device on a substrate, said substrate having a metal gate electrode contact pad, a metal current electrode contact pad, and a plurality of metal contact pads respectively associated with each of plural parallel sub-elements, respectively, formed on a top surface of said substrate, said sub-elements being positioned between said gate electrode and said current electrode, comprising the steps of: forming bridge sites between each associated metal contact pad of each sub-element and said gate and current electrodes, said bridge sites comprising closely spaced metal portions, said sub-elements being electrically isolated from each other; testing each sub-element of said plural parallel sub-elements to determine the functionality of said each sub-element in terms of predetermined operational parameters and thereby distinguish acceptable sub-elements from unacceptable sub-elements; inking over said bridge sites between said unacceptable sub-elements and said gate electrode by coating said bridge sites between said unacceptable sub-elements and said gate electrode with inking fluid to prevent solder wetting; and applying solder over said metal contact pads of said plural parallel sub-elements such that said bridge sites between said metal contact pads of said acceptable sub-elements and said gate electrode are electrically connected by solder bridging between said closely approaching metal portions while said unacceptable sub-elements remain electrically isolated.
Claim 8
Independent Claim 213 words
A method for fabricating a metal-oxide semiconductor device on a substrate, said substrate having a metal gate electrode contact pad, a metal current electrode contact pad, and a plurality of metal contact pads respectively associated with each of plural parallel sub-elements, respectively, formed on a top surface of said substrate, said sub-elements being positioned between said gate electrode and said current electrode, comprising the steps of: forming bridge sites between each associated metal contact pad of each sub-element and said gate and current electrodes, said bridge sites comprising closely spaced metal portions, said sub-elements being electrically isolated from each other; testing each sub-element of said plural parallel sub-elements to determine the functionality of said each sub-element in terms of predetermined operational parameters and thereby distinguish acceptable sub-elements from unacceptable sub-elements; inking over said bridge sites between said unacceptable sub-elements and said gate electrode by coating said bridge sites between said unacceptable sub-elements and said gate electrode with inking fluid to prevent solder wetting; and applying solder over said metal contact pads of said plural parallel sub-elements such that said bridge sites between said metal contact pads of said acceptable sub-elements and said gate electrode are electrically connected by solder bridging between said closely approaching metal portions while said unacceptable sub-elements remain electrically isolated.
Claim 9
Dependent Claim 61 words
The method for fabricating a metal-oxide semiconductor device on a substrate as recited in claim 6 further comprising the step of inking over said bridge sites between said metal contact pads of said unacceptable sub-elements and said current electrode by coating said bridge sites between said unacceptable sub-elements and said current electrode with inking fluid so as to prevent solder wetting.
Claim 10
Dependent Claim 60 words
The method for fabricating a metal-oxide semiconductor device on a substrate as recited in claim 7 wherein said forming of bridge sites is performed by optical lithography and wet etching of said associated metal pads of said sub-elements in a preferred pattern such that said metal pads closely approach said gate electrode and said emitter electrode only in specific locations.
Claim 11
Dependent Claim 32 words
The method for fabricating a metal-oxide semiconductor device on a substrate as recited in claim 8 wherein said inking over said bridge sites comprises applying a coating of a polyimide inking fluid.
Claim 12
Dependent Claim 63 words
The method for fabricating a metal-oxide semiconductor device on a substrate as recited in claim 7 wherein said forming of bridge sites is performed by optical lithography and dry etching of a passivation layer overcoating said metal contact pads on said top surface of said substrate so as to open said passivation layer in specific locations to expose said closely spaced metal portions.
Claim 13
Dependent Claim 32 words
The method for fabricating a metal-oxide semiconductor device on a substrate as recited in claim 10 wherein said inking over said bridge sites comprises applying a coating of a polyimide inking fluid.

References Cited (Backward Citations)

US3702025A Cited
US4104785A Cited
US4075708A Cited
US4281398A Cited
US4549200A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1992-03-20 1992-09-19 1993-03-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1996-03-20 1996-09-19 1997-03-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2000-03-20 2000-09-19 2001-03-21 $7700.00 Window Closed / Lapsed

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