US4801875A
Expired / Lapsed
US
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Integrated circuit with frequency dividing test function
Assignee: Seiko Time Creation Inc
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Filing: 1987-03-04
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Granted: 1989-01-31
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Expires: 2007-03-04
Abstract
Abstract An integrated circuit with a frequency dividing test function includes a first frequency dividing circuit which divides a given frequency signal, a second frequency dividing circuit for dividing the output signal from the first frequency dividing circuit and a single terminal receptive of external test clock pulses. A test circuit is connected to the reset terminal for inhibiting the output signal from the first frequency dividing circuit when the external test clock pulses applied to the reset terminal have a higher frequency than the divided frequency of the first output signal and for applying the external clock pulses to the second frequency dividing circuit to test the second frequency dividing circuit.
Inventors
- 👤 Yuji Ige
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 21:34
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G04; G04D; G04D7/00; G04D7/12; G01R31/317; G01R31/31701; G04G; G04G3/00; G04G3/02
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
129 words
An integrated circuit with a frequency dividing test function, comprising: a first frequency dividing circuit which divides a given frequency signal and produces a first output signal at a divided frequency, a second frequency dividing circuit for dividing the output signal from said first frequency dividing circuit, a single terminal receptive of external test clock pulses, and a test circuit connected to the terminal including means for inhibiting the output signal from said first frequency dividing circuit to said second frequency dividing circuit in response to external test clock pulses applied to said terminal and having a higher frequency than the divided frequency of the first output signal and for simultaneously applying the external clock pulses to said second frequency dividing circuit to test said second frequency dividing circuit.
Claim 2
Dependent Claim
129 words
An integrated circuit with a frequency dividing test function, comprising: a first frequency dividing circuit which divides a given frequency signal and produces a first output signal at a divided frequency, a second frequency dividing circuit for dividing the output signal from said first frequency dividing circuit, a single terminal receptive of external test clock pulses, and a test circuit connected to the terminal including means for inhibiting the output signal from said first frequency dividing circuit to said second frequency dividing circuit in response to external test clock pulses applied to said terminal and having a higher frequency than the divided frequency of the first output signal and for simultaneously applying the external clock pulses to said second frequency dividing circuit to test said second frequency dividing circuit.
Claim 3
Dependent Claim
103 words
An integrated circuit with a frequency dividing test function, comprising: a first frequency dividing circuit which divides a given standard frequency signal and produces a first output signal at a divided frequency, a second frequency dividing circuit which divides the output signal from said first frequency dividing circuit, a reset terminal receptive of a reset signal, a reset and test circuit connected to the reset terminal including means receptive of a given voltage level or test clock pulses externally applied to said reset terminal for resetting said first frequency dividing cicuit and simultaneously supplying said external to test said second frequency dividing circuit.
Claim 4
Dependent Claim
103 words
An integrated circuit with a frequency dividing test function, comprising: a first frequency dividing circuit which divides a given standard frequency signal and produces a first output signal at a divided frequency, a second frequency dividing circuit which divides the output signal from said first frequency dividing circuit, a reset terminal receptive of a reset signal, a reset and test circuit connected to the reset terminal including means receptive of a given voltage level or test clock pulses externally applied to said reset terminal for resetting said first frequency dividing cicuit and simultaneously supplying said external to test said second frequency dividing circuit.
Claim 5
Dependent Claim
33 words
The circuit according to claim 4, wherein the reset and test circuit includes means for resetting the first dividing circuit in response to clock pulses having a higher frequency than the divided frequency.
References Cited (Backward Citations)
No citation records indexed.
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-01-31 | 1992-08-01 | 1993-01-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-01-31 | 1996-08-01 | 1997-01-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-01-31 | 2000-08-01 | 2001-01-31 | $7700.00 | Window Closed / Lapsed |