US4747684A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of and apparatus for real-time crystallographic axis orientation determination
Assignee: United States Department of the Army
•
Filing: 1987-08-27
•
Granted: 1988-05-31
•
Expires: 2007-08-27
Abstract
Abstract A specific small area of a crystal sample is scanned by a laser beam which rotates about an axis substantially perpendicular to the sample surface such that the intersection of the beam with a plane above and parallel to the surface describes a true spiral or a stepwise spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.
Inventors
- 👤 Sidney Weiser
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 02:11
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/55; G01N2201/00; G01N2201/10; G01N2201/104; G01N2201/1045; G01N2201/108; G01N2201/1087
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
135 words
A device for determining, in real time, crystallographic orientation of an essentially planar crystal sample including: means for providing a focussed beam of coherent and essentially monochromatic electromagnetic radiation: means for directing said beam as a spot onto a specific plane on said sample in a scanned pattern such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral, wherein said spot is small with respect to the area of said sample; means for detecting that portion of said beam reflected in a particular direction form said material, whereby the beam is reflected different amounts for different incident directions in accordance with the crystallographic orientation of the crystal material to yield a particular reflectance pattern; and means for determining said orientation in accordance with said reflectance pattern.
Claim 2
Independent Claim
135 words
A device for determining, in real time, crystallographic orientation of an essentially planar crystal sample including: means for providing a focussed beam of coherent and essentially monochromatic electromagnetic radiation: means for directing said beam as a spot onto a specific plane on said sample in a scanned pattern such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral, wherein said spot is small with respect to the area of said sample; means for detecting that portion of said beam reflected in a particular direction form said material, whereby the beam is reflected different amounts for different incident directions in accordance with the crystallographic orientation of the crystal material to yield a particular reflectance pattern; and means for determining said orientation in accordance with said reflectance pattern.
Claim 3
Dependent Claim
16 words
The device as set forth in claim 1 wherein said means for providing is a laser.
Claim 4
Dependent Claim
35 words
The device as set forth in claim 1 wherein said means for directing includes means for deflecting said beam about orthogonal axes, and means for reflecting and focussing the deflected beam onto said specific place.
Claim 5
Independent Claim
104 words
A method of determining, in real time, crystallographic orientation of an essentially planar crystal sample, including the steps of: generating a focussed laser beam; directing said laser beam onto a small spot on said sample; steering said beam in a pattern about an axis essentially perpendicular to the surface of said sample such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral; detecting reflected beam radiation from said spot in a particular direction; and determining crystallographic orientation of said sample from a pattern of reflected beam radiation as said beam is steered in said pattern.
Claim 6
Independent Claim
104 words
A method of determining, in real time, crystallographic orientation of an essentially planar crystal sample, including the steps of: generating a focussed laser beam; directing said laser beam onto a small spot on said sample; steering said beam in a pattern about an axis essentially perpendicular to the surface of said sample such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral; detecting reflected beam radiation from said spot in a particular direction; and determining crystallographic orientation of said sample from a pattern of reflected beam radiation as said beam is steered in said pattern.
Claim 7
Independent Claim
141 words
A method of mapping, in real time, the planar surface of a crystal sample for crystallographic orientation by: determining the crystallographic orientation of a multiplicity of small spots on said surface in a predetermined pattern, wherein the determination at each spot includes the steps of: generating a focussed laser beam; directing said beam onto a small spot on said sample, wherein said spot corresponds to one of said multiplicity of spots; steering said beam in a pattern about an axis essentially perpendicular to the surface of said sample such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral; detecting reflected beam radiation from said spot in a particular direction; and determining the crystallographic orientation of the spot from a pattern of reflected beam radiation as said beam is steered in said pattern.
Claim 8
Independent Claim
141 words
A method of mapping, in real time, the planar surface of a crystal sample for crystallographic orientation by: determining the crystallographic orientation of a multiplicity of small spots on said surface in a predetermined pattern, wherein the determination at each spot includes the steps of: generating a focussed laser beam; directing said beam onto a small spot on said sample, wherein said spot corresponds to one of said multiplicity of spots; steering said beam in a pattern about an axis essentially perpendicular to the surface of said sample such that the intersection of said beam with a plane above and parallel to said surface is substantially spiral; detecting reflected beam radiation from said spot in a particular direction; and determining the crystallographic orientation of the spot from a pattern of reflected beam radiation as said beam is steered in said pattern.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-05-31 | 1991-11-30 | 1992-05-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-05-31 | 1995-11-30 | 1996-05-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-05-31 | 1999-11-30 | 2000-05-31 | $7700.00 | Window Closed / Lapsed |