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US4761244A Expired / Lapsed US ⏱️ 0.0 years remaining

Etching solutions containing ammonium fluoride and an alkyl polyaccharide surfactant

Assignee: Olin Corp
•
Filing: 1987-01-27
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Granted: 1988-08-02
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Expires: 2007-01-27
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Abstract

Abstract Etching solutions used to etch, for example, silicon dioxide coated substrates in the manufacture of integrated circuits comprise an aqueous solution of ammonium fluoride and a wetting amount of a nonionic alkyl polysaccharide having the formula: RO(R'O)xZy wherein R is alkyl, alkylphenol, hydroxyalkyl, hydroxy alkylphenol, or mixtures thereof and said alkyl groups contain from about 6 to about 18 carbon atoms, R' contains from 1 to about 4 carbon atoms, x is from 0 to about 5, Z is a moiety derived from a reducing saccharide containing from 5 to 6 carbon atoms, and y is from about 1 to about 5. The etching solutions preferably contain hydrogen fluoride in a volume ratio of NH4F to HF of from about 3:1 to about 50:1. The novel etching solutions of the present invention have excellent wetting characteristics, will not incorporate metallic ions, and retain their wetting properties after extended periods of continuous filtration.

Inventors

  • 👤 Michael Scardera
  • 👤 Thomas S. Roche

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 22:55
CPC Classifications
C; C09; C09K; C09K13/00; C09K13/04; C09K13/08; H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283

Claims Analysis

Total Claims: 18
Claim 1
Independent Claim 93 words
An etching solution comprising an aqueous solution of ammonium fluoride and a wetting amount of a nonionic alkyl polysaccharide having the formula: RO(R'O).sub.x Z.sub.y wherein R is alkyl, alkylphenol, hydroxyalkyl, hydroxy alkylphenol, or mixtures thereof and said alkyl groups contain from about 6 to about 18 carbon atoms, R'O is an alkoxide moiety which contains from 1 to about 4 carbon atoms, x is from 0 to about 5, Z is a moiety derived from reducing saccharide containing from 5 to 6 carbon atoms, and y is from about 1 to about 5.
Claim 2
Dependent Claim 93 words
An etching solution comprising an aqueous solution of ammonium fluoride and a wetting amount of a nonionic alkyl polysaccharide having the formula: RO(R'O).sub.x Z.sub.y wherein R is alkyl, alkylphenol, hydroxyalkyl, hydroxy alkylphenol, or mixtures thereof and said alkyl groups contain from about 6 to about 18 carbon atoms, R'O is an alkoxide moiety which contains from 1 to about 4 carbon atoms, x is from 0 to about 5, Z is a moiety derived from reducing saccharide containing from 5 to 6 carbon atoms, and y is from about 1 to about 5.
Claim 3
Dependent Claim 25 words
The etching solution of claim 1 in which the ammonium fluoride is present in concentrations of from about 15 to about 40 percent by weight.
Claim 4
Dependent Claim 29 words
The etching solution of claim 1 in which hydrogen fluoride is present and the volume ratio of NH 4 F to HF is from about 3:1 to about 50:1.
Claim 5
Dependent Claim 27 words
The etching solution of claim 1 in which the wetting amount of nonionic alkyl polysaccharide is from about 5 to about 50,000 parts per million by weight.
Claim 6
Dependent Claim 22 words
The etching solution of claim 3 in which R is an alkyl group having from about 8 to about 14 carbon atoms.
Claim 7
Dependent Claim 13 words
The etching solution of claim 5 in which x is 0 or 1.
Claim 8
Dependent Claim 16 words
The etching solution of claim 6 in which y is from about 1 to about 21/2.
Claim 9
Dependent Claim 23 words
The etching solution of claim 7 in which the wetting amount is from about 25 to about 30,000 parts per million by weight.
Claim 10
Dependent Claim 19 words
The etching solution of claim 8 in which x is 0, and y is from 1 to about 2.
Claim 11
Dependent Claim 107 words
A process for etching a silicon dioxide coated substrate which comprises immersing the substrate in an aqueous etching solution comprised of ammonium fluoride and a wetting amount of a nonionic alkyl polysaccharide having the formula: RO(R'O).sub.x Z.sub.y wherein R is alkyl, alkylphenol, hydroxyalkyl, hydroxy alkyphenol, or mixtures thereof and said alkyl groups contain from about 6 to about 18 carbon atoms, R'O is an alkoxide moiety which contains from 1 to about 4 carbon atoms, x is from 0 to about 5, Z is a moiety derived from a reducing sacharide containing from 5 to 6 carbon atoms, and y is from about 1 to about 5.
Claim 12
Dependent Claim 107 words
A process for etching a silicon dioxide coated substrate which comprises immersing the substrate in an aqueous etching solution comprised of ammonium fluoride and a wetting amount of a nonionic alkyl polysaccharide having the formula: RO(R'O).sub.x Z.sub.y wherein R is alkyl, alkylphenol, hydroxyalkyl, hydroxy alkyphenol, or mixtures thereof and said alkyl groups contain from about 6 to about 18 carbon atoms, R'O is an alkoxide moiety which contains from 1 to about 4 carbon atoms, x is from 0 to about 5, Z is a moiety derived from a reducing sacharide containing from 5 to 6 carbon atoms, and y is from about 1 to about 5.
Claim 13
Dependent Claim 24 words
The process of claim 10 in which the ammonium fluoride is present in concentrations of from about 15 to about 40 percent by weight.
Claim 14
Dependent Claim 28 words
The process of claim 10 in which hydrogen fluoride is present and the volume ratio of NH 4 F to HF is from about 3:1 to about 50:1.
Claim 15
Dependent Claim 26 words
The process of claim 10 in which the wetting amount of nonionic alkyl polysaccharide is from about 5 to about 50,000 parts per million by weight.
Claim 16
Dependent Claim 21 words
The process of claim 12 in which R is an alkyl group having from about 8 to about 14 carbon atoms.
Claim 17
Dependent Claim 19 words
The process of claim 14 in which x is 0 and y is from about 1 to about 2.
Claim 18
Dependent Claim 22 words
The process of claim 15 in which the wetting amount is from about 25 to about 30,000 parts per million by weight.

References Cited (Backward Citations)

US2942956A Cited
US3181984A Cited
US4040897A Cited
US3992235A Cited
JPS5853980A Cited
US4582624A Cited
US4517106A Cited
US4620934A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-08-02 1992-02-01 1992-08-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-08-02 1996-02-01 1996-08-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-08-02 2000-02-01 2000-08-02 $7700.00 Window Closed / Lapsed

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