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US4795884A
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Method for in-situ restoration of plantinum resistance thermometer calibration
Assignee: United States Department of Energy
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Filing: 1987-10-23
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Granted: 1989-01-03
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Expires: 2007-10-23
Abstract
Abstract A method is provided for in-situ restoration of platinum resistance thermometers (PRT's) that have undergone surface oxide contamination and/or strain-related damage causing decalibration. The method, which may be automated using a programmed computer control arrangement, consists of applying a dc heating current to the resistive sensing element of the PRT of sufficient magnitude to heat the element to an annealing temperature and maintaining the temperature for a specified period to restore the element to a stress-free calibration condition. The process anneals the sensing element of the PRT without subjecting the entire PRT assembly to the annealing temperature and may be used in the periodic maintenance of installed PRT's.
Inventors
- 👤 Radford M. Carroll
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 17:01
CPC Classifications
G; G01; G01K; G01K7/00; G01K7/16; G01K7/18; G01K15/00
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
112 words
A method for the in situ restoration of a platinum resistance thermometer, which has become decalibrated due to oxide surface film formation and/or strain-related damage, to a stress-free calibration condition wherein said thermometer includes a platinum resistor sensing element whose resistance varies with the temperature of said element in accordance with a known relationship comprising the step of: passing a controlled dc current through said platinum resistor sensing element, said current having a magnitude sufficient to raise the temperature of said element to its oxide decomposition and annealing temperature and said current being maintained for a heating period sufficient to restore said element to an oxide free surface and stress-free calibration condition.
Claim 2
Independent Claim
112 words
A method for the in situ restoration of a platinum resistance thermometer, which has become decalibrated due to oxide surface film formation and/or strain-related damage, to a stress-free calibration condition wherein said thermometer includes a platinum resistor sensing element whose resistance varies with the temperature of said element in accordance with a known relationship comprising the step of: passing a controlled dc current through said platinum resistor sensing element, said current having a magnitude sufficient to raise the temperature of said element to its oxide decomposition and annealing temperature and said current being maintained for a heating period sufficient to restore said element to an oxide free surface and stress-free calibration condition.
Claim 3
Dependent Claim
101 words
The method as set forth in claim 1 wherein the step of passing a controlled dc current through said platinum resistor sensing element further includes the simultaneous steps of measuring said dc current passing through said element and the voltage drop across said element, calculating the resistance of said element from the current and voltage measurements of said current and voltage measuring steps as an indication of the temperature of said element and varying the current passing through said element to maintain a substantially constant resistance during said heating period, thereby maintaining a substantially constant annealing temperature during said heating period.
Claim 4
Dependent Claim
124 words
The method as set forth in claim 2 wherein said step of passing a controlled dc current through said platinum resistor sensing element further includes providing a variable voltage dc power supply connected to said sensing element to supply said dc current through said element, gradually increasing the voltage output of said power supply at a selected rate to gradually increase said current through said element until said element reaches said annealing temperature, controlling said voltage during said heating period to maintain said annealing temperature substantially constant and gradually reducing said voltage output of said power supply following said heating period at a selected rate to gradually decrease the temperature of said element to prevent thermal stressing of said element following said heating period.
Claim 5
Dependent Claim
29 words
The method as set forth in claim 3 wherein said annealing temperature is about 600° C. and said heating period is the range of from 10 to 20 minutes.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-01-03 | 1992-07-04 | 1993-01-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-01-03 | 1996-07-04 | 1997-01-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-01-03 | 2000-07-04 | 2001-01-03 | $7700.00 | Window Closed / Lapsed |