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US4751195A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing a heterojunction bipolar transistor

Assignee: Sony Corp
•
Filing: 1987-06-25
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Granted: 1988-06-14
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Expires: 2007-06-25
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Abstract

Abstract A method of manufacturing a heterojunction bipolar transistor in which a collector region, a base region and an emitter region are successively formed on a compound semiconductor substrate, forming the emitter region by epitaxial growth in a concave portion formed on an electrode leading region at the base region.

Inventors

  • 👤 Hiroji Kawai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 06:25
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/20; H10D64/23; H10D64/231; H10D10/00; H10D10/01; H10D10/021; H10D10/80; H10D10/821; H10D62/00; H10D62/80; H10D62/85; Y; Y10; Y10S; Y10S148/00; Y10S148/011

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 57 words
A method of manufacturing a heterojunction bipolar transistor which comprises: providing a compound semiconductor substrate, successively forming a collector region and a base region having an electrode leading region on said substrate, forming a concave portion in said electrode leading region, and forming an emitter region within said concave portion and in contact with said base region.
Claim 2
Independent Claim 57 words
A method of manufacturing a heterojunction bipolar transistor which comprises: providing a compound semiconductor substrate, successively forming a collector region and a base region having an electrode leading region on said substrate, forming a concave portion in said electrode leading region, and forming an emitter region within said concave portion and in contact with said base region.
Claim 3
Dependent Claim 16 words
A method according to claim 1 in which said emitter region is formed by epitaxial growth.
Claim 4
Dependent Claim 23 words
A method according to claim 1 which includes a step of forming an insulating layer between said emitter region and said base region.
Claim 5
Dependent Claim 20 words
A method according to claim 2 wherein said emitter region is formed by chemical vapor deposition, followed by epitaxial growth.
Claim 6
Dependent Claim 18 words
A method according to claim 1 wherein the length of said emitter region is less than 0.5 um.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1991-06-14 1991-12-14 1992-06-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1995-06-14 1995-12-14 1996-06-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1999-06-14 1999-12-14 2000-06-14 $7700.00 Window Closed / Lapsed

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