Methods of and apparatus for measuring the frequency response of optical detectors

Claim 3

The method as recited in claim 1 wherein said alternating current has a frequency f, and said sole amplitude modulation has a plurality of frequencies nf, wherein n are integers greater than one.

Claim 4

The method as recited in claim 1 wherein said interferometer is adjusted to cancel amplitude modulated portions of said electrical field but not the frequency modulated portion thereof.

Claim 5

Apparatus comprising a semiconductor laser; means for providing a direct current bias to said semiconductor laser; means for providing an alternating current to said semiconductor laser, whereby said semiconductor laser can be so driven to produce a beam of light having an electric field whose amplitude and frequency is modulated; interferometric means coupled to receive said beam, for splitting said light into two paths, for delaying one path with respect to the other path, and for combining the resultant paths, whereby the amplitude modulation of each path, due to the amplitude of the electric field from said laser cancels, and the sole amplitude modulation remaining is due solely to the frequency modulation portion of said electric field of said laser herein, and means for analyzing said sole remaining amplitude modulation.

Claim 6

Apparatus comprising a semiconductor laser; means for providing a direct current bias to said semiconductor laser; means for providing an alternating current to said semiconductor laser, whereby said semiconductor laser can be so driven to produce a beam of light having an electric field whose amplitude and frequency is modulated; interferometric means coupled to receive said beam, for splitting said light into two paths, for delaying one path with respect to the other path, and for combining the resultant paths, whereby the amplitude modulation of each path, due to the amplitude of the electric field from said laser cancels, and the sole amplitude modulation remaining is due solely to the frequency modulation portion of said electric field of said laser herein, and means for analyzing said sole remaining amplitude modulation.

Claim 7

The apparatus as recited in claim 4 wherein said interferometric means includes a Michelson interferometer having a pair of optical corner cubes, and means for translating one of said cubes with respect to the other of said cubes.

Claim 8

The apparatus as recited in claim 4 wherein said interferometric means includes a Mach Zender interferometer that can provide a set of high frequencies for analysis, and a low frequency for controlling said direct current bias, said low frequency having a frequency f 1 , said alternating current having a frequency f 2 and wherein f 1 >f 2 .

Claim 11

The method as recited in claim 7 wherein said alternating current has a frequency f, and said sole amplitude modulation has a plurality of frequencies nf, wherein n are integers greater than one.

Claim 12

The method as recited in claim 7 wherein said interferometer is adjusted to cancel amplitude modulated portions of said electrical field but not the frequency modulated portion thereof.

Claim 13

Apparatus for measuring the frequency response of an optical detector comprising said detector; a semiconductor laser; means for providing a direct current bias to said semiconductor laser; means for providing an alternating current to said semiconductor laser, whereby said semiconductor laser can be so driven to produce a beam of light having an electric field whose amplitude and frequency is modulated; interferometric means coupled to receive said beam, for splitting said light into two paths, for delaying one path with respect to the other path, and for combining the resultant paths, whereby the amplitude modulation of each path, due to the amplitude of the electric field from said laser cancels, and the sole amplitude modulation remaining is due solely to the frequency modultion portion of said electric field of said laser herein, and means for analyzing said sole remaining amplitde modulation, so that said electric field is applied to said optical detector, whereby the photocurrent from said detector is applied to said analyzing means, and the power in each harmonic of the modulation frequency is compared to a known quantity.

Claim 14

Apparatus for measuring the frequency response of an optical detector comprising said detector; a semiconductor laser; means for providing a direct current bias to said semiconductor laser; means for providing an alternating current to said semiconductor laser, whereby said semiconductor laser can be so driven to produce a beam of light having an electric field whose amplitude and frequency is modulated; interferometric means coupled to receive said beam, for splitting said light into two paths, for delaying one path with respect to the other path, and for combining the resultant paths, whereby the amplitude modulation of each path, due to the amplitude of the electric field from said laser cancels, and the sole amplitude modulation remaining is due solely to the frequency modultion portion of said electric field of said laser herein, and means for analyzing said sole remaining amplitde modulation, so that said electric field is applied to said optical detector, whereby the photocurrent from said detector is applied to said analyzing means, and the power in each harmonic of the modulation frequency is compared to a known quantity.

Claim 15

The apparatus as recited in claim 10 wherein said interferometric means includes a Michelson interferometer having a pair of optical corner cubes, and means for translating one of said cubes with respect to the other of said cubes.

Claim 16

The apparatus as recited in claim 10 wherein said interferometric means includes a Mach Zender interferometer that can provide a set of hifh frequencies for analysis, and a low frequency for controlling said direct current bias, said low frequency having a frequency f 1 , said alternating current having a frequency f 2 and wherein f 1 <f 2 .