US4783625A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Wideband high impedance card mountable probe
Assignee: Tektronix Inc
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Filing: 1988-03-14
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Granted: 1988-11-08
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Expires: 2008-03-14
Abstract
Abstract An active electrical test probe with wideband frequency capability for use on a test probe card, along with other test probes. A small hybrid integrated circuit is mounted on a substrate held on edge, adjacent the probe tip contact element of the probe, by a conductive metal clip. The circuit is provided power from an external source. Signals received by the probe tip are transmitted, as modified by the hybrid integrated circuit, through an output cable to electronic test equipment.
Inventors
- 👤 Emory J. Harry
- 👤 Matthew J. Hadwin
- 👤 John D. Garcia
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 19:14
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06772
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
140 words
A high impedance wideband probe for an electronic test instrument comprising: (a) a rigid thin supporting substrate having an electrical circuit imprinted thereon for providing said probe with a high input impedance; (b) a probe card; (c) a clip mounted to said probe card, said clip including a flanged portion resting on said probe card and an upright support portion, said upright support portion extending at a right angle to said flanged portion for holding said substrate in a substantially vertical orientation relative to said probe card, wherein said flanged portion includes mounting lugs for attachment to said probe card; and (d) probe tip means, disposed at a forward end of said substrate, connected electrically to said circuit, for making electrical contact with the device under test and including a probe tip receptacle for receiving a selectively replaceable probe tip.
Claim 2
Dependent Claim
140 words
A high impedance wideband probe for an electronic test instrument comprising: (a) a rigid thin supporting substrate having an electrical circuit imprinted thereon for providing said probe with a high input impedance; (b) a probe card; (c) a clip mounted to said probe card, said clip including a flanged portion resting on said probe card and an upright support portion, said upright support portion extending at a right angle to said flanged portion for holding said substrate in a substantially vertical orientation relative to said probe card, wherein said flanged portion includes mounting lugs for attachment to said probe card; and (d) probe tip means, disposed at a forward end of said substrate, connected electrically to said circuit, for making electrical contact with the device under test and including a probe tip receptacle for receiving a selectively replaceable probe tip.
Claim 3
Dependent Claim
17 words
The probe of claim 1 wherein said circuit is a hybrid circuit mounted upon an alumina substrate.
Claim 4
Dependent Claim
29 words
The probe of claim 2 further including a housing disposed about at least a portion of said circuit for enabling said probe to be manipulated without touching said substrate.
Claim 5
Dependent Claim
24 words
The probe of claim 1 wherein said clip includes a ground lug for providing a low inductance path from said electrical circuit to ground.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-11-08 | 1992-05-09 | 1992-11-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-11-08 | 1996-05-09 | 1996-11-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-11-08 | 2000-05-09 | 2000-11-08 | $7700.00 | Window Closed / Lapsed |