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US4780875A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory with reduced size ECC circuit

Assignee: Hitachi Ltd
•
Filing: 1986-08-06
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Granted: 1988-10-25
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Expires: 2006-08-06
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Abstract

Abstract A semiconductor memory incorporating an ECC circuit includes a memory array, means for selecting a plurality of bits which are to be simultaneously output to the outside of the IC from a plurality of bits which are simultaneously read out from the memory array, and an error correcting circuit which constitutes the ECC circuit. The selecting means is provided in a stage previous to the error correcting circuit. In consequence, it is possible to reduce the number of bits of a signal which need to be simultaneously processed by the error correcting circuit. Accordingly, the size of the ECC circuit can be reduced.

Inventors

  • 👤 Kikuo Sakai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 20:13
CPC Classifications
G; G11; G11C; G11C17/00; G06; G06F; G06F11/00; G06F11/07; G06F11/08; G06F11/10; G06F11/1008; G06F11/1076

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 196 words
A semiconductor memory comprising: memory means for storing data; selecting means including means for receiving first memory data which is read out from said memory means and which is comprised of a pluarlity of sets of data each constituted by a plurality of bits, and means for selecting a predetermined bit from each of said plurality of sets of data to form second memory data comprised of a plurality of bits; and error correcting means for making error correction with respect to said second memory data, wherein said error correcting means performs said error correction on the basis of an output of a first detecting means for detecting any set of data in which an error is present among said plurality of sets of data, and on the basis of an output of second detecting means for detecting a possible error in said second memory data, wherein said first detecting means performs error detection on the basis of performing a logic operation on said first memory data and first parity bits, and said second detecting means performs error detection on the basis of performing a logic operation on said second memory data and second parity bits.
Claim 2
Dependent Claim 196 words
A semiconductor memory comprising: memory means for storing data; selecting means including means for receiving first memory data which is read out from said memory means and which is comprised of a pluarlity of sets of data each constituted by a plurality of bits, and means for selecting a predetermined bit from each of said plurality of sets of data to form second memory data comprised of a plurality of bits; and error correcting means for making error correction with respect to said second memory data, wherein said error correcting means performs said error correction on the basis of an output of a first detecting means for detecting any set of data in which an error is present among said plurality of sets of data, and on the basis of an output of second detecting means for detecting a possible error in said second memory data, wherein said first detecting means performs error detection on the basis of performing a logic operation on said first memory data and first parity bits, and said second detecting means performs error detection on the basis of performing a logic operation on said second memory data and second parity bits.
Claim 3
Dependent Claim 20 words
A semiconductor memory according to claim 1, wherein said first and second parity bits are stored in said memory means.
Claim 4
Dependent Claim 15 words
A semiconductor memory according to claim 2, wherein said memory means is a mask ROM.
Claim 5
Dependent Claim 47 words
A semiconductor memory according to claim 1, wherein each set of data is composed of four bits, the number of said plurality of sets of data being eight, the number of said first parity bits being three, and the number of said second parity bits being four.

References Cited (Backward Citations)

US3423729A Cited
US4206440A Cited
US4641309A Cited
US4562578A Cited
US4631725A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-10-25 1992-04-25 1992-10-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-10-25 1996-04-25 1996-10-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-10-25 2000-04-25 2000-10-25 $7700.00 Window Closed / Lapsed

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