US4764945A
Expired / Lapsed
US
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Method of measuring layer thickness and composition of alloy plating
Assignee: JFE Steel Corp
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Filing: 1985-10-03
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Granted: 1988-08-16
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Expires: 2005-10-03
Abstract
Abstract Methods of measuring the thickness or thicknesses and the composition or compositions of an alloy plating having one layer or two layers different in composition from each other, wherein the alloy plating includes a metal identical with a substrate metal, suitable for use in analyzing a Zn--Fe group one layer or two layer alloy-plated steel plate. Characteristic X-rays and white X-rays irradiate an object (112, 10, 210) to be measured. A diffraction angle (2θ) of diffracted X-rays of the characteristic X-rays, which are diffracted by an intermetallic compound of the alloy plating, is measured; the composition of the alloy plating is measured from the diffraction angle, an intensity or intensities of fluorescent X-rays from an object to be measured are detected, wherein the flourescent X-rays generated by the white X-rays; and the thickness or thicknesses of the alloy plating are measured from the intensity or intensities of the fluorescent X-rays and the composition of the alloy plating.
Inventors
- 👤 Tadahiro Abe
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 16:22
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/223; G01B; G01B15/00; G01B15/02; G01N2223/00; G01N2223/07; G01N2223/076
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
129 words
A method of measuring the thickness and the composition of a one layer alloy plating including a metal identical with a substrate metal, said method comprising the steps of: irradiating an object to be measured with characteristic X-rays and white X-rays; detecting a diffraction angle of diffracted X-rays of said characteristic X-rays which are diffracted by an intermetallic compound of said alloy plating; measuring the amount of the composition of said alloy plating from said diffraction angle; detecting an intensity of fluorescent X-rays from a metal different from said substrate metal in said alloy plating, the fluorescent X-rays being generated by the white X-rays; and measuring the thickness of said alloy plating from the intensity of the fluorescent X-rays and the amount of the composition of said alloy plating.
Claim 2
Independent Claim
129 words
A method of measuring the thickness and the composition of a one layer alloy plating including a metal identical with a substrate metal, said method comprising the steps of: irradiating an object to be measured with characteristic X-rays and white X-rays; detecting a diffraction angle of diffracted X-rays of said characteristic X-rays which are diffracted by an intermetallic compound of said alloy plating; measuring the amount of the composition of said alloy plating from said diffraction angle; detecting an intensity of fluorescent X-rays from a metal different from said substrate metal in said alloy plating, the fluorescent X-rays being generated by the white X-rays; and measuring the thickness of said alloy plating from the intensity of the fluorescent X-rays and the amount of the composition of said alloy plating.
Claim 3
Dependent Claim
36 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said one layer alloy plating is a Zn--Fe one layer alloy plating applied onto a steel plate.
Claim 4
Dependent Claim
33 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said characteristic X-rays and said white X-rays are generated from a single X-ray source.
Claim 5
Dependent Claim
31 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 3, wherein said single X-ray source is an X-ray tube with a Cr target.
Claim 6
Dependent Claim
46 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein said characteristic X-rays are generated from an X-ray tube with a Cr target and said white X-rays are generated from an X-ray tube with a W target.
Claim 7
Dependent Claim
31 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 1, wherein an incident angle of said characteristic and said white X-rays is minimized.
Claim 8
Independent Claim
191 words
A method of measuring the thickness and the composition of an alloy plating having two layers different in composition from each other and including a metal identical with a substrate metal, said method comprising the steps of: irradiating an object to be measured with characteristic X-rays and white X-rays; detecting a diffraction angle of diffracted X-rays of the characteristic X-rays which are diffracted by an intermetallic compound of a first layer of the alloy plating, said first layer being adjacent to the substrate of said object; measuring the amount of the composition of said first layer of the alloy plating from said diffraction angle; detecting intensities of fluorescent X-rays from a substrate metal, a metal identical with said substrate metal in the alloy plating and a metal different from said substrate metal in the alloy plating, said fluorescent X-rays being generated by said white X-rays, and said intensities being detected by two measuring angles; and measuring the thickness of said first layer and a second layer of the alloy plating from said intensities of said fluorescent X-rays and the amount of the composition of said first layer of the alloy plating.
Claim 9
Independent Claim
191 words
A method of measuring the thickness and the composition of an alloy plating having two layers different in composition from each other and including a metal identical with a substrate metal, said method comprising the steps of: irradiating an object to be measured with characteristic X-rays and white X-rays; detecting a diffraction angle of diffracted X-rays of the characteristic X-rays which are diffracted by an intermetallic compound of a first layer of the alloy plating, said first layer being adjacent to the substrate of said object; measuring the amount of the composition of said first layer of the alloy plating from said diffraction angle; detecting intensities of fluorescent X-rays from a substrate metal, a metal identical with said substrate metal in the alloy plating and a metal different from said substrate metal in the alloy plating, said fluorescent X-rays being generated by said white X-rays, and said intensities being detected by two measuring angles; and measuring the thickness of said first layer and a second layer of the alloy plating from said intensities of said fluorescent X-rays and the amount of the composition of said first layer of the alloy plating.
Claim 10
Dependent Claim
51 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said two layers of alloy plating include a first layer of Zn--Fe alloy plating and a second layer of Fe plating having Fe as the chief content applied onto a steel plate.
Claim 11
Dependent Claim
33 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said characteristic X-rays and said white X-rays are generated from a single X-ray source.
Claim 12
Dependent Claim
31 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 9, wherein said single X-ray source is an X-ray tube with a Cr target.
Claim 13
Dependent Claim
46 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein said characteristic X-rays are generated from an X-ray tube with a Cr target, and said white X-rays are generated from an X-ray tube with a W target.
Claim 14
Dependent Claim
31 words
A method of measuring the thickness and the composition of alloy plating as set forth in claim 7, wherein an incident angle of said characteristic and said white X-rays is minimized.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-08-16 | 1992-02-15 | 1992-08-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-08-16 | 1996-02-15 | 1996-08-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-08-16 | 2000-02-15 | 2000-08-16 | $7700.00 | Window Closed / Lapsed |