Abstract A sensitivity calibration circuit for use in an absorption analyzer provided with a check-signal generator for easily checking the sensitivity, includes a temperature compensating circuit for use in an optical system for compensating for a temperature draft due to said optical system and a temperature compensation circuit for use in a sample system for compensating for a temperature draft due to the sample system. The temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are separately provided and a switch is provided which is switchable to a measuring state in which both the temperature compensation circuit for use in an optical system and the temperature compensation circuit for use in a sample system are used and is switchable to a checking state in which the temperature compensation circuit for use in a sample system is disconnected so as not to be used but the temperature compensation circuit for use in an optical system is used.
A sensitivity-calibration circuit for an absorption analyzer including an optical system and a sample system and provided with a check-signal generating means for easily checking the sensitivity, said sensitivity-calibration circuit comprising: a temperature-compensation circuit means for said optical system for compensating for a temperature-drift due to said optical system; a temperature-compensation circuit means for said sample system for compensating for a temperature-drift due to said sample system; said temperature-compensation circuit for said optical system and said temperature-compensation circuit for said sample system being separately provided, and a switch means which is switchable to a measuring state, in which both said temperature-compensation circuit for said optical system and said temperature-compensation circuit for said sample system are operative so as to compensate for respective temperature drifts, and is switchable to a checking state in which said temperature-compensation circuit for said sample system is disconnected so as not to be inoperative but said temperature-compensation circuit for said optical system is operative so as to compensate for temperature drift.
Claim 2
Dependent Claim
165 words
A sensitivity-calibration circuit for an absorption analyzer including an optical system and a sample system and provided with a check-signal generating means for easily checking the sensitivity, said sensitivity-calibration circuit comprising: a temperature-compensation circuit means for said optical system for compensating for a temperature-drift due to said optical system; a temperature-compensation circuit means for said sample system for compensating for a temperature-drift due to said sample system; said temperature-compensation circuit for said optical system and said temperature-compensation circuit for said sample system being separately provided, and a switch means which is switchable to a measuring state, in which both said temperature-compensation circuit for said optical system and said temperature-compensation circuit for said sample system are operative so as to compensate for respective temperature drifts, and is switchable to a checking state in which said temperature-compensation circuit for said sample system is disconnected so as not to be inoperative but said temperature-compensation circuit for said optical system is operative so as to compensate for temperature drift.
Claim 3
Dependent Claim
40 words
A sensitivity-calibration circuit for an absorption analyzer as set forth in claim 1, where said temperature-compensation circuit for said sample system comprises an amplifier which is also operative as a sensitivity-adjustment amplifier for adjusting the sensitivity of said sample system.